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    INSPECTION TOOL FOR RADIOGRAPHIC SYSTEMS
    1.
    发明申请
    INSPECTION TOOL FOR RADIOGRAPHIC SYSTEMS 审中-公开
    检测工具用于放射系统

    公开(公告)号：US20090086911A1

    公开(公告)日：2009-04-02

    申请号：US11862363

    申请日：2007-09-27

    申请人： Manoharan Venugopal ,  Nityanand Gopalika ,  Manoj Kumar Meethal ,  Debasish Mishra

    发明人： Manoharan Venugopal ,  Nityanand Gopalika ,  Manoj Kumar Meethal ,  Debasish Mishra

    IPC分类号： H05G1/46

    CPC分类号： H05G1/30

    摘要： A system for radiographic inspection of an object is provided. The system comprises a radiation source configured to generate radiation, a display unit for generating a graphical user interface (GUI) including multiple fields. A user provides input data via the fields in the GUI. A processor configured to compute a plurality of exposure parameters based on the input data and a control system is configured to initialize the radiation source with the exposure parameters.

    摘要翻译： 提供了一种用于物体的射线检查的系统。 该系统包括被配置为产生辐射的辐射源，用于生成包括多个场的图形用户界面（GUI）的显示单元。 用户通过GUI中的字段提供输入数据。 配置成基于输入数据计算多个曝光参数的处理器，并且控制系统被配置为利用曝光参数来初始化辐射源。

    Converting a digital radiograph to an absolute thickness map
    3.
    发明授权
    Converting a digital radiograph to an absolute thickness map 有权
    将数字X射线照片转换为绝对厚度图

    公开(公告)号：US07480363B2

    公开(公告)日：2009-01-20

    申请号：US11108498

    申请日：2005-04-18

    申请人： Brian W. Lasiuk ,  Thomas J. Batzinger ,  Manoharan Venugopal ,  Elizabeth L. Dixon ,  Michael R. Hopple ,  Nityanand Gopalika ,  Sivaramanivas Ramaswamy ,  Debasish Mishra ,  Rajashekar Venkatachalam ,  Vamishi Krishna Reddy Kommareddy

    发明人： Brian W. Lasiuk ,  Thomas J. Batzinger ,  Manoharan Venugopal ,  Elizabeth L. Dixon ,  Michael R. Hopple ,  Nityanand Gopalika ,  Sivaramanivas Ramaswamy ,  Debasish Mishra ,  Rajashekar Venkatachalam ,  Vamishi Krishna Reddy Kommareddy

    IPC分类号： G01B15/02

    CPC分类号： G01B15/025

    摘要： A digital radiography imaging system for acquiring digital images of an object, and a method for transforming digital images into an absolute thickness map characterizing the object under inspection. The system includes a radiation source for directing radiation through a desired region of the object, and a radiation detector having a plurality of sensing elements for detecting radiation passing through the object. Numerical data generated from each sensing element is calibrated, for example by correcting for variations in radiation paths between the source and detector, by correcting for variations in the spatial frequency response (MTF) of the detector, by correcting for variations in the geometric profile of the object under inspection, and by correcting for material contained in and/or around the object. The calibrated data is processed in order to generate and display an absolute thickness map of the object. The calibration procedures are adapted for extracting a thickness map from both isotope sources and X-ray tube sources.

    摘要翻译： 一种用于获取对象的数字图像的数字放射线照相成像系统，以及将数字图像转换为表征检查对象的绝对厚度图的方法。 该系统包括用于引导辐射通过物体的期望区域的辐射源，以及具有用于检测通过物体的辐射的多个感测元件的辐射检测器。 通过校正检测器的空间频率响应（MTF）的变化，通过校正各个感测元件的几何轮廓的变化来校正每个感测元件产生的数值数据，例如通过校正源和检测器之间的辐射路径的变化 被检查物体，以及通过校正物体中和/或周围的物质。 对校准后的数据进行处理，以生成和显示对象的绝对厚度图。 校准程序适用于从同位素源和X射线管源提取厚度图。