公开(公告)号：US09188543B2

公开(公告)日：2015-11-17

申请号：US13448691

申请日：2012-04-17

Applicant: Tao Li ,  Guiju Song ,  Kevin George Harding ,  Dongmin Yang ,  Zirong Zhai ,  Jie Han ,  Gil Abramovich

Inventor： Tao Li ,  Guiju Song ,  Kevin George Harding ,  Dongmin Yang ,  Zirong Zhai ,  Jie Han ,  Gil Abramovich

IPC: G01N21/88 ,  G02B26/00 ,  G02B27/28 ,  G01N21/21

CPC classification number: G01N21/8806 ,  G01N21/21 ,  G01N21/8803 ,  G01N21/954 ,  G02B5/3083 ,  G02B23/243 ,  G02B26/00 ,  G02B27/0075 ,  G02B27/286

Abstract: An optical system configured to visually inspect a target having a variable position with respect to the optical system is provided. The optical system includes a polarizer configured to convert an incident light reflected or diffused from the target into linearly polarized light; a light modulating element configured to modulate a polarization state of the linearly polarized light in response to control signals; and a lens group comprising at least one birefringent element, the birefringent element configured to refract or reflect the modulated linearly polarized light with a first polarization state under a first refraction index to enable inspection of the target at a first object position, and the birefringent element further configured to refract or reflect the modulated linearly polarized light with a second polarization state under a second refraction index to enable inspection of the target at a second object position.

Abstract translation: 提供一种被配置为目视检查相对于光学系统具有可变位置的目标的光学系统。 光学系统包括：偏振器，被配置为将从目标反射或扩散的入射光转换成线偏振光; 光调制元件，被配置为响应于控制信号调制所述线偏振光的偏振状态; 以及包括至少一个双折射元件的透镜组，所述双折射元件被配置为在第一折射率下折射或反射具有第一偏振态的调制线偏振光，以使得能够在第一物体位置检查所述目标，并且所述双折射元件 还被配置为在第二折射率下折射或反射具有第二偏振状态的经调制的线性偏振光，以使得能够在第二物体位置检查目标。

公开(公告)号：US09007689B2

公开(公告)日：2015-04-14

申请号：US13066000

申请日：2011-04-04

Applicant: Gil Abramovich ,  Kevin George Harding ,  Robert William Tait ,  Mark Marshall Meyers ,  Qingying Hu

Inventor： Gil Abramovich ,  Kevin George Harding ,  Robert William Tait ,  Mark Marshall Meyers ,  Qingying Hu

IPC: G02B27/10 ,  G02B27/00 ,  G02B27/12

CPC classification number: G02B27/0075 ,  G02B27/123

Abstract: Disclosed are method and apparatus for forming multiple images of an object comprising a plurality of depth segments. An optical system comprises an infinity optical subsystem and a multi-image optical subsystem. The infinity optical subsystem is configured to receive light from the object and form a first image focussed at infinity. A multi-image optical subsystem is configured to receive the first image and form multiple images via multiple focussing lenses. Each multiple image can correspond to a different depth segment. A portion of the light from the first image can also be filtered before entering a focussing lens. Multiple images under different filtering conditions, corresponding to different depth segments or to the same depth segment, can be formed.

Abstract translation: 公开了用于形成包括多个深度段的对象的多个图像的方法和装置。 光学系统包括无穷远光学子系统和多图像光学子系统。 无穷远光学子系统被配置为从对象接收光并形成聚焦在无限远的第一图像。 多图像光学子系统被配置为接收第一图像并通过多个聚焦透镜形成多个图像。 每个多个图像可以对应于不同的深度段。 来自第一图像的光的一部分也可以在进入聚焦透镜之前被滤波。 可以形成在不同滤波条件下对应于不同深度段或相同深度段的多个图像。

公开(公告)号：US20120166102A1

公开(公告)日：2012-06-28

申请号：US12977440

申请日：2010-12-23

Applicant: Edward James Nieters ,  James Anthony Ruud ,  Kevin George Harding ,  Wayne Charles Hasz ,  Emad Andarawis Andarawis ,  Thomas James Batzinger ,  Nirm Velumylum Nirmalan ,  Prabhjot Singh ,  Guanghua Wang

Inventor： Edward James Nieters ,  James Anthony Ruud ,  Kevin George Harding ,  Wayne Charles Hasz ,  Emad Andarawis Andarawis ,  Thomas James Batzinger ,  Nirm Velumylum Nirmalan ,  Prabhjot Singh ,  Guanghua Wang

IPC: G06F19/00 ,  G01B11/14 ,  H05K3/00

CPC classification number: G01M5/0016

Abstract: A method and system for monitoring creep in a moving object are provided. The creep monitoring system includes a creep sensor assembly formed onto a surface of an object rotatable about an axis, the creep sensor assembly includes at least one of an image pattern and a radio frequency interrogatable circuit. The creep monitoring system also includes an online monitoring system communicatively coupled to the creep sensor assembly. The online monitoring system configured to collect information from the creep sensor assembly relative to an amount and a rate of creep of the object. The creep monitoring system also includes a processor programmed to receive the information, correct the information for movement of the creep sensor assembly during the collection, and determine a creep rate, a crack presence, and a temperature of the object simultaneously.

