公开(公告)号：US20170131033A1

公开(公告)日：2017-05-11

申请号：US15337851

申请日：2016-10-28

申请人： PaneraTech, Inc.

发明人： Yakup Bayram ,  Alexander Ruege ,  Justin Knowles

IPC分类号： F27D21/00 ,  G01N22/02 ,  G01B15/02

CPC分类号： F27D21/0021 ,  G01B15/025 ,  G01N22/02

摘要： Disclosed is a system to evaluate and monitor the status of a material forming part of an asset, such as a refractory furnace. The system is operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials of an industrial furnace, using radiofrequency signals. The system is designed to integrate software with a plurality of sensors and additional hardware to collect data during an inspection of the furnace, even in regions of difficult access. Furthermore, the system comprises a software management subsystem configured to implement signal processing techniques to process the data collected and generate reports to visualize the status, estimate the remaining operational life, and determine the level of penetration of molten material into the surrounding layers of the furnace. Moreover, the system's software enables a user to monitor the status of the furnace both locally and remotely.

公开(公告)号：US20170061598A1

公开(公告)日：2017-03-02

申请号：US15348922

申请日：2016-11-10

申请人： FUJIFILM Corporation

发明人： MAKIKO NAGASHIMA ,  YASUNORI NARUKAWA

IPC分类号： G06T7/00 ,  G06T7/60 ,  G01N23/04

CPC分类号： G06T7/001 ,  G01B15/025 ,  G01N23/04 ,  G01N23/043 ,  G01N2021/9548 ,  G01N2223/401 ,  G01N2223/601 ,  G01N2223/628 ,  G01N2223/629 ,  G06T7/73 ,  G06T2207/10064 ,  G06T2207/10121 ,  G06T2207/30136 ,  G06T2207/30152

摘要： A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image arc corrected.

摘要翻译： 当辐射源设置在管的中心轴上时，基于从放射线检测介质产生的参考荧光透视图像，在具有参考焊接部分的管的外圆周方向上产生参考密度分布。 基于焊接检查透视图像，在具有检查对象焊接部的管的外周方向上产生焊接检查密度分布。 基于参考密度分布和焊接检验密度分布，计算密度校正信息。 密度校正信息用于校正管道的外周方向上的焊接检查透视图像中的浓度不均匀性。 基于密度校正信息，焊接检查荧光镜像中的密度不均匀性被校正。

公开(公告)号：US09524546B2

公开(公告)日：2016-12-20

申请号：US14705939

申请日：2015-05-06

申请人： FUJIFILM Corporation

发明人： Makiko Nagashima ,  Yasunori Narukawa

IPC分类号： G06T7/00 ,  G01B15/02 ,  G01N23/04 ,  G01N21/954

CPC分类号： G06T7/001 ,  G01B15/025 ,  G01N23/04 ,  G01N23/043 ,  G01N2021/9548 ,  G01N2223/401 ,  G01N2223/601 ,  G01N2223/628 ,  G01N2223/629 ,  G06T7/73 ,  G06T2207/10064 ,  G06T2207/10121 ,  G06T2207/30136 ,  G06T2207/30152

摘要： A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image are corrected.

摘要翻译： 当辐射源设置在管的中心轴上时，基于从放射线检测介质产生的参考荧光透视图像，在具有参考焊接部分的管的外圆周方向上产生参考密度分布。 基于焊接检查透视图像，在具有检查对象焊接部的管的外周方向上产生焊接检查密度分布。 基于参考密度分布和焊接检验密度分布，计算密度校正信息。 密度校正信息用于校正管道的外周方向上的焊接检查透视图像中的浓度不均匀性。 根据密度校正信息，校正焊接检查透视图像中的密度不均匀。

公开(公告)号：US20140183365A1

公开(公告)日：2014-07-03

申请号：US14140720

申请日：2013-12-26

申请人： Proton Products International Limited

发明人： John Kyriakis

IPC分类号： G01N21/88

CPC分类号： G01B11/08 ,  B29C47/0016 ,  B29C47/0019 ,  B29C47/0021 ,  B29C47/0023 ,  B29C47/025 ,  B29C47/8805 ,  B29C47/8815 ,  B29C47/8835 ,  B29C47/8845 ,  B29C47/8895 ,  B29C47/92 ,  B29C47/965 ,  B29C2947/92114 ,  B29C2947/92219 ,  B29C2947/92228 ,  B29C2947/92609 ,  B29C2947/92714 ,  B29C2947/92723 ,  G01B15/02 ,  G01B15/025 ,  G01B15/045 ,  G01N21/3581 ,  G01N21/8806

摘要： The invention relates to an apparatus for monitoring extruded products moving in an inline extrusion process so as to affect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation, which is adapted to provide a curtain of parallel rays of the radiation, which is scanned across the product as the product passes there-through in a linear manner. The composition of the omitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters and contaminant free integrity of the extrusion process.

