Ultrasonic transducer
    1.
    发明授权

    公开(公告)号:US11642697B2

    公开(公告)日:2023-05-09

    申请号:US16753271

    申请日:2018-11-06

    发明人: Jimmy Fong

    IPC分类号: B06B1/06

    CPC分类号: B06B1/0685

    摘要: An ultrasonic transducer is disclosed. The transducer includes a wear cap and an active element. The wear cap includes at least one slot arranged so as to define a strip. The strip is arranged to be in vibrational communication with the active element. The ultrasonic transducer may include a rigid block. The active element may be interposed between the wear cap and the rigid block, and the rigid block may be configured to provide a backing mass for the active element. Optionally, the rigid block may include chamfered edges.

    ULTRASONIC TRANSDUCER
    3.
    发明申请

    公开(公告)号:US20200331028A1

    公开(公告)日:2020-10-22

    申请号:US16753271

    申请日:2018-11-06

    发明人: Jimmy Fong

    IPC分类号: B06B1/06

    摘要: An ultrasonic transducer (1) is disclosed. The transducer includes a wear cap (2) and an active element (18). The wear cap includes at least one slot arranged so as to define a strip (15). The strip is arranged to be in vibrational communication with the active element. The ultrasonic transducer may include a rigid block (21). The active element may be interposed between the wear cap and the rigid block, and the rigid block may be configured to provide a backing mass for the active element. Optionally, the rigid block may include chamfered edges (25, 27).

    ULTRASONIC SENSOR FOR GUIDED WAVE TESTING

    公开(公告)号:US20220163487A1

    公开(公告)日:2022-05-26

    申请号:US17601671

    申请日:2020-03-23

    发明人: Nick Kemp Keith Vine

    IPC分类号: G01N29/24 G01N29/04 G01N29/22

    摘要: An ultrasonic sensor for guided wave testing is disclosed. The sensor comprises a flexible circuit board (2), an array of piezoelectric elements (10) on the flexible circuit board and an array of permanent magnets (16). Each piezoelectric element is interposed between a respective permanent magnet and the flexible circuit board.

    Determining a thickness of a region of wall- or plate-like structure

    公开(公告)号:US11022436B2

    公开(公告)日:2021-06-01

    申请号:US16323381

    申请日:2017-08-01

    发明人: Tomasz Pialucha

    摘要: A method of determining a thickness of a region of wall- or plate-like structure which is thinner than a thickness of a surrounding region of the structure due to a cavity in the structure is disclosed. The method comprises comparing a measured time-frequency dispersion map for at least one dispersive guided wave obtained by measuring the structure using guided waves with a reference time-frequency dispersion map obtained by modelling the structure, determining a cut-off frequency, fc, at which the measured time-frequency dispersion map and the reference time-frequency dispersion map differ and calculating the thickness of the thinner region in dependence upon the cut-off frequency.

    METHODS AND SYSTEMS FOR DETERMINING A THICKNESS OF AN ELONGATE OR EXTENDED STRUCTURE

    公开(公告)号:US20210108916A1

    公开(公告)日:2021-04-15

    申请号:US17052117

    申请日:2019-10-09

    IPC分类号: G01B17/02

    摘要: A method of determining a thickness of an elongate or extended structure (2; FIG. 8) using elastic waves is disclosed. The method comprises receiving at least one time-domain signal from a transducer (12), generating a frequency-domain signal in dependence upon the at least one time-domain signal, reducing noise in the frequency-domain signal to provide a de-noised frequency-domain signal, comparing the de-noised frequency-domain signal with at least one reference signal, each reference signal corresponding to a respective thickness; and determining the thickness of the elongate or extended structure in dependence comparing the de-noised frequency-domain signal with the at least one reference signal.

    DETERMINING A THICKNESS OF A REGION OF WALL- OR PLATE-LIKE STRUCTURE

    公开(公告)号:US20200173773A1

    公开(公告)日:2020-06-04

    申请号:US16323381

    申请日:2017-08-01

    发明人: Tomasz Pialucha

    摘要: A method of determining a thickness of a region of wall- or plate-like structure which is thinner than a thickness of a surrounding region of the structure due to a cavity in the structure is disclosed. The method comprises comparing a measured time-frequency dispersion map for at least one dispersive guided wave obtained by measuring the structure using guided waves with a reference time-frequency dispersion map obtained by modelling the structure, determining a cut-off frequency, fc, at which the measured time-frequency dispersion map and the reference time-frequency dispersion map differ and calculating the thickness of the thinner region in dependence upon the cut-off frequency.