公开(公告)号：US08289524B2

公开(公告)日：2012-10-16

申请号：US12458590

申请日：2009-07-16

Applicant: Maarten J. Jansen

Inventor： Maarten J. Jansen

IPC: G01B9/02

CPC classification number: G01B9/02057 ,  G01B9/02011 ,  G01B9/02081 ,  G01B2290/35 ,  G01B2290/70

Abstract: An interferometer includes a light source, adapted to generate a coherent light beam, a detector adapted to analyze the phase difference of optical light beams, a location unit for locating an object to be measured, a first optical path from the light source to the object and a second optical path from the object to the detector. The first and the second optical path have a common section adjacent to the object. An optical polarization modulator has been arranged in the first path.

Abstract translation: 干涉仪包括适于产生相干光束的光源，适于分析光束的相位差的检测器，用于定位待测物体的位置单元，从光源到物体的第一光路 以及从物体到检测器的第二光路。 第一和第二光路具有与物体相邻的公共部分。 光偏振调制器已经布置在第一路径中。

公开(公告)号：US08179599B2

公开(公告)日：2012-05-15

申请号：US12230233

申请日：2008-08-26

Applicant: Maarten J. Jansen

Inventor： Maarten J. Jansen

IPC: G02B13/10

CPC classification number: G02B21/004 ,  G02B21/006

Abstract: An optical system includes an optical unit with an optical axis extending through a light transmissive sample embedded in a transparent substrate, to focus on the sample embedded in the substrate and to scan the sample according to the main plane of the transparent substrate. The optical axis extends under an angle unequal to zero relative to the normal of the main plane of the transparent substrate, in order to perform a volumetric observation of a sample by obtaining information items focused in all thickness directions within the sample, at a high speed, without requiring any movement along the thickness direction of the sample.

Abstract translation: 光学系统包括光学单元，其具有延伸穿过透明基板中的透光样品的光轴，以聚焦在嵌入基板中的样品并根据透明基板的主平面扫描样品。 光轴相对于透明基板的主平面的法线不等于零的角度，以便通过以高速度获得在样品内聚集在所有厚度方向上的信息项来进行样品的体积观察 ，而不需要沿着样品的厚度方向的任何移动。

公开(公告)号：US20090059362A1

公开(公告)日：2009-03-05

申请号：US12230233

申请日：2008-08-26

Applicant: Maarten J. Jansen

Inventor： Maarten J. Jansen

IPC: G02B21/36 ,  G02B21/34 ,  G02B21/06 ,  G02B21/26

CPC classification number: G02B21/004 ,  G02B21/006

Abstract: An optical system is provided to include an optical unit with an optical axis extending through a light transmissive sample embedded in a transparent substrate, to focus on the sample embedded in the substrate and to scan the sample according to the main plane of the transparent substrate. The optical axis extends under an angle unequal to zero relative to the normal of the main plane of the transparent substrate, in order to perform a volumetric observation of a sample by obtaining information items focused in all thickness directions within the sample, at a high speed, without requiring any movement along the thickness direction of the sample.

Abstract translation: 提供了一种光学系统，其包括具有延伸穿过透明衬底中的透光样品的光轴的光学单元，以聚焦在嵌入衬底中的样品并根据透明衬底的主平面扫描样品。 光轴相对于透明基板的主平面的法线不等于零的角度，以便通过以高速度获得在样品内聚集在所有厚度方向上的信息项来进行样品的体积观察 ，而不需要沿着样品的厚度方向的任何移动。

公开(公告)号：US20100053633A1

公开(公告)日：2010-03-04

申请号：US12458590

申请日：2009-07-16

Applicant: Maarten J. Jansen

Inventor： Maarten J. Jansen

IPC: G01B9/02

CPC classification number: G01B9/02057 ,  G01B9/02011 ,  G01B9/02081 ,  G01B2290/35 ,  G01B2290/70

Abstract: The invention relates to an interferometer, comprising a light source, adapted to generate a coherent light beam, a detector adapted to analyze the phase difference of optical light beams, location means for locating an object to be measured, a first optical path from the light source to the object and a second optical path from the object to the detector, wherein the first and the second optical path have a common section adjacent to the object, wherein an optical polarization modulator has been arranged in the first path.This avoids the costs and other disadvantages of so called quarter wave plates belonging to prior art interferometers of this kind.

Abstract translation: 本发明涉及一种干涉仪，包括适于产生相干光束的光源，适于分析光束的相位差的检测器，用于定位被测物体的位置装置，来自光的第一光路 源到物体和从物体到检测器的第二光路，其中第一和第二光路具有与物体相邻的公共部分，其中光偏振调制器已经布置在第一路径中。 这避免了属于这种现有技术干涉仪的所谓的四分之一波片的成本和其它缺点。