OUTLINE MEASUREMENT OF MOVING OBJECTS
    1.
    发明申请

    公开(公告)号:US20200232788A1

    公开(公告)日:2020-07-23

    申请号:US16359111

    申请日:2019-03-20

    Inventor: John Kyriakis

    Abstract: An apparatus for non-contact monitoring of travelling objects being produced in an unguided linear process comprising: a toroidal structure with an open aperture defining a measuring zone, a source of radiation configured by a plurality of radiation devices circumferentially disposed within the measuring zone whereby the radiation source emits rays that generate a planar screen of radiation across the object circumferentially to envelop the object, a plurality of circumferentially disposed recording devices for receiving radiation from the radiation devices following interception of the rays by the objects, and analysis means for analyzing imaging information of the emitted radiation recorded by the recording devices thereby to provide a measure of the physical characteristics of the object.

    High speed magnetic oscillating device
    3.
    发明授权
    High speed magnetic oscillating device 有权
    高速磁振动装置

    公开(公告)号:US09528821B2

    公开(公告)日:2016-12-27

    申请号:US14607437

    申请日:2015-01-28

    Inventor: John Kyriakis

    Abstract: A high speed oscillating system for non-contact optical scanning of an elongated product moving in a linear production process to determine the dimensional properties and surface profile integrity thereof. The system is designed to increase the scanning frequency and thereby the capability to measure the diameter or size of the product as well as its surface integrity and pick out flaws in the structure of the product in a manner which otherwise is not possible with present day systems on the market.

    Abstract translation: 一种用于在线性生产过程中移动的细长产品的非接触式光学扫描的高速振荡系统,以确定其尺寸特性和表面轮廓完整性。 该系统旨在增加扫描频率,从而提高测量产品的直径或尺寸以及其表面完整性的能力,并以不同于当前系统的方式挑选产品结构中的缺陷 在市场上。

    HIGH SPEED MAGNETIC OSCILLATING DEVICE
    4.
    发明申请
    HIGH SPEED MAGNETIC OSCILLATING DEVICE 有权
    高速磁力振荡器件

    公开(公告)号:US20150211982A1

    公开(公告)日:2015-07-30

    申请号:US14607437

    申请日:2015-01-28

    Inventor: John Kyriakis

    Abstract: A high speed oscillating system for non-contact optical scanning of an elongated product moving in a linear production process to determine the dimensional properties and surface profile integrity thereof. The system is designed to increase the scanning frequency and thereby the capability to measure the diameter or size of the product as well as its surface integrity and pick out flaws in the structure of the product in a manner which otherwise is not possible with present day systems on the market.

    Abstract translation: 一种用于在线性生产过程中移动的细长产品的非接触式光学扫描的高速振荡系统,以确定其尺寸特性和表面轮廓完整性。 该系统旨在增加扫描频率,从而提高测量产品的直径或尺寸以及其表面完整性的能力,并以不同于当前系统的方式挑选产品结构中的缺陷 在市场上。

    Outline measurement of moving objects

    公开(公告)号:US10816329B2

    公开(公告)日:2020-10-27

    申请号:US16359111

    申请日:2019-03-20

    Inventor: John Kyriakis

    Abstract: An apparatus for non-contact monitoring of travelling objects being produced in an unguided linear process comprising: a toroidal structure with an open aperture defining a measuring zone, a source of radiation configured by a plurality of radiation devices circumferentially disposed within the measuring zone whereby the radiation source emits rays that generate a planar screen of radiation across the object circumferentially to envelop the object, a plurality of circumferentially disposed recording devices for receiving radiation from the radiation devices following interception of the rays by the objects, and analysis means for analyzing imaging information of the emitted radiation recorded by the recording devices thereby to provide a measure of the physical characteristics of the object.

    MEASUREMENT OF INDUSTRIAL PRODUCTS MANUFACTURED BY EXTRUSION TECHNIQUES
    7.
    发明申请
    MEASUREMENT OF INDUSTRIAL PRODUCTS MANUFACTURED BY EXTRUSION TECHNIQUES 有权
    通过挤出技术制造的工业产品的测量

    公开(公告)号:US20160265901A1

    公开(公告)日:2016-09-15

    申请号:US14656106

    申请日:2015-03-12

    Inventor: John Kyriakis

    Abstract: The invention relates to apparatus for monitoring an extruded product moving in an inline extrusion process so as to effect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation which is adapted to provide a curtain of parallel rays of the radiation which is scanned across the product as the product passes therethrough in a linear manner. The composition of the emitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters of the moving products. The imaging analysis involves applying correction values to the measured transit times of the rays crossing the products which depends on its position within the curtain of rays thereby to remove inaccuracies in the final measurement results.

    Abstract translation: 本发明涉及用于监测在直列挤压工艺中移动的挤出产品的装置,以便通过连续地测量尺寸参数并确定挤压中的污染物的存在来实现该过程的质量控制。 该装置利用太赫兹辐射,该太赫兹辐射适于提供当产品以线性方式穿过其时跨过产品扫描的辐射的平行射线的帘幕。 在扫描过程之后接收的发射辐射的组成进行成像分析以确定移动产品的尺寸参数。 成像分析包括将校正值应用于穿过产品的射线的测量的传播时间,这取决于其在光幕内的位置,从而消除最终测量结果中的不准确。

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