Electron beam exposure apparatus and electron beam exposure method
    1.
    发明申请
    Electron beam exposure apparatus and electron beam exposure method 审中-公开
    电子束曝光装置和电子束曝光方法

    公开(公告)号:US20030107009A1

    公开(公告)日:2003-06-12

    申请号:US10338620

    申请日:2003-01-08

    Inventor: Hitoshi Tanaka

    Abstract: An electron beam exposure apparatus characterized by comprising an electron gun producing an electron beam, a first shaping member for shaping the cross-sectional shape of the electron beam, a second shaping member serving as a splitting member having a splitting part including splitting openings for splitting the electron beam into electron beams of different shapes, and a blocking member for blocking at least one of the electron beams.

    Abstract translation: 一种电子束曝光装置,其特征在于包括产生电子束的电子枪,用于使电子束的横截面形状成形的第一成形构件,用作分离构件的第二成形构件,具有分离部分,该分离部分包括用于分裂的分离开口 电子束变成不同形状的电子束,以及用于阻挡至少一个电子束的阻挡构件。

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