公开(公告)号：US20240321706A1

公开(公告)日：2024-09-26

申请号：US18474151

申请日：2023-09-25

Applicant: Advanced Micro Devices, Inc.

Inventor： William George En ,  Samuel Naffziger ,  Regina T. Schmidt ,  Omar Zia ,  John Wuu

IPC: H01L23/498 ,  H01L23/48 ,  H01L25/065

CPC classification number: H01L23/49827 ,  H01L23/481 ,  H01L23/49816 ,  H01L25/0657 ,  H01L2225/06541

Abstract: A method for implementing shared metal connectivity between 3D stacked circuit dies can include providing a first circuit die having a first metal stack. The method can additionally include providing a second circuit die having a second metal stack, wherein at least one metal layer of the second metal stack is utilized by both the first circuit die and the second circuit die. The method can also include connecting the second metal stack to the first metal stack of the first circuit die. Various other methods, systems, and computer-readable media are also disclosed.

公开(公告)号：US20240324248A1

公开(公告)日：2024-09-26

申请号：US18474179

申请日：2023-09-25

Applicant: Advanced Micro Devices, Inc. ,  ATI Technologies ULC

Inventor： John Wuu ,  Kevin Gillespie ,  Samuel Naffziger ,  Spence Oliver ,  Rajit Seahra ,  Regina T. Schmidt ,  Raja Swaminathan ,  Omar Zia

IPC: H10B80/00 ,  H01L23/544 ,  H01L25/00 ,  H01L25/18

CPC classification number: H10B80/00 ,  H01L23/544 ,  H01L25/18 ,  H01L25/50 ,  H01L23/481 ,  H01L23/5286 ,  H01L24/06 ,  H01L24/08 ,  H01L2223/54433 ,  H01L2224/06181 ,  H01L2224/08145

Abstract: A method for die pair partitioning can include providing a circuit die. The method can additionally include providing one or more additional circuit die having one or more fuses positioned therein, wherein the one or more fuses identify the circuit die. The method can also include connecting the one or more additional circuit die to the circuit die. Various other methods, systems, and computer-readable media are also disclosed.