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    Imaging apparatus and image sensor including the same
    71.
    发明授权
    Imaging apparatus and image sensor including the same 有权

    公开(公告)号：US10403668B2

    公开(公告)日：2019-09-03

    申请号：US15221719

    申请日：2016-07-28

    Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  CALIFORNIA INSTITUTE OF TECHNOLOGY

    Inventor： Amir Arbabi ,  Seunghoon Han ,  Andrei Faraon

    IPC: H04N13/00 ,  G06T7/00 ,  H01L27/146 ,  G03B35/10 ,  H04N5/225

    Abstract: An image sensor includes a substrate, thin lenses disposed on a first surface of the substrate and configured to concentrate lights incident on the first surface, and light-sensing cells disposed on a second surface of the substrate, the second surface facing the first surface, and the light-sensing cells being configured to sense lights passing through the thin lenses, and generate electrical signals based on the sensed lights. A first thin lens and second thin lens of the thin lenses are configured to concentrate a first light and a second light, respectively, of the incident lights onto the light-sensing cells, the first light having a different wavelength than the second light.

    Spectrometer including metasurface
    79.
    发明授权
    Spectrometer including metasurface 有权

    公开(公告)号：US11867556B2

    公开(公告)日：2024-01-09

    申请号：US17486326

    申请日：2021-09-27

    Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  CALIFORNIA INSTITUTE OF TECHNOLOGY

    Inventor： Seunghoon Han ,  Amir Arbabi ,  Andrei Faraon ,  Ehsan Arbabi

    IPC: G01J3/02 ,  G01J3/28 ,  G01J3/447 ,  B82Y20/00

    CPC classification number: G01J3/0208 ,  G01J3/0205 ,  G01J3/0224 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/2803 ,  G01J3/447 ,  B82Y20/00

    Abstract: A spectrometer includes a transparent substrate including a first surface and a second surface that face each other and are substantially parallel to each other; a slit provided on the first surface and through which light is incident onto the transparent substrate; a spectrum optical system including metasurface including a plurality of nanostructures that are two-dimensionally arranged and satisfy a sub-wavelength scattering condition, wherein the metasurface includes a focusing metasurface which includes first nanostructures of the plurality of nanostructures, and is configured to reflect, disperse, and focus the light incident thereon through the slit, at different angles based on respective wavelengths; and a sensor configured to receive the light from the focusing metasurface. When L is a total length of an optical path from the slit to the sensor and D is a thickness of the transparent substrate, L and D satisfy the following inequality: L/D>3.

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