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公开(公告)号:US20130329102A1
公开(公告)日:2013-12-12
申请号:US13492258
申请日:2012-06-08
Applicant: Chun-Han TSAO , Chih-Yu LAI , Chih-Hui HUANG , Cheng-Ta WU , Yeur-Luen TU , Ching-Chun WANG , Shyh-Fann TING , Chia-Shiung TSAI
Inventor: Chun-Han TSAO , Chih-Yu LAI , Chih-Hui HUANG , Cheng-Ta WU , Yeur-Luen TU , Ching-Chun WANG , Shyh-Fann TING , Chia-Shiung TSAI
IPC: H04N5/335
CPC classification number: H01L31/02164 , H01L27/14623 , H01L27/14632 , H01L27/1464 , H01L27/14643 , H01L27/14687 , H01L27/148 , H01L51/4273
Abstract: An image sensor device including a semiconductor substrate that includes an array region and a black level correction region. The array region contains a plurality of radiation-sensitive pixels. The black level correction region contains one or more reference pixels. The substrate has a front side and a back side. The image sensor device includes a first compressively-stressed layer formed on the back side of the substrate. The first compressively-stressed layer contains silicon oxide, and is negatively charged. The second compressively-stressed layer contains silicon nitride, and is negatively charged. A metal shield is formed over at least a portion of the black level correction region. The image sensor device includes a third compressively-stressed layer formed on the metal shield and the second compressively-stressed layer. The third compressively-stressed layer contains silicon oxide. A sidewall of the metal shield is protected by the third compressively-stressed layer.
Abstract translation: 一种包括具有阵列区域和黑色电平校正区域的半导体衬底的图像传感器装置。 阵列区域包含多个辐射敏感像素。 黑色电平校正区域包含一个或多个参考像素。 基板具有前侧和后侧。 图像传感器装置包括形成在基板的背面上的第一压缩应力层。 第一压应力层含有氧化硅,带负电荷。 第二压应力层含有氮化硅,带负电荷。 在黑色电平校正区域的至少一部分上形成金属屏蔽。 图像传感器装置包括形成在金属屏蔽和第二压缩应力层上的第三压缩应力层。 第三压缩应力层含有氧化硅。 金属屏蔽层的侧壁由第三压应力层保护。
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公开(公告)号:US09059057B2
公开(公告)日:2015-06-16
申请号:US13492258
申请日:2012-06-08
Applicant: Chun-Han Tsao , Chih-Yu Lai , Chih-Hui Huang , Cheng-Ta Wu , Yeur-Luen Tu , Ching-Chun Wang , Shyh-Fann Ting , Chia-Shiung Tsai
Inventor: Chun-Han Tsao , Chih-Yu Lai , Chih-Hui Huang , Cheng-Ta Wu , Yeur-Luen Tu , Ching-Chun Wang , Shyh-Fann Ting , Chia-Shiung Tsai
IPC: H01L31/102 , H01L21/00 , H01L27/146 , H01L27/148
CPC classification number: H01L31/02164 , H01L27/14623 , H01L27/14632 , H01L27/1464 , H01L27/14643 , H01L27/14687 , H01L27/148 , H01L51/4273
Abstract: An image sensor device including a semiconductor substrate that includes an array region and a black level correction region. The array region contains a plurality of radiation-sensitive pixels. The black level correction region contains one or more reference pixels. The substrate has a front side and a back side. The image sensor device includes a first compressively-stressed layer formed on the back side of the substrate. The first compressively-stressed layer contains silicon oxide, and is negatively charged. The second compressively-stressed layer contains silicon nitride, and is negatively charged. A metal shield is formed over at least a portion of the black level correction region. The image sensor device includes a third compressively-stressed layer formed on the metal shield and the second compressively-stressed layer. The third compressively-stressed layer contains silicon oxide. A sidewall of the metal shield is protected by the third compressively-stressed layer.
Abstract translation: 一种包括具有阵列区域和黑色电平校正区域的半导体衬底的图像传感器装置。 阵列区域包含多个辐射敏感像素。 黑色电平校正区域包含一个或多个参考像素。 基板具有前侧和后侧。 图像传感器装置包括形成在基板的背面上的第一压缩应力层。 第一压应力层含有氧化硅,带负电荷。 第二压应力层含有氮化硅,带负电荷。 在黑色电平校正区域的至少一部分上形成金属屏蔽。 图像传感器装置包括形成在金属屏蔽和第二压缩应力层上的第三压缩应力层。 第三压缩应力层含有氧化硅。 金属屏蔽层的侧壁由第三压应力层保护。
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