摘要:
The invention relates to high power, spark induced breakdown spectroscopy (SIBS) detectors with controllable delay time and to spark induced breakdown spectroscopy plasma generators with dual electrodes with specific electrode material, both for use in methods and apparatuses for detecting spectral signatures of atomic emissions, (e.g., from heavy metals such as lead, mercury, chromium, cadmium, arsenic, antimony and beryllium and radioactive materials such as uranium, plutonium, thorium and technetium) for measuring, for example, atomic concentrations of samples such as vapors and airborne particulates.
摘要:
Disclosed are apparatus, system and methods of programming and readout of a one-time programmable memory device having an array of memory cells, where the cells include an anti-fuse element and an in-cell amplifier transistor. Circuitry configured for programming and correlated double sampling readout of the cells is also disclosed.
摘要:
Disclosed are apparatus, system and methods of programming and readout of a one-time programmable memory devise having an array of memory cells, where the cells include an anti-fuse element and an in-cell amplifier transistor. Circuitry configured for programming and correlated double sampling readout of the cells is also disclosed.
摘要:
Disclosed are apparatus, system and methods of programming and readout of a one-time programmable memory devise having an array of memory cells, where the cells include an anti-fuse element and an in-cell amplifier transistor. Circuitry configured for programming and correlated double sampling readout of the cells is also disclosed.
摘要:
Disclosed are apparatus, system and methods of programming and readout of a one-time programmable memory devise having an array of memory cells, where the cells include an anti-fuse element and an in-cell amplifier transistor. Circuitry configured for programming and correlated double sampling readout of the cells is also disclosed.
摘要:
A method, apparatus, and system are disclosed providing an imaging device with memory cells containing anti-fuse elements located with or outside a pixel array. The memory cells are read out using control signal lines which are used to readout imaging pixels.