- 专利标题: Device and method for microscopy on a plurality of samples
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申请号: US14443529申请日: 2013-10-29
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公开(公告)号: US09824259B2公开(公告)日: 2017-11-21
- 发明人: Urban Liebel , Jochen Gehrig
- 申请人: KARLSRUHER INSTITUT FÜR TECHNOLOGIE (KIT) , ACQUIFER AG
- 申请人地址: DE
- 专利权人: KARLSRUHER INSTITUT FUER TECHNOLOGIE
- 当前专利权人: KARLSRUHER INSTITUT FUER TECHNOLOGIE
- 当前专利权人地址: DE
- 代理机构: Onello & Mello, LLP
- 优先权: DE102012022603 20121119
- 国际申请: PCT/EP2013/003252 WO 20131029
- 国际公布: WO2014/075764 WO 20140522
- 主分类号: H04N7/18
- IPC分类号: H04N7/18 ; G06K9/00 ; G02B21/36 ; G01N21/25 ; G01N35/00
摘要:
The present invention relates to a device and a method for microscopy (100) of a plurality of samples (102), wherein the device comprises:—a first optical detector (106, 108), which is designed to consecutively adopt a plurality of measuring positions and to detect first image data (200) of a sample (104) with a first spatial resolution at each measuring position;—an image data analyser device which is designed to determine for each sample (202) a region (204) of the sample to be examined represented within the first image data (200) in each case;—a second optical detector (110, 112), which is coupled to the first optical detector (106, 108) in such a manner that the second optical detector (110, 112) tracks the first optical detector (106, 108) and therefore the second optical detector (110, 112) adopts measuring positions which the first optical detector (106, 108) had previously adopted. The second optical detector (110, 112) is designed to detect for each sample (202) respective second image data (300) from the region (204) to be examined in the sample (202) concerned, with a spatial resolution that is higher than the first spatial resolution.
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