公开(公告)号：US07850460B2

公开(公告)日：2010-12-14

申请号：US12463083

申请日：2009-05-08

Applicant: Achim Weiland ,  Gunther Boehm

Inventor： Achim Weiland ,  Gunther Boehm

IPC: H01R12/00

CPC classification number: G01R1/06733 ,  G01R1/0675 ,  G01R1/07357 ,  H01R13/2407 ,  H01R13/2435 ,  H01R2201/20

Abstract: An elongate electrical contact element (1) for physically contacting electrical components under test, having two electrical contacting end regions (2, 3) and an elongate intermediate region (4) situated between the end regions (2, 3). The intermediate region (4) has an essentially rectangular cross-section and is configured lamellar along its longitudinal extent. Also disclosed is a corresponding contacting apparatus (22) including such a contact element (1) and a contact element holder (23).

Abstract translation: 用于物理接触待测电气部件的细长电接触元件（1），具有两个电接触端区域（2,3）和位于端部区域（2,3）之间的细长中间区域（4）。 中间区域（4）具有基本上矩形的横截面，并且沿其纵向范围被构造成层状。 还公开了包括这种接触元件（1）和接触元件保持器（23）的相应接触装置（22）。

公开(公告)号：US20080150568A1

公开(公告)日：2008-06-26

申请号：US12002481

申请日：2007-12-17

Applicant: Achim Weiland ,  Gunther Bohm

Inventor： Achim Weiland ,  Gunther Bohm

IPC: G01R31/02

CPC classification number: G01R31/2863 ,  G01R31/2874 ,  G01R31/2889

Abstract: A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.

Abstract translation: 用于触摸接触电测试样本的接触装置包括接触头和连接装置。 具有测试样本的接触头具有电触摸可接触的测试触点，其位置分布在测试表面上并且由至少一个属于接触头的导向元件确定并且紧固到触点的保持装置 头。 测试触点在​​其背离测试样本的一侧将与连接装置的接触表面进行电触触接触。 提供了引导元件由各自具有测试表面的一部分并且通过至少一个固定轴承连接到保持装置和连接装置中的至少一个的各个段构成。

公开(公告)号：US09513331B2

公开(公告)日：2016-12-06

申请号：US13957868

申请日：2013-08-02

Applicant: Stefan Trenz ,  Gunther Böhm ,  Achim Weiland

Inventor： Stefan Trenz ,  Gunther Böhm ,  Achim Weiland

IPC: G01R31/00 ,  G01R31/28 ,  G01R1/073

CPC classification number: G01R31/2886 ,  G01R1/07314 ,  G01R1/07357

Abstract: The present disclosure relates to a test head for electrical testing of a test specimen, in particular a wafer, having at least two guide plates, which are spaced apart by means of at least one spacer and have guide holes distributed over the surfaces thereof, in which test contact pins for physical contact with the test specimen are guided in a sliding manner. Provision is made for the spacer to be formed by a multiplicity of point supports arranged in a manner distributed over the surfaces of the guide plates and secured on the guide plates.

Abstract translation: 本公开涉及一种用于电测试的测试头，特别是具有至少两个引导板的测试样本的测试头，所述至少两个引导板通过至少一个间隔件间隔开并且在其表面上分布有引导孔， 用于与测试样品物理接触的测试接触销被滑动地引导。 通过多个点支撑件形成间隔件，其布置方式分布在导向板的表面上并固定在导向板上。

公开(公告)号：US07622936B2

公开(公告)日：2009-11-24

申请号：US12002481

申请日：2007-12-17

Applicant: Achim Weiland ,  Gunther Böhm

Inventor： Achim Weiland ,  Gunther Böhm

IPC: G01R31/02 ,  G01R31/28

CPC classification number: G01R31/2863 ,  G01R31/2874 ,  G01R31/2889

Abstract: A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.

Abstract translation: 用于触摸接触电测试样本的接触装置包括接触头和连接装置。 具有测试样本的接触头具有电触摸可接触的测试触点，其位置分布在测试表面上并且由至少一个属于接触头的导向元件确定并且紧固到触点的保持装置 头。 测试触点在​​其背离测试样本的一侧将与连接装置的接触表面进行电触触接触。 提供了引导元件由各自具有测试表面的一部分并且通过至少一个固定轴承连接到保持装置和连接装置中的至少一个的各个段构成。

公开(公告)号：US08098077B2

公开(公告)日：2012-01-17

申请号：US11473726

申请日：2006-06-23

Applicant: Rainer Schmid ,  Achim Weiland

Inventor： Rainer Schmid ,  Achim Weiland

IPC: G01R31/20

CPC classification number: G01R1/07357 ,  G01R3/00 ,  H01R13/03

Abstract: A contact-making apparatus for electrical connection of a unit under test to an electrical test device. The apparatus has a plurality of electrical test contacts, which are associated with at least one holding element, for making contact with the unit under test. An adapter device increases the distance between adjacent contact paths. The adapter device has contact elements for touch contact with the test contacts. The contact elements are comprised of noble metal or of a noble metal alloy, or of an alloy having at least one noble metal component, or of electrically conductive plastic. The invention also relates to a corresponding method of forming the contact elements by heating and then cooling and then forming the apparatus.

Abstract translation: 一种用于将被测单元电连接到电测试装置的接触制备装置。 该装置具有与至少一个保持元件相关联的多个电测试触点，用于与被测单元的接触。 适配器装置增加相邻接触路径之间的距离。 适配器装置具有用于与测试触点的触摸接触的接触元件。 接触元件由贵金属或贵金属合金或具有至少一种贵金属组分的合金或导电塑料构成。 本发明还涉及通过加热然后冷却然后形成该装置来形成接触元件的相应方法。

公开(公告)号：US20070017702A1

公开(公告)日：2007-01-25

申请号：US11473726

申请日：2006-06-23

Applicant: Rainer Schmid ,  Achim Weiland

Inventor： Rainer Schmid ,  Achim Weiland

IPC: H05K9/00

CPC classification number: G01R1/07357 ,  G01R3/00 ,  H01R13/03

Abstract: A contact-making apparatus for electrical connection of a unit under test to an electrical test device. The apparatus has a plurality of electrical test contacts, which are associated with at least one holding element, for making contact with the unit under test. An adapter device increases the distance between adjacent contact paths. The adapter device has contact elements for touch contact with the test contacts. The contact elements are comprised of noble metal or of a noble metal alloy, or of an alloy having at least one noble metal component, or of electrically conductive plastic. The invention also relates to a corresponding method of forming the contact elements by heating and then cooling and then forming the apparatus.

Abstract translation: 一种用于将被测单元电连接到电测试装置的接触制备装置。 该装置具有与至少一个保持元件相关联的多个电测试触点，用于与被测单元的接触。 适配器装置增加相邻接触路径之间的距离。 适配器装置具有用于与测试触点的触摸接触的接触元件。 接触元件由贵金属或贵金属合金或具有至少一种贵金属组分的合金或导电塑料构成。 本发明还涉及通过加热然后冷却然后形成该装置来形成接触元件的相应方法。