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公开(公告)号：US20150258627A1
公开(公告)日：2015-09-17
申请号：US14435454
申请日：2013-10-02
发明人： Prachai Norajitra , Jarir Aktaa , Luigi Spatafora , Widodo Basuki
CPC分类号： B23K20/021 , B23K20/02 , B23K20/233 , B23K2103/08 , B23K2103/10 , B23K2103/12 , B23K2103/18 , B32B15/01 , Y10T428/12493
摘要： A method for producing a layer composite includes providing a plurality of layers, each layer comprising a material comprising at least one of a metal, a metal alloy, and at least one layer comprising a metal which forms a solid solution with a refractory metal. Each layer of the plurality of layers is placed in an alternating manner one onto another so as to form a layer stack and so as to form contact surfaces. The plurality of layers in the layer stack are diffusion welded in a non-oxidizing atmosphere at a temperature of between 0.4 times and 0.9 times a melting temperature of the metal and at a pressure comprising a directional pressure component oriented orthogonally in relation to the contact surfaces. A magnitude of at least one of the pressure and the temperature change during the diffusion welding.
摘要翻译： 制备层复合材料的方法包括提供多个层，每个层包括包含金属，金属合金和至少一层包括与难熔金属形成固溶体的金属的层中的至少一种的材料。 多个层中的每一层以交替的方式一个放置到另一层上，以便形成层叠并形成接触表面。 层叠体中的多个层在非氧化性气氛中以金属的熔融温度的0.4倍至0.9倍之间的温度扩散焊接，并且在包括相对于接触表面正交定向的定向压力分量的压力 。 在扩散焊接期间压力和温度变化中的至少一个的大小。
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2.发明申请公开(公告)号：US20210181093A1
公开(公告)日：2021-06-17
申请号：US16762452
申请日：2018-11-08
申请人： FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V. , KARLSRUHER INSTITUT FÜR TECHNOLOGIE (KIT)
发明人： Julius KRAUSE , Robin GRUNA
摘要： The invention relates to a method for identifying one or more spectral features in a spectrum (4, 5) of a sample for a constituent analysis of the sample, comprising providing the spectrum (4, 5), predefining an approximation function (6), which is a continuously differentiable mathematical function, respectively forming an (n−1)-th order derivative (7, 8, 9) of the spectrum (4, 5) and of the approximation function (6), wherein the number n>1, generating a correlation matrix (10) from the two (n−1)-th order derivatives (7, 8, 9), and respectively identifying the spectral feature or one of the spectral features in each case as a function of a local extremum (i) of the correlation matrix (10) for at least one extremum (i) of the correlation matrix (10) in order to simplify the constituent analysis of the sample.
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3.发明授权公开(公告)号：US11293856B2
公开(公告)日：2022-04-05
申请号：US16762452
申请日：2018-11-08
申请人： FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E. V. , KARLSRUHER INSTITUT FÜR TECHNOLOGIE (KIT)
发明人： Julius Krause , Robin Gruna
摘要： The invention relates to a method for identifying one or more spectral features in a spectrum (4, 5) of a sample for a constituent analysis of the sample, comprising providing the spectrum (4, 5), predefining an approximation function (6), which is a continuously differentiable mathematical function, respectively forming an (n−1)-th order derivative (7, 8, 9) of the spectrum (4, 5) and of the approximation function (6), wherein the number n>1, generating a correlation matrix (10) from the two (n−1)-th order derivatives (7, 8, 9), and respectively identifying the spectral feature or one of the spectral features in each case as a function of a local extremum (i) of the correlation matrix (10) for at least one extremum (i) of the correlation matrix (10) in order to simplify the constituent analysis of the sample.
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公开(公告)号：US20210354184A1
公开(公告)日：2021-11-18
申请号：US17288737
申请日：2019-10-30
IPC分类号： B21D11/08 , B21D13/00 , B21D26/021 , B21D26/059 , B29C53/00 , B29C53/06
摘要： The present invention relates to a method for manufacturing a product with a spatially structured surface from a semi-finished product, a semi-finished product required for this purpose and a product produced in this way. The method is characterized in that a patterned target bending location is produced in the semi-finished product, and in that the semi-finished product is then subjected to a pressure over its surface, which is dosed in such a way that the pressure causes a plastic deformation of the semi-finished product along the target bending location, so that a product with a spatially structured surface is produced.
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公开(公告)号：US11514589B2
公开(公告)日：2022-11-29
申请号：US15733383
申请日：2019-01-21
申请人： FRAUNHOFER-GESELLSCHAFT ZUR FÖRDERUNG DER ANGEWANDTEN FORSCHUNG E.V. , KARLSRUHER INSTITUT FÜR TECHNOLOGIE (KIT)
发明人： Thomas Längle , Beniamin Noack , Florian Pfaff , Uwe Hanebeck , Robin Gruna , Georg Maier
摘要： The invention relates to a method and a device for determining at least one mechanical property of at least one object,
wherein the at least one object is subjected to at least one interaction which influences a movement state of the at least one object,
wherein the at least one interaction is selected such that the movement state effectuated by the interaction is a function of the at least one mechanical property,
wherein the at least one object is observed using at least one camera,
wherein the movement state is determined from images recorded by the at least one camera
and wherein the at least one mechanical property of the at least one object is determined from the movement state thus determined.-
公开(公告)号：US09824259B2
公开(公告)日：2017-11-21
申请号：US14443529
申请日：2013-10-29
发明人： Urban Liebel , Jochen Gehrig
CPC分类号： G06K9/00134 , G01N21/253 , G01N35/00 , G02B21/361 , G02B21/362 , G02B21/367 , G06K2209/403
摘要： The present invention relates to a device and a method for microscopy (100) of a plurality of samples (102), wherein the device comprises:—a first optical detector (106, 108), which is designed to consecutively adopt a plurality of measuring positions and to detect first image data (200) of a sample (104) with a first spatial resolution at each measuring position;—an image data analyser device which is designed to determine for each sample (202) a region (204) of the sample to be examined represented within the first image data (200) in each case;—a second optical detector (110, 112), which is coupled to the first optical detector (106, 108) in such a manner that the second optical detector (110, 112) tracks the first optical detector (106, 108) and therefore the second optical detector (110, 112) adopts measuring positions which the first optical detector (106, 108) had previously adopted. The second optical detector (110, 112) is designed to detect for each sample (202) respective second image data (300) from the region (204) to be examined in the sample (202) concerned, with a spatial resolution that is higher than the first spatial resolution.
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