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公开(公告)号：US11977100B2
公开(公告)日：2024-05-07
申请号：US17432114
申请日：2020-02-20
Applicant: NIDEC READ CORPORATION
Inventor： Michio Kaida
CPC classification number: G01R1/07342
Abstract: An inspection jig includes contact terminals and a pitch conversion unit electrically connected to the contact terminals and configured to convert a first pitch between adjacent two of the contact terminals into a second pitch different from the first pitch. The contact terminals each include a tubular body that extends in an axial direction of the contact terminal and is electrically conductive, and a conductor that is electrically conductive and has a stick shape. The tubular body includes a spring portion that has a helical shape along a peripheral surface of the tubular body. The conductor includes an uninserted portion that protrudes from the tubular body toward a first side in the axial direction, and an inserted portion that is disposed in the tubular body and is fixed to a first axial end portion of the tubular body. The pitch conversion unit includes a board portion and a protruding portion.
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公开(公告)号：US11953314B2
公开(公告)日：2024-04-09
申请号：US18152791
申请日：2023-01-11
Applicant: NIDEC READ CORPORATION
Inventor： Alexsandr Juk , Alain Ross , Takashi Miyasaka , Takeya Tsukamoto , Shigeya Kikuta
CPC classification number: G01B11/2522 , G06T7/0004 , H04N23/56 , G06T2207/30148
Abstract: A bump inspection device images a wafer that includes a plurality of bumps arranged in parallel to each other. Each of the bumps is elongated along a first direction that is along a substrate surface. The bump inspection device includes: a laser-light source that emits laser light in a direction that is inclined relative to the substrate surface; a camera that images the substrate surface onto which the laser light is emitted; and a direction adjusting portion that adjusts an arrangement relation between the direction in which the laser light is emitted and an orientation of the wafer to allow the first direction to become inclined relative to the direction in which the laser light is emitted, in a plan view. The camera images the wafer while the first direction is inclined relative to the direction in which the laser light is emitted, in a plan view.
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公开(公告)号：US20230160691A1
公开(公告)日：2023-05-25
申请号：US18152791
申请日：2023-01-11
Applicant: NIDEC READ CORPORATION
Inventor： Alexsandr JUK , Alain ROSS , Takashi MIYASAKA , Takeya TSUKAMOTO , Shigeya KIKUTA
CPC classification number: G01B11/2522 , G06T7/0004 , H04N23/56 , G06T2207/30148
Abstract: A bump inspection device images a wafer that includes a plurality of bumps arranged in parallel to each other. Each of the bumps is elongated along a first direction that is along a substrate surface. The bump inspection device includes: a laser-light source that emits laser light in a direction that is inclined relative to the substrate surface; a camera that images the substrate surface onto which the laser light is emitted; and a direction adjusting portion that adjusts an arrangement relation between the direction in which the laser light is emitted and an orientation of the wafer to allow the first direction to become inclined relative to the direction in which the laser light is emitted, in a plan view. The camera images the wafer while the first direction is inclined relative to the direction in which the laser light is emitted, in a plan view.
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公开(公告)号：US20230127522A1
公开(公告)日：2023-04-27
申请号：US17910362
申请日：2021-02-22
Applicant: NIDEC READ CORPORATION
Inventor： Masahiro KAWAGUCHI
Abstract: A clamp-type AC voltage probe includes: a clamp portion that clamps a cable to be measured; an electrode disposed to be opposed to the cable clamped by the clamp portion; a parallel circuit in which a capacitor and a resistance are connected in parallel, and one end of which is connected to the electrode; a resistance one end of which is connected to the other end of the parallel circuit and the other end of which is connected to a circuit ground; a capacitor one end of which is connected to the other end of the parallel circuit and the other end of which is connected to the circuit ground; and an amplifier an input terminal of which is connected to the one end or the other end of the parallel circuit, and that amplifies and outputs a signal input into the input terminal.
