摘要:
An illumination system for illuminating a scan region on an object and for providing a white level reference for a detector may comprise a light source for producing light rays and an elongate lens having a first end and a second end positioned between the light source and the scan region. The lens collects some of the light rays from the light source and directs them onto the scan region. A first spot lens is positioned adjacent the first end of the elongate lens and a second spot lens is positioned adjacent the second end of the elongate lens. The first and second spot lenses direct some of the light rays from the light source toward first and second ends of the scan line. A white level reference mark is positioned adjacent the lens and the light source so that some of the light rays from the light source are reflected by the white level reference mark to the detector.
摘要:
Page sensor apparatus for producing a signal related to a thickness of a sheet of paper may comprise a base plate and a foot plate positioned in opposed relation. The base and foot plates are arranged to allow the paper to pass therebetween, so that the base and foot plates become separated by a distance substantially equal to the thickness of the sheet of paper. Capacitance sensing apparatus connected to the base plate and the foot plate senses changes in the electrical capacitance of the base and foot plates and generates an output signal related thereto, the output signal being related to the plate separation, thus paper thickness.
摘要:
An X-ray collimator formed of stacked laminated layers with apertures therein aligned to form complex 3-dimensional collimator structures, and method of fabrication thereof, is presented.
摘要:
An x-ray shielded imaging detector is disclosed. In one embodiment, the x-ray shielded imaging detector comprises a scintillator, a photodetector, and an optical connection between the scintillator and the photodetector. The x-ray shielded imaging detector also includes a first high density shielding material adjacent the optical connection. The first high density shielding material absorbs x-ray energy and attenuates it before the x-ray energy reaches the photodetector when the x-ray energy impinges on the x-ray shielded imaging detector at an angle other than perpendicular to a major axis of the scintillator and the photodetector. Other embodiments and related methods of operating an x-ray system are also disclosed.
摘要:
An x-ray laminography imaging system that utilizes a nonplanar anode target to enable objects that are oblique to the direction of projection of electron beams onto the target to be precisely imaged. Because many objects that laminography techniques are used to inspect are oblique or have portions that are oblique, the nonplanar anode target of the present invention enables enables spot patterns to be traced that are parallel to the plane of the object, regardless of whether it is oblique or orthogonal.
摘要:
A image-based system for inspecting objects utilizes an imaging chain that defines a focal plane, a manipulator for translating and rotating either the object under inspection or the imaging chain, a surface mapping system that generates a representation of the surface of the object under inspection, and a controller that uses the representation of the surface of the object to control the manipulator so that a portion of the object under inspection lies within the focal plane of the imaging chain.
摘要:
A hand-held scanning device is disclosed in which the scanning device housing window is located such that it does not come into contact with the object being scanned while a scan is being performed. This location of the window eliminates window damage caused by contact with the object being scanned. This location also results in the window being located out of the focus area of the scanning device optical system. Accordingly, any defects occurring in the window will be out of focus and, thus, less detrimental to acquired image quality. A light source lens may be integrally formed in the same assembly as the window and this assembly may provide support for the light source.
摘要:
The present invention is an improved printed circuit board test system in which test probes are positioned to electronically engage a selected device or printed circuit board section on a printed circuit board for testing the printed circuit board for manufacturing defects. The printed circuit board test system uses a bed-of-nails test fixture to ground and excite predetermined sites on a first side of the printed circuit board and a robot to mechanically position test probe(s) at selected test sites on a second side of the printed circuit board. A controller is used to control the movement of the robotic tester and the selection of spring probes in the bed-of-nails fixture to be exited, grounded or measured.