Method of High-Pressure Purification of [F-18]FEONM

    公开(公告)号:US20210147315A1

    公开(公告)日:2021-05-20

    申请号:US17140246

    申请日:2021-01-04

    摘要: A method is provided to purify [F-18]FEONM under a high pressure. The synthesis processes of [F-18]FEONM are integrated. An isolation process of non-toxic radio-high performance liquid chromatography (radio-HPLC) is used to purify the crude product. The method integrates a convention [F-18]FDG synthesizer and a novel radio-HPLC system together in a heat chamber. After radiofluorinating the precursor, the reaction product is purified with an alumina solid-phase column in advance to obtain the crude product while fluorine-18 is removed. Then, diphenyl semipreparative HPLC column is used for a final purification. A non-toxic solvent is used for mobile-phase eluting to remove the unreacted precursor and the phase-transfer solvent. The radiofluorination has a reaction yield about 50 percent (%). The method has an uncorrected radiochemical yield of 10˜20%. Both of the radio-HPLC and the radio-thin layer chromatography (radio-TLC) have radiochemical purity higher than 95%.

    Geometric calibration method and system for dual axis digital tomosynthesis

    公开(公告)号:US10925572B1

    公开(公告)日:2021-02-23

    申请号:US16795682

    申请日:2020-02-20

    IPC分类号: A61B6/04 A61B6/00

    摘要: A geometric calibration method for dual-axis digital tomosynthesis includes the steps of: providing a calibration phantom having a first plate, a second plate parallel to the first plate, and mark points distributed to the first and second plates; arranging any mark point at the first plate not to be vertically collinear with a mark point at the second plate; projecting the calibration phantom onto a planar detector to obtain a projected calibration-phantom image; deriving a conversion relationship between the mark point and the corresponding projected position at the planar detector to further establish a projection matrix related to an imaging system; and, applying the projection matrix to calculate a plurality of geometric parameters. In addition, a geometric calibration system for dual-axis digital tomosynthesis is also provided.

    Energy-resolved x-ray image detector

    公开(公告)号:US10466369B2

    公开(公告)日:2019-11-05

    申请号:US16167695

    申请日:2018-10-23

    IPC分类号: G01T1/202 G01T1/20 H01L27/146

    摘要: An energy-resolved X-ray image detector includes a scintillation crystal layer, a photon detector layer and an optical layer. The scintillation crystal layer includes a plurality of scintillation crystals. The photon detector layer includes a plurality of photon detector elements. The optical layer is disposed between the scintillation crystal layer and the photon detector layer. The optical layer includes a plurality of optical elements having different light transmittances. The scintillation crystal is used for converting the X-ray beams into scintillation lights, and, when each scintillation light injects the corresponding optical elements, the light transmittances of the optical elements determine whether the scintillation lights can pass through the respective optical elements. The photon detection element then detects the scintillation lights passing through the corresponding optical elements to discriminate the energy of the X-ray beams.

    Method and system for measuring thickness of thin film

    公开(公告)号:US10365085B2

    公开(公告)日:2019-07-30

    申请号:US15826884

    申请日:2017-11-30

    IPC分类号: G01B11/06 G06N3/02

    摘要: A method for measuring a thickness of a thin film includes: a step of basing on a training database to establish an artificial neural network, the training database including a plurality of modified spectra and a plurality of film thicknesses corresponding individually to the plurality of modified spectra; a step of measuring a sample having a coated film so as to obtain a spectrum; and, a step of running the artificial neural network already trained by the plurality of modified spectra so as to use the spectrum to estimate a thickness of the coated film on the sample. In addition, a system related to the method for measuring a thickness of a thin film is provided to include a measuring unit, a spectrometer and a processing unit.