Abstract:
Methods, systems, and apparatus including computer programs encoded on a computer storage medium, for retrieving image search results using embedding neural network models. In one aspect, an image search query is received. A respective pair numeric embedding for each of a plurality of image-landing page pairs is determined. Each pair numeric embedding is a numeric representation in an embedding space. An image search query embedding neural network processes features of the image search query and generates a query numeric embedding. The query numeric embedding is a numeric representation of the image search query in the same embedding space. A subset of the image-landing page pairs having pair numeric embeddings that are closest to the query numeric embedding of the image search query in the embedding space are identified as first candidate image search results.
Abstract:
In embodiments, apparatuses, methods, and storage media may be described for characterizing throughput of a user equipment (UE) for transmission this transmitted using a modulation and coding scheme (MCS). Specifically, in embodiments throughput of the UE may be characterized using interpolation of UE throughput for one or more discrete signal strength values.
Abstract:
The present invention provides a torsion resistant shielded cable which includes at least one conductor; an insulating layer covering outside the conductor; a first isolating layer surrounding the insulating layer; and a shielded layer including a number of wires, single wires or strand wires, wound around the first isolating layer in a clockwise and counter-clockwise alternative order along an axial direction of the conductor to prevent the strand wires from breaking while the torsion resistant shielded cable is twisted.
Abstract:
An image processing apparatus includes a central-portion extracting unit, a classifying unit and a determining unit. The central-portion extracting unit extracts edges from an image area and extracts a plurality of central portions of areas each of which is sandwiched between the edges. The classifying unit groups the central portions by classifying adjacent central portions that have no edge therebetween into a single group. The determining unit determines an area of finger, the area of finger being surrounded by the central portions classified into a group by the classifying unit and peripheral edges of the central portion, the area of finger being an area where a ratio of a luminance gradient in a short side direction to a luminance gradient in a long side direction is within a predetermined threshold.
Abstract:
The invention discloses an ESD protection circuit, comprising a P-type substrate; an N-well formed on the P-type substrate; a P-doped region formed on the N-well, wherein the P-doped region is electrically connected to an input/output terminal of a circuit under protection; a first N-doped region formed on the P-type substrate, the first N-doped region is electrically connected to a first node, and the P-doped region, the N-well, the P-type substrate, and the first N-doped region constitute a silicon controlled rectifier; and a second N-doped region formed on the N-well and electrically connected to a second node, wherein a part of the P-doped region and the second N-doped region constitute a discharging path, and when an ESD event occurs at the input/output terminal, the silicon controlled rectifier and the discharging path bypass electrostatic charges to the first and second nodes respectively.
Abstract:
The invention discloses an ESD protection circuit, comprising a P-type substrate; an N-well formed on the P-type substrate; a P-doped region formed on the N-well, wherein the P-doped region is electrically connected to an input/output terminal of a circuit under protection; a first N-doped region formed on the P-type substrate, the first N-doped region is electrically connected to a first node, and the P-doped region, the N-well, the P-type substrate, and the first N-doped region constitute a silicon controlled rectifier; and a second N-doped region formed on the N-well and electrically connected to a second node, wherein a part of the P-doped region and the second N-doped region constitute a discharging path, and when an ESD event occurs at the input/output terminal, the silicon controlled rectifier and the discharging path bypass electrostatic charges to the first and second nodes respectively.
Abstract:
A horizontal anomaly detection method includes receiving at plurality of objects described in a plurality of information sources, wherein each individual information source captures a plurality of similarity relationships between the objects, combining the information sources to determine a similarity matrix whose entries represent quantitative scores of similarity between pairs of the objects, and identifying at least one horizontal anomaly of the objects within the similarity matrix, wherein the horizontal anomalies are anomalous relationships across the plurality of information sources.
Abstract:
A selecting method of light guide plate of backlight module is described. The selecting method includes the steps of: calculating a plurality of mura indexes (MI) corresponding to a plurality of mura statuses of a plurality of first light guide plate (LGP) types, respectively; defining a plurality of film structures, wherein each of the film structures corresponds to each of mura indexes for mapping the mura indexes (MI) of the first LGP types with the film structures to construct a mapping database; and selecting one of the film structures and one of the mura indexes (MI) correspondingly from the mapping database for determining a critical dot dimension (CDD) of a second LGP type of the selected film structure. The selecting method avoids the mura, speed up the research and development procedure of the backlight module, labor cost and manufacturing cost when the LGP is assembled with the film structure.
Abstract:
Embodiments of the invention provide a method of de-rate matching without NULL bits skipping. Date is received without NULLs and inputted into a LLR combining block. The history data without NULLs is buffered. Log-likelihood ratio (LLR) combining is called before de-rate matching. The output of LLR combining is de-interleaved. The reading pointer is offset to forge NULLs. Finally, de-interleaving output without NULLs is sent to a turbo decoder.
Abstract:
The ESD protection device includes a substrate, a well, a first doped region and a second doped region. The substrate has a first conductive type, and the substrate is electrically connected to a first power node. The well has a second conductive type, and is disposed in the substrate. The first doped region has the first conductive type, and is disposed in the well. The first doped region and the well are electrically connected to a second power node. The second doped region has the second conductive type, and is disposed in the substrate. The second doped region is in a floating state.