摘要:
A digital system and a method for operating the same. The digital system includes (a) a first logic circuit and a second logic circuit, (b) a first register, (c) a second register, (d) a third register, (e) a clock generator circuit, and (f) a controller circuit. The first logic circuit is capable of obtaining first data and sending second data. The second logic circuit is capable of obtaining the second data and sending third data. The clock generator circuit is capable of asserting (i) a first register clock signal at a first time point, (ii) a second register clock signal at a second time point, and (iii) a third register clock signal at a third time point. The controller circuit is capable of (i) determining a fourth time point, (ii) determining a fifth time point, (iii) controlling the clock generator circuit to assert the second register clock signal.
摘要:
A digital system. The digital system includes (a) a first logic circuit and a second logic circuit, (b) a first register, (c) a second register, (d) a third register, (e) a clock generator circuit, and (f) a controller circuit. The first logic circuit is capable of obtaining first data and sending second data. The second logic circuit is capable of obtaining the second data and sending third data. The clock generator circuit is capable of asserting (i) a first register clock signal at a first time point, (ii) a second register clock signal at a second time point, and (iii) a third register clock signal at a third time point. The controller circuit is capable of (i) determining a fourth time point, (ii) determining a fifth time point, (iii) controlling the clock generator circuit to assert the second register clock signal.
摘要:
A digital system and a method for operating the same. The digital system includes (a) a first logic circuit and a second logic circuit, (b) a first register, (c) a second register, (d) a third register, (e) a clock generator circuit, and (f) a controller circuit. The first logic circuit is capable of obtaining first data and sending second data. The second logic circuit is capable of obtaining the second data and sending third data. The clock generator circuit is capable of asserting (i) a first register clock signal at a first time point, (ii) a second register clock signal at a second time point, and (iii) a third register clock signal at a third time point. The controller circuit is capable of (i) determining a fourth time point, (ii) determining a fifth time point, (iii) controlling the clock generator circuit to assert the second register clock signal.
摘要:
A method and system for supporting simultaneous operation of operating systems on a single integrated circuit. The system includes a supervisory operating system (SOS) managing execution of instructions, each instruction being executable under one of the operating systems; registers grouped into multiple sets of registers, each set maintaining an identity of one of the operating systems; and a dispatcher capable of dispatching an instruction and a tag attached to the instruction, the tag identifying one of the operating systems and the instruction to be executed under the identified operating system to access one of the registers. One or more of the registers are utilized when the instruction is executed, and are included in a single set of the multiple sets of registers. The single set maintains the identity of the operating system identified by the tag, and each of the one or more registers includes an identifier matching the tag.
摘要:
A method and system for identifying logic function areas, which make up a virtual machine, that are affected by specific testcases. A Hardware Descriptor Language (HDL) is used to create a software model of the virtual machine. A simulator compiles and analyzes the HDL model, and creates a matrix scoreboard identifying logic function areas in the virtual machine. A complete list of testcases is run on the virtual machine while a monitor correlates each testcase with affected logic function areas to fill in the matrix scoreboard. When a subsequent test failure occurs, either because of a modification to a logic function area, or the execution of a new test, all logic function areas that are affected, either directly or indirectly, are identified.