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1.发明申请Semiconductor Device With Damage Detection Circuit and Method for Producing the Same 有权具有损伤检测电路的半导体器件及其制造方法公开(公告)号：US20080035923A1
公开(公告)日：2008-02-14
申请号：US11837187
申请日：2007-08-10
Applicant: Andreas Tschmelitsch , Gerhard Zojer , Guenter Holl , Guenter Herzele
Inventor： Andreas Tschmelitsch , Gerhard Zojer , Guenter Holl , Guenter Herzele
IPC: H01L29/10
CPC classification number: G06F17/5068 , G01R31/2884 , H01L22/14 , H01L22/34
Abstract: A semiconductor chip having a current source coupled between a first potential and an electrical node, a detection circuit having an input coupled to the electrical node, and a first active component coupled in series with the current source and further coupled between the electrical node and a second potential, wherein the first active component is coupled to the electrical node via a first conductive interconnect.
Abstract translation: 一种具有耦合在第一电位和电节点之间的电流源的半导体芯片，具有耦合到所述电节点的输入的检测电路以及与所述电流源串联耦合的另一个有源元件，并且还耦合在所述电节点和 第二电位，其中所述第一有源分量经由第一导电互连件耦合到所述电节点。
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2.发明授权公开(公告)号：US08575723B2
公开(公告)日：2013-11-05
申请号：US11837187
申请日：2007-08-10
Applicant: Andreas Tschmelitsch , Gerhard Zojer , Guenter Holl , Guenter Herzele
Inventor： Andreas Tschmelitsch , Gerhard Zojer , Guenter Holl , Guenter Herzele
IPC: H01L23/544
CPC classification number: G06F17/5068 , G01R31/2884 , H01L22/14 , H01L22/34
Abstract: A semiconductor chip having a current source coupled between a first potential and an electrical node, a detection circuit having an input coupled to the electrical node, and a first active component coupled in series with the current source and further coupled between the electrical node and a second potential, wherein the first active component is coupled to the electrical node via a first conductive interconnect.
Abstract translation: 一种具有耦合在第一电位和电节点之间的电流源的半导体芯片，具有耦合到所述电节点的输入的检测电路以及与所述电流源串联耦合的另一个有源元件，并且还耦合在所述电节点和 第二电位，其中所述第一有源分量经由第一导电互连件耦合到所述电节点。
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