发明授权
- 专利标题: Converting a digital radiograph to an absolute thickness map
- 专利标题(中): 将数字X射线照片转换为绝对厚度图
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申请号: US11108498申请日: 2005-04-18
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公开(公告)号: US07480363B2公开(公告)日: 2009-01-20
- 发明人: Brian W. Lasiuk , Thomas J. Batzinger , Manoharan Venugopal , Elizabeth L. Dixon , Michael R. Hopple , Nityanand Gopalika , Sivaramanivas Ramaswamy , Debasish Mishra , Rajashekar Venkatachalam , Vamishi Krishna Reddy Kommareddy
- 申请人: Brian W. Lasiuk , Thomas J. Batzinger , Manoharan Venugopal , Elizabeth L. Dixon , Michael R. Hopple , Nityanand Gopalika , Sivaramanivas Ramaswamy , Debasish Mishra , Rajashekar Venkatachalam , Vamishi Krishna Reddy Kommareddy
- 申请人地址: US PA Trevose
- 专利权人: GE Betz, Inc.
- 当前专利权人: GE Betz, Inc.
- 当前专利权人地址: US PA Trevose
- 代理机构: Wegman, Hessler & Vanderburg
- 主分类号: G01B15/02
- IPC分类号: G01B15/02
摘要:
A digital radiography imaging system for acquiring digital images of an object, and a method for transforming digital images into an absolute thickness map characterizing the object under inspection. The system includes a radiation source for directing radiation through a desired region of the object, and a radiation detector having a plurality of sensing elements for detecting radiation passing through the object. Numerical data generated from each sensing element is calibrated, for example by correcting for variations in radiation paths between the source and detector, by correcting for variations in the spatial frequency response (MTF) of the detector, by correcting for variations in the geometric profile of the object under inspection, and by correcting for material contained in and/or around the object. The calibrated data is processed in order to generate and display an absolute thickness map of the object. The calibration procedures are adapted for extracting a thickness map from both isotope sources and X-ray tube sources.
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