摘要:
A system and method for efficient management of operating modes within an integrated circuit (IC) for optimal power and performance targets. A semiconductor chip includes processing units each of which operates with respective operating parameters. Temperature sensors are included to measure a temperature of the one or more processing units during operation. A power manager determines a calculated power value independent of thermal conditions and current draw. The power manager reads each of a first thermal design power (TDP) value for the processing units and a second TDP value for a platform housing the semiconductor chip. The power manager determines a ratio of the first TDP value to the second TDP value. Additionally, the power manager determines another ratio of the first TDP value to the calculated power value. Using the measured temperature, the ratios and the calculated power value, the power manager determines a manner to adjust the operating parameters.
摘要:
Systems, apparatuses, and methods for performing a software override of a power estimation mechanism are disclosed. A computing system includes a plurality of tuned parameters for generating an estimate of power consumption. The tuned parameters are generated based on post-silicon characterization of the system. After deployment, the system executes a plurality of different applications. When launching a particular application, the system loads a corresponding set of override parameters which are used to replace the plurality of tuned parameters. The system generates an estimate of power consumption using the set of override parameters rather than the previously determined tuned parameters. Then while executing the particular application, the system makes adjustments to power and frequency values for the various system components based on the estimate of power consumption.
摘要:
Systems, apparatuses, and methods for performing a software override of a power estimation mechanism are disclosed. A computing system includes a plurality of tuned parameters for generating an estimate of power consumption. The tuned parameters are generated based on post-silicon characterization of the system. After deployment, the system executes a plurality of different applications. When launching a particular application, the system loads a corresponding set of override parameters which are used to replace the plurality of tuned parameters. The system generates an estimate of power consumption using the set of override parameters rather than the previously determined tuned parameters. Then while executing the particular application, the system makes adjustments to power and frequency values for the various system components based on the estimate of power consumption.
摘要:
A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.
摘要:
A system and method for efficient management of operating modes within an integrated circuit (IC) for optimal power and performance targets. A semiconductor chip includes processing units each of which operates with respective operating parameters. Temperature sensors are included to measure a temperature of the one or more processing units during operation. A power manager determines a calculated power value independent of thermal conditions and current draw. The power manager reads each of a first thermal design power (TDP) value for the processing units and a second TDP value for a platform housing the semiconductor chip. The power manager determines a ratio of the first TDP value to the second TDP value. Additionally, the power manager determines another ratio of the first TDP value to the calculated power value. Using the measured temperature, the ratios and the calculated power value, the power manager determines a manner to adjust the operating parameters.
摘要:
A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.