摘要:
Apparatus and method for use in determining the location of object surface points wherein a short pulse of optical energy is projected at the object surface and a time dependent gain function is used to modify the reflected optical energy resulting from the pulse so that time delay information indicative range can be developed and processed.
摘要:
A practice for developing data for use in the three-dimensional location of the points on an object surface wherein first and second sensor means are used to cause first and second electromagnetic radiation to be directed at the object surface at first and second directions which are in a common plane.
摘要:
A system for object surface determination in which the projector/detector sensor of the system is controlled by a control detector which is responsive to a plurality of different parts of a portion of the reflected radiation being sensed by the projector/detector sensor.
摘要:
A 3-D measurement system utilizing a holographic scanner is provided with beam direction compensation means for compensating for changes in angular deflection of the scanner and further means is provided for synchronizing the scanner diffraction segments with the camera imaging mechanism of the 3-D system as well as for providing multiple offsets of the projected beam.
摘要:
A plurality of projectors are positioned in spaced relationship about an object with a surface to be geometrically analyzed. The projectors have cooperating masks which project onto the object illuminated patterns that subdivide the object into predetermined sections. Each mask has a predetermined pattern of sections, and is applied in sequence. The masks are cooperatively advanced in the projectors, with a separate illuminating pattern prevailing on the object each time that the masks are advanced. The combinations of the patterns on the masks define closely-spaced sections subdividing the object. The patterns are coded so that each section is uniquely defined in coded form. Cameras having the entire object within their field of view, photograph the object each time a separate mask is applied.
摘要:
The surface to be sensed or scanned is placed in the path of a projector which is moved along an axis of the surface. The path of motion of the projector is subdivided into predetermined sections which are illuminated by the projector in accordance with a predetermined sequential pattern. This procedure of moving the projector is repeated a predetermined number of times, with a separate illuminating pattern prevailing each time that the projector is moved relative to the surface and traverses the entire surface to be scanned. The combinations of the patterns obtained from the repeated scannings of the projector define closely-spaced sections of the surface. The patterns are coded so that each section is uniquely defined in coded form. A camera having the entire surface within its field of view photographs the surface each time that the projector is moved along the axis of the surface.
摘要:
A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to detect the image of the pattern projected on the article. The patterned light projector includes an extended light source that directs light along the optical axis and a light patterning member disposed at an angle with respect to the optical axis such that the light pattern is in focus in an image plane parallel to the plane of the article, thereby satisfying the Scheimpflug condition. The light pattern preferably includes lines of light projected onto the article with a substantially equal thickness and spacing. The spacing of the lines is preferably greater than a spacing or pitch of the specular elements, such as the solder balls on a BGA device. An image processor is coupled to the image detector to receive the image, locate the lines, and measure the lateral shift of the lines. Height information is determined from the lateral shift and projection angle using triangulation.
摘要:
A method and apparatus is provided for calibrating distance measuring instruments, in particular, optical three dimensional measurement sensors. The method is not restricted to aligning the motion of the calibrating surface to be parallel to the sensor centerline. Accordingly more than one sensor can be present during the calibration procedure. This leads to the practicality of aligning multiple sensor systems using a common translation stage for all sensors or using translation stages that are a part of the system. The joint calibration of sensors embedded in a system guarantees proper registration without additional steps. A method for calibrating optical sensors to accuracies approaching the wavelength of light is given.
摘要:
An optical spot scanning system for use in three dimensional measurement and inspection of an object surface wherein a deflector means is placed in the path of the projection axis of the spot projector to deflect the portion of same between the deflector and the object surface, thereby moving the spot to various positions on the object surface, and wherein the deflector means is also positioned in the path of the optical axis of the system sensing means to deflect the portion of same between the sensing means and the object surface by the same degree as the portion of the projection axis is deflected, thereby ensuring the axes portions which are aligned to be coplanar remain coplanar, and that the image of the spot on the object surface will be properly conveyed to the linear sensor array in the sensing means.
摘要:
A plurality of projectors are positioned in spaced relationship about an object with a surface to be geometrically analyzed. The projectors have cooperating masks which project onto the object illuminated patterns that subdivide the object into predetermined sections. Each mask has a predetermined pattern of sections, and is applied in sequence. The masks are cooperatively advanced in the projectors, with a separate illuminating pattern prevailing on the object each time that the masks are advanced. The combinations of the patterns on the masks define closely-spaced sections subdividing the object. The patterns are coded so that each section is uniquely defined in coded form. Cameras having the entire object within their field of view, photograph the object each time a separate mask is applied. To sense sections of the surface independent of the reflectance characteristics of the surface, the projectors direct two separate illuminating signals at the object surface. The two illuminating signals are inversely related to each other, and after they are recorded by the cameras, the recorded signals are subtracted from each other to result in a waveform having points at which the subtraction yields zero values. These points are then used to define the projection field.