公开(公告)号：US06888765B1

公开(公告)日：2005-05-03

申请号：US10067441

申请日：2002-02-04

申请人： Jeffrey P. Kotowski ,  Kyle Fodchuk

发明人： Jeffrey P. Kotowski ,  Kyle Fodchuk

IPC分类号： G01R31/317 ,  G06F13/00 ,  H03K19/0175

CPC分类号： G01R31/31713 ,  G01R31/31701

摘要： An integrated circuit including operational circuitry operable in response to at least one control signal asserted to an external node from an external source, and test circuitry coupled to the external node and the operational circuitry. In response to data asserted to the external node from an external source, the test circuitry enters a test mode in which it tests, configures, or reconfigures the operational circuitry. The test circuitry also asserts to the operational circuitry each control signal received at the external node (or an amplified or translated version thereof). Other aspects of the invention include test circuitry for use in a circuit having an access node and methods for performing on-chip testing, configuration, and control of operational circuitry within a chip in response to test data and at least one control signal asserted from an external source to an external node.

摘要翻译： 一种集成电路，包括响应于从外部源向外部节点断言的至少一个控制信号可操作的操作电路，以及耦合到外部节点和操作电路的测试电路。 响应于从外部源向外部节点断言的数据，测试电路进入测试，配置或重新配置操作电路的测试模式。 测试电路还向操作电路断言在外部节点（或其放大或翻译版本）处接收的每个控制信号。 本发明的其它方面包括在具有接入节点的电路中使用的测试电路和用于响应于测试数据和从一个或多个控制信号中断定的至少一个控制信号执行芯片内的操作电路的片上测试，配置和控制的方法 外部源到外部节点。