摘要:
An adjusting device of an apparatus for generating a beam of charged particles, wherein said beam is for interacting with a target and wherein said adjusting device comprises interface means for receiving, from a user of the apparatus, a set of desired values of characteristics of the beam of charged particles; means for determining a set of nominal values of adjusting parameters of the apparatus, corresponding to said characteristics and for passing them to the apparatus; means for measuring said adjusting parameters of the apparatus, and for computing corresponding values of said characteristics of the beam; and means for determining whether a correction of said values of adjusting parameters is necessary.
摘要:
A device for adjusting a beam of charged particles. The device includes an adjustment mechanism for storing desired characteristics for the beam, determining values of adjustment parameters of the apparatus according to its characteristics, storing these values, and giving these stored values to the adjustment parameters of the apparatus. The device can be applied in particular to the manufacturing of nanostructures.
摘要:
This device comprises adjustment means (40) for storing the desired characteristics for the beam (14), determining the values of the adjustment parameters of the apparatus (2) according to its characteristics, storing these values and giving these stored values to the adjustment parameters of the apparatus. The invention is applied in particular to the manufacturing of nanostructures.
摘要:
An adjusting device of an apparatus for generating a beam of charged particles, wherein said beam is for interacting with a target and wherein said adjusting device comprises interface means for receiving, from a user of the apparatus, a set of desired values of characteristics of the beam of charged particles; means for determining a set of nominal values of adjusting parameters of the apparatus, corresponding to said characteristics and for passing them to the apparatus; means for measuring said adjusting parameters of the apparatus, and for computing corresponding values of said characteristics of the beam; and means for determining whether a correction of said values of adjusting parameters is necessary.
摘要:
A Spatial Operating Environment (SOE) with markerless gestural control includes a sensor coupled to a processor that runs numerous applications. A gestural interface application executes on the processor. The gestural interface application receives data from the sensor that corresponds to a hand of a user detected by the sensor, and tracks the hand by generating images from the data and associating blobs in the images with tracks of the hand. The gestural interface application detects a pose of the hand by classifying each blob as corresponding to an object shape. The gestural interface application generates a gesture signal in response to a gesture comprising the pose and the tracks, and controls the applications with the gesture signal.