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公开(公告)号：US11415599B2
公开(公告)日：2022-08-16
申请号：US16466656
申请日：2017-10-04
Applicant: NIDEC READ CORPORATION
Inventor： Masami Yamamoto , Norihiro Ota , Shigeki Sakai
Abstract: A contact probe may include a Ni pipe that may include a coiled spring structure, and the Ni pipe 11 may contain 0.5 to 10 wt % of phosphorus (P). The contact probe may have improved durability, by reducing shrinkage, after probing performed in a high temperature environment.
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Patent Agency Ranking
66.发明申请公开(公告)号：US20220155399A1
公开(公告)日：2022-05-19
申请号：US17438471
申请日：2020-03-05
Applicant: NIDEC READ CORPORATION
Inventor： Tatsufumi KUSUDA
Abstract: A detection value correction system is a detection value correction system that corrects detection values of a plurality of sensors that are arranged in a line and detect a physical quantity, and includes a correction processing unit that corrects a detection value of a target sensor, which is a sensor to be corrected, among the sensors based on at least detection values of sensors adjacent to the target sensor.
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公开(公告)号：US20220026481A1
公开(公告)日：2022-01-27
申请号：US17421739
申请日：2019-12-19
Applicant: NIDEC READ CORPORATION
Inventor： Norihiro OTA , Michio KAIDA
Abstract: A probe includes a tubular body having conductivity and a tubular shape, and a first central conductor having conductivity and a stick shape. The tubular body has a cross section perpendicular to an axial direction, the cross section having a shape that is rectangular or hexagonal, and the first central conductor includes a first insertion portion having a cross section perpendicular to an axial direction of the first central conductor, the cross section having a shape that is same as the shape of the cross section of the tubular body, the first insertion portion being inserted into one end portion side of the tubular body, and a first projecting portion projecting from one end portion of the tubular body.
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公开(公告)号：US20210141023A1
公开(公告)日：2021-05-13
申请号：US17043729
申请日：2019-07-23
Applicant: NIDEC-READ CORPORATION
Inventor： Keita GUNJI
IPC: G01R31/389 , G01R31/52 , G01R31/392 , H02J7/00
Abstract: A battery impedance measuring device includes a connection circuit unit that includes a terminal detachable from a charging terminal for charging a secondary battery, a terminal detachable from a charging terminal for charging the secondary battery, a first capacitor connected to the terminal, and a second capacitor connected to terminal, and a main body unit that includes an AC signal supply unit that supplies an AC signal to the secondary battery via the first and second capacitors, and a measurement unit that detects at least one of a signal obtained from the secondary battery via the terminal and the first capacitor and a signal obtained from the secondary battery via the terminal and the second capacitor and measures impedance of the secondary battery based on the detected signal.
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公开(公告)号：US20210132112A1
公开(公告)日：2021-05-06
申请号：US17043770
申请日：2019-05-27
Applicant: NIDEC-READ CORPORATION
Inventor： Hidekazu YAMAZAKI , Yukio KUMAMOTO
IPC: G01R1/067
Abstract: A probe has a substantially bar shape, and includes a tip end, a base end, and a body portion that is located between the tip end and the base end and has a thickness in a thickness direction orthogonal to an axial direction of the substantially bar shape thinner than the tip end. The body portion includes a slope surface that is continuous with the tip end and is inclined with respect to the axial direction in a direction in which the thickness becomes gradually thinner with increasing distance from the tip end. A first region having a surface shape that bulges outward is provided in at least a part of the slope surface.
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公开(公告)号：US20210063454A1
公开(公告)日：2021-03-04
申请号：US17040555
申请日：2019-03-04
Applicant: NIDEC READ CORPORATION
Inventor： Tadashi TAKAHASHI
Abstract: A resistance measuring device includes: a first jig; a plurality of first contacts; a second jig; a plurality of second contacts; a resistance measuring unit that supplies a current between a first contact and a second contact, which correspond to each other, detects a voltage between a first contact and a second contact, and calculates a resistance value of an object to be measured based on a relationship between a value of the supplied current and a value of the detected voltage; first wirings connecting the resistance measuring unit and each of the first contacts, for the first contacts, respectively; and second wirings connecting the resistance measuring unit and each of the second contacts while passing from the resistance measuring unit through the first jig, for the second contacts, respectively.
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