-
公开(公告)号：US07916293B2
公开(公告)日：2011-03-29
申请号：US12326335
申请日：2008-12-02
发明人： John Mitchell , Jon Sandberg , Dwight A. Sehler
IPC分类号： G01N15/02
CPC分类号： G01N15/1463 , G01N15/1459 , G01N2015/0038 , G01N2015/025 , G01N2015/1402
摘要： Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
-
2.发明授权公开(公告)号：US08154724B2
公开(公告)日：2012-04-10
申请号：US12326577
申请日：2008-12-02
申请人： John Mitchell , Dwight A. Sehler , Michael Williamson , David Rice , Jon Sandberg , Karen R. Sandberg, legal representative
IPC分类号： G01N21/00
CPC分类号： G01N15/1463 , G01N15/1459 , G01N2015/0038 , G01N2015/025 , G01N2015/1402
摘要： The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.
摘要翻译： 本发明提供了相对于传统的基于点和阵列检测的光学粒子计数器，使用二维光学成像来获取增强的检测灵敏度和扩展的感测功能的粒子检测和分析的方法和系统。 本发明的方法和系统提供基于二维光学成像的粒子感测平台，其中系统组件和规格被选择以产生可重复且容易识别的信号，包括粒子检测特征，从光学散射或从提供给系统的颗粒的发射 。 本发明的系统和方法能够准确和灵敏地检测，识别和表征（例如，确定）液相或气相样品中的颗粒的尺寸。
-
公开(公告)号：US08174697B2
公开(公告)日：2012-05-08
申请号：US13245366
申请日：2011-09-26
发明人： John Mitchell , Jon Sandberg , Dwight A. Sehler
CPC分类号： G01N15/1463 , G01N15/1459 , G01N2015/0038 , G01N2015/025 , G01N2015/1402
摘要： Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
摘要翻译： 这里描述了能够空间分辨粒子与电磁辐射束的相互作用的粒子检测系统。 使用特定的电磁波束截面形状和取向，可以提高粒子检测系统的检测灵敏度。 还提供了以具有低背景信号并且允许空间分辨来自颗粒的电磁辐射的散射或发射的方式来检测和调整颗粒的方法。
-
公开(公告)号：US08027035B2
公开(公告)日：2011-09-27
申请号：US13043305
申请日：2011-03-08
发明人： John Mitchell , Jon Sandberg , Dwight A. Sehler
IPC分类号： G01N15/02
CPC分类号： G01N15/1463 , G01N15/1459 , G01N2015/0038 , G01N2015/025 , G01N2015/1402
摘要： Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.
摘要翻译： 这里描述了能够空间分辨粒子与电磁辐射束的相互作用的粒子检测系统。 使用特定的电磁波束截面形状和取向，可以提高粒子检测系统的检测灵敏度。 还提供了以具有低背景信号并且允许空间分辨来自颗粒的电磁辐射的散射或发射的方式来检测和调整颗粒的方法。
-
-
-
搜索结果
4 条记录 (耗时 0.012 秒)
