公开(公告)号：US20240264900A1

公开(公告)日：2024-08-08

申请号：US18625417

申请日：2024-04-03

Applicant: Advanced Micro Devices, Inc.

Inventor： Divya Madapusi Srinivas Prasad ,  Sudhanva Gurumurthi ,  Yasuko Eckert ,  Jeffrey Richard Rearick ,  Sankaranarayanan Gurumurthy ,  Amitabh Mehra ,  Shidhartha Das ,  Alex W. Schaefer ,  Vikram Ramachandra ,  Vilas Sridharan

IPC: G06F11/07 ,  G06F1/30

CPC classification number: G06F11/0793 ,  G06F11/07 ,  G06F1/30 ,  G06F11/0721

Abstract: An exemplary computing device includes a plurality of circuits and/or a plurality of in-situ monitors configured to generate outputs that indicate one or more operating conditions of the circuits. The computing device also includes a system management unit configured to detect a potentially faulty voltage-to-frequency ratio implemented by one of the circuits based at least in part on one or more of the outputs. The system management unit is also configured to modify the potentially faulty voltage-to-frequency ratio based at least in part on one or more of the outputs. Various other devices, systems, and methods are also disclosed.

公开(公告)号：US11966283B1

公开(公告)日：2024-04-23

申请号：US18072650

申请日：2022-11-30

Applicant: Advanced Micro Devices, Inc.

Inventor： Divya Madapusi Srinivas Prasad ,  Sudhanva Gurumurthi ,  Yasuko Eckert ,  Jeffrey Richard Rearick ,  Sankaranarayanan Gurumurthy ,  Amitabh Mehra ,  Shidhartha Das ,  Alex W. Schaefer ,  Vikram Ramachandra ,  Vilas Sridharan

IPC: G06F11/07 ,  G06F1/30

CPC classification number: G06F11/0793 ,  G06F11/07 ,  G06F1/30 ,  G06F11/0721

Abstract: An exemplary computing device includes a plurality of circuits and/or a plurality of in-situ monitors configured to generate outputs that indicate one or more operating conditions of the circuits. The computing device also includes a system management unit configured to detect a potentially faulty voltage-to-frequency ratio implemented by one of the circuits based at least in part on one or more of the outputs. The system management unit is also configured to modify the potentially faulty voltage-to-frequency ratio based at least in part on one or more of the outputs. Various other devices, systems, and methods are also disclosed.