Method of and apparatus for testing a two dimensional pattern
    1.
    发明授权
    Method of and apparatus for testing a two dimensional pattern 失效
    用于测试二维图案的方法和装置

    公开(公告)号:US4006296A

    公开(公告)日:1977-02-01

    申请号:US590440

    申请日:1975-06-26

    CPC分类号: H04N7/18

    摘要: A method of and apparatus for testing a two dimensional pattern uses a pair of pick-up devices for scanning a reference pattern and the pattern to be tested. The reference pattern is modified relative to the test pattern and includes three types of pattern traces, i.e. narrow black traces, narrow bright traces and intermediate wide grey traces. The pattern is tested by means of the narrow traces only thereby minimizing positioning and scanning problems.

    摘要翻译: 用于测试二维图案的方法和装置使用一对拾取装置来扫描参考图案和待测试图案。 参考图案相对于测试图案被修改,并且包括三种类型的图案迹线,即窄的黑色迹线,窄的亮迹线和中间的宽的灰色迹线。 通过窄轨迹测试图案,从而最小化定位和扫描问题。