AlxGa(1-x)As Substrate, Epitaxial Wafer for Infrared LEDs, Infrared LED, Method of Manufacturing AlxGa(1-x)As Substrate, Method of Manufacturing Epitaxial Wafer for Infrared LEDs, and Method of Manufacturing Infrared LEDs
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    发明申请
    AlxGa(1-x)As Substrate, Epitaxial Wafer for Infrared LEDs, Infrared LED, Method of Manufacturing AlxGa(1-x)As Substrate, Method of Manufacturing Epitaxial Wafer for Infrared LEDs, and Method of Manufacturing Infrared LEDs 审中-公开
    AlxGa(1-x)As衬底,用于红外LED的外延晶片,红外LED,制造Al x Ga(1-x)As衬底的方法,制造用于红外LED的外延晶片的方法以及制造红外LED的方法

    公开(公告)号:US20110049542A1

    公开(公告)日:2011-03-03

    申请号:US12935913

    申请日:2009-05-27

    摘要: The present invention makes available AlxGa(1-x)As (0≦x≦1) substrates, epitaxial wafers for infrared LEDs, infrared LEDs, methods of manufacturing AlxGa(1-x)As substrates, methods of manufacturing epitaxial wafers for infrared LEDs, and methods of manufacturing infrared LEDs, whereby a high level of transmissivity is maintained, and through which, in the fabrication of semiconductor devices, the devices prove to have superior characteristics.An AlxGa(1-x)As substrate (10a) of the present invention is an AlxGa(1-x)As substrate (10a) furnished with an AlxGa(1-x)As layer (11) having a major surface (11a) and, on the reverse side from the major surface (11a), a rear face (11b), and is characterized in that in the AlxGa(1-x)As layer (11), the amount fraction x of Al in the rear face (11b) is greater than the amount fraction x of Al in the major surface (11a). In addition, the AlxGa(1-x)As substrate (10a) is further furnished with a GaAs substrate (13), contacting the rear face (11b) of the AlxGa(1-x)As layer (11).

    摘要翻译: 本发明提供了Al x Ga(1-x)As(0≦̸ x≦̸ 1)衬底,用于红外LED的外延晶片,红外LED,制造Al x Ga(1-x)As衬底的方法,制造用于红外LED的外延晶片的方法 以及制造红外LED的方法,由此保持高水平的透射率,并且在半导体器件的制造中证明该器件具有优异的特性。 本发明的Al x Ga(1-x)As衬底(10a)是具有主表面(11a)的Al x Ga(1-x)As层(11)的Al x Ga(1-x)As衬底(10a) 并且在与主表面(11a)相反的一侧具有背面(11b),其特征在于,在Al x Ga(1-x)As层(11)中,后面的Al的量分数x (11b)大于主表面(11a)中的Al的量分数x。 此外,Al x Ga(1-x)As衬底(10a)还具有与Al x Ga(1-x)As层(11)的背面(11b)接触的GaAs衬底(13)。