公开(公告)号：US20080275368A1

公开(公告)日：2008-11-06

申请号：US10567120

申请日：2004-08-04

申请人： Hans Gregersen ,  Lene Kehlet Drud

发明人： Hans Gregersen ,  Lene Kehlet Drud

IPC分类号： A61B5/00

CPC分类号： A61B5/4255 ,  A61B5/036 ,  A61B5/1107 ,  A61B5/224 ,  A61B5/227 ,  A61B5/6852 ,  A61B2562/0252 ,  A61B2562/043 ,  A61B2562/168 ,  G01B7/18

摘要： An apparatus and a method for measuring deformations and force applied to a probe are disclosed. The system may be a mechanical system a physical system or a biological system such as e.g. a bodily hollow system. The apparatus comprises an elongated elastic probe, a conducting medium attached to or contained by the probe, two or more electrodes being electrically connected by the conducting medium, the electrodes being attached to the probe, and the apparatus furthermore comprising means for measuring an electrical parameter, such as the potential difference between at least two of the number of electrodes, the measured electrical parameter being indicative of a deformation of the probe in at least the longitudinal direction of the elongated probe. The force applied to the probe may be determined from a pre-calibration of the electrical parameter-force relationship of the probe.

摘要翻译： 公开了一种用于测量施加到探针上的变形和力的装置和方法。 该系统可以是物理系统或生物系统的机械系统，例如。 一个身体中空的系统。 该装置包括细长的弹性探针，连接到或由探针附着的导电介质，两个或更多个电极通过导电介质电连接，电极附接到探针，并且该装置还包括用于测量电参数的装置 例如电极数量中的至少两个之间的电位差，所测量的电参数指示探针至少在细长探针的纵向方向上的变形。 可以从探针的电参数 - 力关系的预校准来确定施加到探针的力。