摘要翻译： 本发明涉及一种用于监测挤压产品在一个在线挤压过程中移动的装置，以便通过连续地测量尺寸参数并确定挤压中的污染物的存在来影响该过程的质量控制。 该装置利用太赫兹辐射，其适于提供辐射的平行射线的帘幕，当产品以线性方式通过时，扫描横跨产品。 在扫描过程之后接收的省略辐射的组成进行成像分析以确定挤出过程的尺寸参数和无污染物完整性。

公开(公告)号：US08325972B2

公开(公告)日：2012-12-04

申请号：US12311277

申请日：2007-09-25

申请人： Uwe Ewert ,  Bernhard Redmer ,  Jürgen Müller

发明人： Uwe Ewert ,  Bernhard Redmer ,  Jürgen Müller

IPC分类号： G06K9/00

CPC分类号： G01B15/025 ,  G01B15/045

摘要： The invention relates to a method of carrying out measurements with penetrating radiation on a hollow object comprising at least one wall surrounding an inner space of the object, said wall comprising an inner surface and an outer surface, said method at least being carried out for determining a position and shape of at least a portion of the inner surface of the wall.

摘要翻译： 本发明涉及一种在中空物体上进行穿透辐射测量的方法，包括围绕物体内部空间的至少一个壁，所述壁包括内表面和外表面，所述方法至少被执行以确定 壁的内表面的至少一部分的位置和形状。

公开(公告)号：US08160201B2

公开(公告)日：2012-04-17

申请号：US12375327

申请日：2007-07-18

申请人： Julien Banchet ,  David Tisseur

发明人： Julien Banchet ,  David Tisseur

IPC分类号： G01N23/06 ,  G01N23/20 ,  G01N23/083 ,  G01N23/201 ,  G03H5/00

CPC分类号： G01B15/025 ,  A61B6/484 ,  G01N2223/615 ,  G21C17/06 ,  G21K2207/005 ,  G21Y2002/202 ,  G21Y2002/304 ,  G21Y2004/40

摘要： The aim of the method is to characterize an element (21) comprising a plurality of superposed layers separated from one another by interfaces. It comprises at least the following steps: The element (21) is illuminated with radiation (15) emitted by a source (13); radiation (23) transmitted through the element (21) is collected on a detector (17), this transmitted radiation forming an experimental image of the element (21) on the detector (17), the detector (17) being placed at such a distance from the element (21) that interference fringes appear on the experimental image at the interfaces between the layers; and an approximate value of at least one physical characteristic of at least one given layer is determined by calculation from the experimental image, the determination step being implemented by minimizing the difference between the experimental image and a simulated image of at least part of the experimental image of the element (21).

摘要翻译： 该方法的目的是表征包括通过界面彼此分离的多个重叠层的元件（21）。 其至少包括以下步骤：元件（21）被源（13）发射的辐射（15）照射; 通过元件（21）传输的辐射（23）被收集在检测器（17）上，该透射辐射在检测器（17）上形成元件（21）的实验图像，检测器（17）被放置在 距离元件（21）的距离是干涉条纹出现在实验图像之间的层间界面处; 并且通过从实验图像的计算来确定至少一个给定层的至少一个物理特性的近似值，所述确定步骤通过使实验图像与至少部分实验图像的模拟图像之间的差最小化来实现 的元件（21）。

公开(公告)号：US08077827B2

公开(公告)日：2011-12-13

申请号：US12711230

申请日：2010-02-23

申请人： Ming-Hwei Perng

发明人： Ming-Hwei Perng

IPC分类号： G01N23/06

CPC分类号： G01B15/025

摘要： A method for measuring the thickness of a first absorbing material in the presence of a second absorbing material is provided. The method comprises the steps as follow. The thickness (tS) of the first absorbing material is fixed and the thickness of the second absorbing material is varied to obtain a calibration standard. The intensity of the transmissive energy passing through the calibration standard is detected by acquiring multiple pairs of image data comprising a foreground value (logn(Ic+s)) and a background value (logn(Ic)). The thickness (tSi) of the first absorbing material is changed and the above steps are repeated to obtain sets of image data. A fitting constant Id is determined to describe each set of the intensity data as μ s α ⁢ t S = log n ⁡ ( I c + I d ) - log n ⁡ ( I c + s + I d ) . A best fit of the proportional constant μ s α is determined to further calculate an unknown thickness of the first absorbing material (ts′) through the equation t s ′ = α μ s ⁡ [ ln ⁡ ( I c ′ + I d ) - ln ⁡ ( I c + s ′ + I d ) ] .