Abstract translation: 提供了一种用于监测移动物体中的蠕变的方法和系统。 蠕变监测系统包括形成在可围绕轴线旋转的物体的表面上的蠕变传感器组件，蠕变传感器组件包括图像图案和无线电频率可询问电路中的至少一个。 蠕变监测系统还包括通信地耦合到蠕变传感器组件的在线监测系统。 在线监测系统被配置为相对于物体的蠕变量和速率收集来自蠕变传感器组件的信息。 蠕变监测系统还包括被编程为接收信息的处理器，校正用于在收集过程中蠕变传感器组件移动的信息，同时确定物体的蠕变速率，裂纹存在和温度。

公开(公告)号：US20110064282A1

公开(公告)日：2011-03-17

申请号：US12694840

申请日：2010-01-27

Applicant: Gil Abramovich ,  Kevin George Harding ,  Qingying Hu ,  Swaminathan Manickam ,  Meena Ganesh ,  Christopher Allen Nafis

Inventor： Gil Abramovich ,  Kevin George Harding ,  Qingying Hu ,  Swaminathan Manickam ,  Meena Ganesh ,  Christopher Allen Nafis

IPC: G06T7/00

CPC classification number: G06K9/00033 ,  G06T7/571 ,  G06T2207/10016 ,  G06T2207/20221

Abstract: This invention provides a method for contactless fingerprint detection and verification comprising illuminating a fingerprint and directing a reflected light through an imaging system using liquid crystal panels and birefringent elements to polarize the light. A plurality of polarized images are captured and used to calculate the depth of structural features on the fingertip. A means to generate a two-dimensional rolled equivalent image of the fingerprint is also provided which may then be used for verification and authentication. The invention also provides an imaging system for carrying out the method.

Abstract translation: 本发明提供了一种用于非接触式指纹检测和验证的方法，其包括：使用液晶面板和双折射元件照射指纹并引导反射光穿过成像系统以使光偏振。 捕获多个偏振图像并用于计算指尖上的结构特征的深度。 还提供了用于生成指纹的二维滚动等效图像的​​手段，然后可以将其用于验证和认证。 本发明还提供一种用于执行该方法的成像系统。

公开(公告)号：US20100296104A1

公开(公告)日：2010-11-25

申请号：US12469893

申请日：2009-05-21

Applicant: Gil Abramovich ,  Kevin George Harding ,  Ralph Gerald Isaacs ,  Guiju Song ,  Joseph Benjamin Ross ,  Jianming Zheng

Inventor： Gil Abramovich ,  Kevin George Harding ,  Ralph Gerald Isaacs ,  Guiju Song ,  Joseph Benjamin Ross ,  Jianming Zheng

IPC: G01B11/24

CPC classification number: G01B11/2527 ,  G01N21/8806 ,  G01N2201/0635 ,  G02B13/22

Abstract: An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.

Abstract translation: 提供检查系统。 检查系统包括光源，光栅，相移单元，成像器和处理器。 光源被配置为产生光。 光栅处于所生成的光的路径中，并且被配置为在光通过光栅之后产生光栅图像。 相移单元被配置为将光栅图像的多个相移图案形成并反射到物体表面上以形成多个投影相移图案。 成像器被配置为获得投影的相移图案的图像数据。 处理器被配置为从图像数据重建物体表面。 还提出了检测方法和移相投影机。

公开(公告)号：US07812968B2

公开(公告)日：2010-10-12

申请号：US12042740

申请日：2008-03-05

Applicant: Clark Alexander Bendall ,  Kevin George Harding ,  Guiju Song ,  Li Tao ,  Ming Jia ,  Xinjun Wan

Inventor： Clark Alexander Bendall ,  Kevin George Harding ,  Guiju Song ,  Li Tao ,  Ming Jia ,  Xinjun Wan

IPC: G01B9/02 ,  G01B11/02

CPC classification number: G01B11/25 ,  A61B1/07 ,  G02B23/2415 ,  G02B23/2469 ,  G02B23/26 ,  G02B27/60

Abstract: A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.

Abstract translation: 提出了一种包括光源，相干光纤束和图案选择器的探针。 图案选择器设置在光源和相干光纤束的近端之间。 图案选择器包括至少一个图案化区域，光源通过该图案区域将至少一个边缘组投影到表面上。 至少一个边缘组中的每一个具有结构化光图案。 探头还包括用于获得表面的至少一个图像的成像器和被配置为对至少一个图像执行相移分析的处理单元。 提出了一种用于使用探针在表面上投影适合于相移分析的多个边缘组的方法。

公开(公告)号：US07435986B2

公开(公告)日：2008-10-14

申请号：US11609605

申请日：2006-12-12

Applicant: Kevin Patrick Capaldo ,  Mark Cheverton ,  Kevin George Harding ,  Robert Tait

Inventor： Kevin Patrick Capaldo ,  Mark Cheverton ,  Kevin George Harding ,  Robert Tait

IPC: G01N21/86 ,  H01L27/00

CPC classification number: G01N21/95 ,  G01N2021/9513

Abstract: A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.

