公开(公告)号：US4185921A

公开(公告)日：1980-01-29

申请号：US870497

申请日：1978-01-18

申请人： Tomokazu Godai ,  Yasuhito Takeuchi ,  Kozo Nakai ,  Kazuo Takeuchi ,  Yoshihisa Morioka

发明人： Tomokazu Godai ,  Yasuhito Takeuchi ,  Kozo Nakai ,  Kazuo Takeuchi ,  Yoshihisa Morioka

IPC分类号： G01B11/24 ,  G01N21/88 ,  G01N21/89 ,  G01N21/952 ,  G01N21/32

CPC分类号： G01N21/88 ,  G01N21/8901

摘要： A surface flaw detector includes a light source capable of generating a laser beam, a material conveyance means provided for conveying a material to be examined in the direction transverse to the axis of the material and designed to let the material rotate on its axis at a fixed position or along the direction of conveyance, means for scanning the laser beam on the surface and in the axial direction of the material which is rotating on its own axis, optical means adapted to transmit the light reflected from the surface of the material to form a stationary optic image of the scanning means, light receiving means provided at the image forming position, and processing means adapted to discriminate the flaw signal upon receiving the output from the light receiving means.

摘要翻译： 表面探伤仪包括能够产生激光束的光源，材料传送装置，用于沿垂直于材料轴线的方向传送被检查材料，并被设计成使材料在其轴线上以固定的方式旋转 位置或沿着输送方向的装置，用于扫描激光束在其自身轴线上旋转的材料的表面和轴向上的光学装置，适于透射从材料表面反射的光以形成 扫描装置的静止光学图像，设置在图像形成位置处的光接收装置，以及适于在接收来自光接收装置的输出时识别缺陷信号的处理装置。