Integrated circuit arrangement for test inputs
    1.
    发明授权
    Integrated circuit arrangement for test inputs 有权
    用于测试输入的集成电路布置

    公开(公告)号:US08479070B2

    公开(公告)日:2013-07-02

    申请号:US12822287

    申请日:2010-06-24

    IPC分类号: G01R31/28

    CPC分类号: G01R31/31701 G01R31/3172

    摘要: An integrated circuit chip includes a mainline function logic path communicatively connected to a first input/output (I/O) pin, a test logic path communicatively connected to the first I/O pin, a latch disposed between the communicative connection between the test logic function path and the first I/O pin, a second I/O pin communicatively connected to the latch, the second I/O pin operative to send a signal operative to change a state of the latch.

    摘要翻译: 集成电路芯片包括通信地连接到第一输入/输出(I / O)引脚的主线功能逻辑路径,通信地连接到第一I / O引脚的测试逻辑路径,设置在测试逻辑之间的通信连接之间的锁存器 功能路径和第一I / O引脚,第二I / O引脚通信地连接到锁存器,第二I / O引脚可操作以发送操作以改变锁存器的状态的信号。