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公开(公告)号：US20240348040A1
公开(公告)日：2024-10-17
申请号：US18629768
申请日：2024-04-08
CPC分类号： H02H3/445 , G01R31/086 , H02H1/0092
摘要： A test and measurement system includes one or more high voltage sources having a voltage high enough to be dangerous to users, an instrument backplane, having one or more backplane double fault protected interlocks, a power signal, and one or more slots configured to accept one or more modules, and one or more processors configured to execute code that causes the one or more processors to: monitor one or more signals from the one or more backplane double fault protected interlocks; and without engaging any of the one or more high voltage sources, determine an operational state and faulted condition of each of the one or more backplane double fault protected interlocks, and check wiring of an interlock pathway between the test and measurement instrument and a user system.
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2.发明公开公开(公告)号：US20230408577A1
公开(公告)日：2023-12-21
申请号：US18212071
申请日：2023-06-20
发明人： Gregory Sobolewski
CPC分类号： G01R31/3008 , G01R31/2642 , G01R31/2621
摘要： A testing system includes a Device Under Test (DUT) interface structured to couple to one or more DUTs and a device characterization circuit structured to be controlled to perform static testing and dynamic testing of the one or more DUTs. The device characterization circuit includes a drain amplifier coupled to a drain of the one or more DUTs that is structured to measure drain leakage current. Methods of measuring drain current in a device that performs both static and dynamic testing are also described.
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公开(公告)号：US20220350352A1
公开(公告)日：2022-11-03
申请号：US17245874
申请日：2021-04-30
发明人： William C. Weeman
摘要： A voltage source device, including a first voltage source configured to output a first voltage, source pathways to connect the first voltage source to a device under test, sensing pathways electrically coupled to the device under test; and circuitry configured to sample a second voltage at the device under test, determine a voltage difference between the first voltage and the second voltage, and adjust the first voltage based on the difference between the first voltage and the second voltage.
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公开(公告)号：US10802520B2
公开(公告)日：2020-10-13
申请号：US13862135
申请日：2013-04-12
发明人： Kevin Cawley , Wayne Goeke , Gregory Sobolewski
IPC分类号： G05F1/575 , G01R31/317 , H04M1/24
摘要： A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.
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公开(公告)号：US10763808B2
公开(公告)日：2020-09-01
申请号：US16148463
申请日：2018-10-01
发明人： James A. Niemann , Wayne C. Goeke
摘要： A test and measurement device including a source configured to output a source signal, a source output configured to output the source signal to a connected cable, a guard drive circuit electrically coupled to the source and configured to receive the source signal and generated a guard drive signal, the guard drive circuit having a gain less than one, and a guard drive circuit output configured to output the guard drive signal to a connected guard.
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公开(公告)号：US10725105B2
公开(公告)日：2020-07-28
申请号：US15721633
申请日：2017-09-29
发明人： Matthew Holtz , James Niemann , Martin Rice
IPC分类号： G01R31/20 , G01R31/319 , G01R1/073 , G01R31/28 , G01R1/04
摘要： Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.
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公开(公告)号：USD861710S1
公开(公告)日：2019-10-01
申请号：US29598408
申请日：2017-03-24
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公开(公告)号：US10338185B2
公开(公告)日：2019-07-02
申请号：US14576702
申请日：2014-12-19
发明人： Martin J. Rice
摘要： A method for calibrating a test instrument having an initial output voltage level and an open output relay can include programming the test instrument for a certain current level, starting a timer, and stopping the timer (responsive to the test instrument entering compliance) to determine a time interval. The method can also include determining whether the time interval is within a desired range.
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公开(公告)号：US20190101591A1
公开(公告)日：2019-04-04
申请号：US15721633
申请日：2017-09-29
发明人： Matthew Holtz , James Niemann , Martin Rice
IPC分类号： G01R31/319 , G01R31/28 , G01R1/073
摘要： Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.
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公开(公告)号：US20180259401A1
公开(公告)日：2018-09-13
申请号：US15849772
申请日：2017-12-21
发明人： George J. Polly
IPC分类号： G01K3/14
CPC分类号： G01K3/14
摘要： Embodiments described herein include a data acquisition unit having a plurality of ports that are each configured to receive a signal from a respective temperature sensor of a device under test. Each of the temperature sensors is associated with a location with respect to the device under test. The data acquisition unit also includes a processor configured to determine a temperature corresponding to each temperature sensor, based on the signal received from the respective temperature sensor. The processor can then generate a thermal gradient for the device under test based on the temperature and the location of each of the temperature sensors. This thermal gradient can then be output for further analysis. Additional embodiments may be described and/or claimed herein.
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