公开(公告)号：US06954629B2

公开(公告)日：2005-10-11

申请号：US10444132

申请日：2003-05-23

Applicant: Min-Yi Chang

Inventor： Min-Yi Chang

IPC: H04L12/56 ,  H04W4/22 ,  H04W84/18 ,  H04M11/00

CPC classification number: H04W4/90 ,  H04W76/50 ,  H04W84/18

Abstract: A police-emergency system of wireless communication which is to generate a signal by a control circuit of the magnetic card and transmits the signal onto the host server through the wireless communication module of said magnetic card, after the host server receives the signal coming from the magnetic card, it judges if the signal is in conformity with the data in the database by the microprocessor such that the signal will be transmitted onto the police-emergency system of police-citizen connection to notice the policemen arrive on the scene where crime happened.

Abstract translation: 一种用于通过磁卡的控制电路产生信号的无线通信警用紧急系统，在主机服务器接收到来自所述磁卡的信号之后，通过所述磁卡的无线通信模块将信号发送到主机服务器 磁卡，它判断信号是否符合微处理器数据库中的数据，以便信号将被传送到警察 - 公民联系的警察紧急系统上，以通知警察到达犯罪现场的现场。

公开(公告)号：US08084769B2

公开(公告)日：2011-12-27

申请号：US11675635

申请日：2007-02-16

Applicant: Shyh-Fann Ting ,  Sheng-Hao Lin ,  Chien-Hsing Lee ,  Da-Ching Chiou ,  Sun-Chin Wei ,  Min-Yi Chang ,  Cheng-Tung Huang ,  Tung-Hsing Lee ,  Tzyy-Ming Cheng

Inventor： Shyh-Fann Ting ,  Sheng-Hao Lin ,  Chien-Hsing Lee ,  Da-Ching Chiou ,  Sun-Chin Wei ,  Min-Yi Chang ,  Cheng-Tung Huang ,  Tung-Hsing Lee ,  Tzyy-Ming Cheng

IPC: H01L23/544 ,  H01L21/66

CPC classification number: H01L22/34

Abstract: A testkey design pattern includes a least one conductive contact, at least one conductive line of a first width vertically and electrically connected to the conductive contact, and at least one pair of source and drain respectively directly connected to each side of the conductive line. The pair of source and drain and part of the conductive line of a first length directly connected to the source and drain form an electronic device. The testkey design patterns are advantageous in measuring capacitance with less error and for better gate oxide thickness extraction.

Abstract translation: 测试键设计模式包括至少一个导电触点，垂直并电连接到导电触点的至少一个第一宽度的导线和分别直接连接到导线的每一侧的至少一对源极和漏极。 一对源极和漏极以及直接连接到源极和漏极的第一长度的导电线的一部分形成电子器件。 测试键设计模式在测量电容时具有较小误差和更好的栅极氧化物厚度提取的优势。

公开(公告)号：US20080197351A1

公开(公告)日：2008-08-21

申请号：US11675635

申请日：2007-02-16

Applicant: Shyh-Fann Ting ,  Sheng-Hao Lin ,  Chien-Hsing Lee ,  Da- Ching Chiou ,  Sun-Chin Wei ,  Min-Yi Chang ,  Cheng-Tung Huang ,  Tung-Hsing Lee ,  Tzyy-Ming Cheng

Inventor： Shyh-Fann Ting ,  Sheng-Hao Lin ,  Chien-Hsing Lee ,  Da- Ching Chiou ,  Sun-Chin Wei ,  Min-Yi Chang ,  Cheng-Tung Huang ,  Tung-Hsing Lee ,  Tzyy-Ming Cheng

IPC: H01L23/58

CPC classification number: H01L22/34

Abstract: A testkey design pattern includes a least one conductive contact, at least one conductive line of a first width vertically and electrically connected to the conductive contact, and at least one pair of source and drain respectively directly connected to each side of the conductive line. The pair of source and drain and part of the conductive line of a first length directly connected to the source and drain form an electronic device. The testkey design patterns are advantageous in measuring capacitance with less error and for better gate oxide thickness extraction.

Abstract translation: 测试键设计模式包括至少一个导电触点，垂直并电连接到导电触点的至少一个第一宽度的导线和分别直接连接到导线的每一侧的至少一对源极和漏极。 一对源极和漏极以及直接连接到源极和漏极的第一长度的导电线的一部分形成电子器件。 测试键设计模式在测量电容时具有较小误差和更好的栅极氧化物厚度提取的优势。