公开(公告)号：US20230251201A1

公开(公告)日：2023-08-10

申请号：US18166032

申请日：2023-02-08

Applicant: AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION

Inventor： Jaehyun LEE ,  Jiyun MOON ,  Jun-Hui CHOI ,  Seung-il KIM

IPC: G01N21/65 ,  C23C16/34

CPC classification number: G01N21/658 ,  C23C16/342

Abstract: The present disclosure relates to a method for analyzing a grain boundary of a polycrystalline two-dimensional material including transferring a polycrystalline two-dimensional material onto a substrate for analysis including a single crystalline two-dimensional material formed on a substrate; analyzing the polycrystalline two-dimensional material; depositing a metal thin film on the polycrystalline two-dimensional material; and exfoliating the polycrystalline two-dimensional material.

公开(公告)号：US20220033265A1

公开(公告)日：2022-02-03

申请号：US17388600

申请日：2021-07-29

Applicant: AJOU UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION

Inventor： Jaehyun LEE ,  Jiyun MOON

IPC: C01B32/194 ,  C01B32/19 ,  C01G39/06 ,  C30B33/00 ,  C30B29/02 ,  C30B29/46 ,  C30B29/64

Abstract: The present embodiments relate to a method for manufacturing a two-dimensional material using a top-down method, the method includes the steps of preparing a bulk crystal, forming a metal layer on the bulk crystal, and then attaching a thermal release tape on the metal layer, exfoliating a two-dimensional material to which the metal layer and the thermal release tape have been attached from the bulk crystal, transferring the two-dimensional material to which the metal layer and the thermal release tape have been attached onto a substrate, and removing the thermal release tape and the metal layer from the substrate onto which the two-dimensional material has been transferred.