公开(公告)号：US20160352347A1

公开(公告)日：2016-12-01

申请号：US15153711

申请日：2016-05-12

Applicant: ANALOG DEVICES, INC.

Inventor： PAUL R. FERNANDO ,  SUDARSHAN ANANDA NATARAJAN

IPC: H03M1/10 ,  H03M1/20 ,  H04N5/378 ,  H03M1/46

CPC classification number: H03M1/1009 ,  H03M1/0639 ,  H03M1/1061 ,  H03M1/201 ,  H03M1/466 ,  H03M1/468

Abstract: Disclosed herein are systems for calibrating an analog-to-digital converter (ADC) device, as well as related devices and methods. In some embodiments, a system for calibrating an ADC device may include an ADC device, wherein the ADC device includes an ADC and a dither source, and wherein the ADC device is to apply a set of calibration parameters to generate digital outputs. The system may also include calibration circuitry, coupled to the ADC device, to determine which of multiple sets of values of calibration parameters results in the digital outputs having the lowest amount of noise, and to cause the ADC device to apply the calibration parameters associated with the lowest noise.

Abstract translation: 本文公开了用于校准模数转换器（ADC）装置以及相关装置和方法的系统。 在一些实施例中，用于校准ADC器件的系统可以包括ADC器件，其中ADC器件包括ADC和抖动源，并且其中ADC器件将应用一组校准参数以产生数字输出。 该系统还可以包括耦合到ADC器件的校准电路，以确定校准参数的多组值中的哪一组导致具有最低噪声量的数字输出，并且使得ADC器件施加与 噪音最低