摘要翻译： 提供了一种在存在第二吸收材料的情况下测量第一吸收材料的厚度的方法。 该方法包括以下步骤。 第一吸收材料的厚度（tS）是固定的，并且第二吸收材料的厚度被改变以获得校准标准。 通过获取包括前景值（logn（Ic + s））和背景值（logn（Ic））的多对图像数据来检测通过校准标准的透射能量的强度。 改变第一吸收材料的厚度（tSi）并重复上述步骤以获得一组图像数据。 确定拟合常数Id以将每组强度数据描述为μsαrustt S = log n⁡（I c + I d）-log n⁡（I c + s + I d）。 确定比例常数μsα的最佳拟合，以通过等式进一步计算第一吸收材料（ts'）的未知厚度ts'=αμs⁡[ln⁡（I c'+ I d） - ln⁡ （I c + s'+ I d）]。

公开(公告)号：US20110206182A1

公开(公告)日：2011-08-25

申请号：US12711230

申请日：2010-02-23

申请人： Ming-Hwei PERNG

发明人： Ming-Hwei PERNG

IPC分类号： G01B15/02 ,  G01N23/06

CPC分类号： G01B15/025

摘要： A method for measuring the thickness of a first absorbing material in the presence of a second absorbing material is provided. The method comprises the steps as follow. The thickness (tS) of the first absorbing material is fixed and the thickness of the second absorbing material is varied to obtain a calibration standard. The intensity of the transmissive energy passing through the calibration standard is detected by acquiring multiple pairs of image data comprising a foreground value (logn(Ic+s)) and a background value (logn(Ic)). The thickness (tSi) of the first absorbing material is changed and the above steps are repeated to obtain sets of image data. A fitting constant Id is determined to describe each set of the intensity data as μ s α  t S = log n  ( I c + I d ) - log n  ( I c + s + I d ) . A best fit of the proportional constant μ s α is determined to further calculate an unknown thickness of the first absorbing material (ts′) through the equation t s ′ = α μ s  [ ln  ( I c ′ + I d ) - ln  ( I c + s ′ + I d ) ] .

摘要翻译： 提供了一种在存在第二吸收材料的情况下测量第一吸收材料的厚度的方法。 该方法包括以下步骤。 第一吸收材料的厚度（tS）是固定的，并且第二吸收材料的厚度被改变以获得校准标准。 通过获取包括前景值（logn（Ic + s））和背景值（logn（Ic））的多对图像数据来检测通过校准标准的透射能量的强度。 改变第一吸收材料的厚度（tSi）并重复上述步骤以获得一组图像数据。 确定拟合常数Id，以将每组强度数据描述为μsα，n =（t）= log n（I c + I d）-log n（I c + s + I d）。 确定比例常数μsα的最佳拟合，以进一步计算第一吸收材料（ts'）的未知厚度，通过等式ts'=αμs[ln（I c'+ I d）-nn （I c + s'+ I d）]。

公开(公告)号：US20100214555A1

公开(公告)日：2010-08-26

申请号：US12516012

申请日：2007-12-06

申请人： Peter Schmitt ,  Guenther Kostka

发明人： Peter Schmitt ,  Guenther Kostka

IPC分类号： G01N21/00 ,  G01B15/02

CPC分类号： G01B11/0691 ,  G01B11/245 ,  G01B15/025

摘要： The material strength of extensive objects can be determined efficiently by using two distance measurers, wherein a first distance measurer determines the distance to a first main surface of the object and a second distance measurer determines the distance to a second main surface object opposing the first main surface. If potential measurement errors due to the extensive geometry are avoided by determining a reference distance between the first distance measurer and the second distance measurer by a reference unit via X-radiation, the thickness of the object between the first main surface and the second main surface can be determined with high accuracy and velocity.

摘要翻译： 可以通过使用两个距离测量器有效地确定广泛物体的材料强度，其中第一距离测量器确定到物体的第一主表面的距离，第二距离测量器确定到与第一主体相对的第二主表面物体的距离 表面。 如果通过X射线确定第一距离测量器和第二距离测量器之间的参考距离来避免由于广泛几何造成的潜在测量误差，则第一主表面和第二主表面之间的物体的厚度 可以以高精度和高速度确定。

公开(公告)号：US07535236B2

公开(公告)日：2009-05-19

申请号：US11994247

申请日：2006-09-28

申请人： Sang Young Lee ,  Jae Hun Lee ,  Hyun Kyung Han ,  Sang Geun Lee ,  Byung Woo Park

发明人： Sang Young Lee ,  Jae Hun Lee ,  Hyun Kyung Han ,  Sang Geun Lee ,  Byung Woo Park

IPC分类号： G01R27/04 ,  G01R27/32

CPC分类号： G01B15/025

摘要： The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth λ for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and λ while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance. The thickness of a superconductor or a conductor film is measured using a relation between the RSeff and the calibrated intrinsic surface resistance for superconductor films or conductor films.

摘要翻译： 本发明涉及使用微波的薄膜的厚度测量方法。 在该方法中，测量介质谐振器的Q因子。 使用Q因子确定超导体或导体膜的有效表面电阻（RSeff）和电介质的损耗角正切。 超导薄膜的穿透深度λ是使用在谐振器顶部的超导薄膜与其余部分之间具有小间隙的介质谐振器来测量的。 使用测量的RSeff和λ测定用于校准的超导体膜的固有表面电阻，而使用所测量的RSeff和本征表面电阻的性质等于固有表面电抗确定用于校准的导体膜的固有表面电阻。 使用超导体膜或导体膜的RSeff与校正的固有表面电阻之间的关系来测量超导体或导体膜的厚度。