Abstract translation: 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机，其配置为从第一光源接收从第一预定区域反射的光的第一部分，以及从第二光源传播通过膜的光的第二部分。 最后，该系统包括可开启地耦合到第一照相机的信号处理设备，其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。

公开(公告)号：US07428205B2

公开(公告)日：2008-09-23

申请号：US10065882

申请日：2002-11-27

Applicant: Kevin George Harding

Inventor： Kevin George Harding

IPC: G11B7/00

CPC classification number: G11B7/0065

Abstract: A plurality of holographic recording media are positioned one above the other on an optical substrate and contain conventional stationary or moving imagery or data sets such as binary data representative of for example written text. A plurality of memory address access media are alternately interleaved between the plurality of holographic recording media. The memory access media causes a pair of optical beams to create an interference pattern at particular hologram recording media layers causing that layer to be read out. The specific memory access media layer is selected by means of scanning the interference pattern spatially within the interrogation beam, or by means of scanning the interrogation beam in wavelength.

Abstract translation: 多个全息记录介质在光学基板上彼此重叠地定位，并且包含常规的静止或运动图像或数据集，例如表示例如书写文本的二进制数据。 多个存储器地址访问介质交替地交错在多个全息记录介质之间。 存储器存取介质使一对光束在特定的全息图记录介质层上产生干涉图案，从而使该层被读出。 通过在询问光束内空间扫描干涉图，或通过扫描波长的询问光来选择特定存储器存取介质层。

公开(公告)号：US07302109B2

公开(公告)日：2007-11-27

申请号：US10652366

申请日：2003-08-28

Applicant: Qingying Hu ,  Kevin George Harding ,  Joseph Benjamin Ross ,  Peter William Lorraine

Inventor： Qingying Hu ,  Kevin George Harding ,  Joseph Benjamin Ross ,  Peter William Lorraine

IPC: G06K9/40

CPC classification number: G01B11/25 ,  G06T7/521

Abstract: An image processing method for structured light profiling includes sampling an image of a structured light pattern to obtain an intensity distribution, selecting a number of sets of sampled points from the intensity distribution. Each of the respective sets includes a number of sampled points. The image processing method further includes fitting each of the sets of sampled points to a respective distribution function and filtering the distribution functions to select a representative distribution function for the intensity distribution.

Abstract translation: 用于结构化光谱分析的图像处理方法包括对结构化光图案的图像进行采样以获得强度分布，从强度分布中选择多个采样点集合。 各组中的每一个包括多个采样点。 图像处理方法还包括将采样点集合中的每一个拟合到相应的分布函数，并对分布函数进行滤波以选择用于强度分布的代表性分布函数。

公开(公告)号：US06701615B2

公开(公告)日：2004-03-09

申请号：US09683981

申请日：2002-03-08

Applicant: Kevin George Harding ,  John William Devitt ,  Nelson Raymond Corby, Jr. ,  Kristina Helena Valborg Hedengren

Inventor： Kevin George Harding ,  John William Devitt ,  Nelson Raymond Corby, Jr. ,  Kristina Helena Valborg Hedengren

IPC: B23P600

CPC classification number: B23P6/007 ,  B23P6/002 ,  F01D5/005 ,  F01D17/02 ,  F01D21/003 ,  Y10T29/49318 ,  Y10T29/49728 ,  Y10T29/49746 ,  Y10T29/49748 ,  Y10T29/49764 ,  Y10T29/49769 ,  Y10T29/49771 ,  Y10T29/53009 ,  Y10T29/53022

Abstract: An inspection and sorting system for part repair includes at least one sensor for inspecting a part. The sensor is configured to obtain inspection data for the part. A comparison module is configured to receive the inspection data, to generate a repair profile for the part using the inspection data, and to compare the repair profile with a baseline to arrive at a repair recommendation for the part. A method includes inspecting a part with at least one sensor to obtain preliminary inspection data for the part. The method further includes generating a preliminary repair profile from the preliminary inspection data, comparing the preliminary repair profile with a baseline, and arriving at a repair recommendation for the part based on the comparison.

Abstract translation: 用于零件修复的检查和分拣系统包括至少一个用于检查零件的传感器。 传感器被配置为获得部件的检查数据。 比较模块被配置为接收检查数据，使用检查数据生成用于部件的修复轮廓，并且将维修轮廓与基线进行比较以得到该部件的修复建议。 一种方法包括用至少一个传感器检查零件以获得该部件的初步检查数据。 该方法还包括从初步检查数据产生初步修复轮廓，将初步修复轮廓与基线进行比较，并且基于该比较来获得部件的修复推荐。