Device for determining the values of at least one parameter of particles, especially of water droplets
    1.
    发明授权
    Device for determining the values of at least one parameter of particles, especially of water droplets 有权
    用于确定颗粒,特别是水滴的至少一个参数的值的装置

    公开(公告)号:US06813020B2

    公开(公告)日:2004-11-02

    申请号:US09979886

    申请日:2001-11-27

    CPC classification number: G01N15/0227

    Abstract: A device for determining the values of a parameter of particles, especially of water droplets, includes a measuring element having a measuring region that is intended to accommodate the particles. An illumination device illuminates the measuring region with a light beam, and an image acquisition device, having a camera, acquires an image of the measuring region illuminated by the illumination device. A processing device determines the values of the parameter from the image acquired by the camera. To determine the values of the parameter, the illumination device produces point illumination using a light beam whose light rays are focused on an objective optic of the image acquisition devices.

    Abstract translation: 用于确定颗粒,特别是水滴的参数的值的装置包括具有旨在容纳颗粒的测量区域的测量元件。 照明装置用光束照射测量区域,并且具有照相机的图像采集装置获取由照明装置照亮的测量区域的图像。 处理装置根据由相机获得的图像确定参数的值。 为了确定参数的值,照明装置使用其光线聚焦在图像采集装置的物镜上的光束产生点照明。

    Probe for measuring the thickness of frost accretion on a surface
    2.
    发明授权
    Probe for measuring the thickness of frost accretion on a surface 有权
    测量表面霜冻厚度的探头

    公开(公告)号:US07719697B2

    公开(公告)日:2010-05-18

    申请号:US11817004

    申请日:2006-02-21

    Inventor: Sandrine Roques

    CPC classification number: G01B11/0633 B64D15/20

    Abstract: A probe for measuring the thickness of frost accretion on a surface includes a plurality of measuring stages that are stacked substantially orthogonally to the base of the probe. Each measuring stage has an emitter that emits a light beam that is substantially parallel to the base and a receiver that receives the light beam after reflection on the frost.

    Abstract translation: 用于测量表面上的霜积的厚度的探针包括多个基本上垂直于探针的基部堆叠的测量台。 每个测量台具有发射基本上平行于基部的光束的发射器和在霜上反射之后接收光束的接收器。

    Probe For Measuring the Thickness of Frost Accretion on a Surface
    3.
    发明申请
    Probe For Measuring the Thickness of Frost Accretion on a Surface 有权
    用于测量表面上霜冻厚度的探头

    公开(公告)号:US20080278733A1

    公开(公告)日:2008-11-13

    申请号:US11817004

    申请日:2006-02-21

    Inventor: Sandrine Roques

    CPC classification number: G01B11/0633 B64D15/20

    Abstract: The invention relates to a probe for measuring the thickness of frost accretion on a surface. According to the invention, the probe comprises a plurality of measuring stages (E1 to En) which are stacked at least substantially orthogonally to the base (2) of the probe and each measuring stage comprising at least one emitter which can emit a light beam that is at least substantially parallel to said base and at least one receiver which can receive said light beam after reflection on the frost.

    Abstract translation: 本发明涉及一种用于测量表面上霜冻厚度的探针。 根据本发明,探针包括多个测量台(E 1至En),它们至少基本上垂直于探针的基部(2)堆叠,并且每个测量台包括至少一个可发射光束的发射器 其至少基本上平行于所述基座和至少一个接收器,所述接收器可以在霜上反射之后接收所述光束。

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