公开(公告)号：US20220137094A1

公开(公告)日：2022-05-05

申请号：US17432114

申请日：2020-02-20

Applicant: NIDEC READ CORPORATION

Inventor： Michio KAIDA

IPC: G01R1/073

Abstract: An inspection jig includes contact terminals and a pitch conversion unit electrically connected to the contact terminals and configured to convert a first pitch between adjacent two of the contact terminals into a second pitch different from the first pitch. The contact terminals each include a tubular body that extends in an axial direction of the contact terminal and is electrically conductive, and a conductor that is electrically conductive and has a stick shape. The tubular body includes a spring portion that has a helical shape along a peripheral surface of the tubular body. The conductor includes an uninserted portion that protrudes from the tubular body toward a first side in the axial direction, and an inserted portion that is disposed in the tubular body and is fixed to a first axial end portion of the tubular body. The pitch conversion unit includes a board portion and a protruding portion.

公开(公告)号：US20220357362A1

公开(公告)日：2022-11-10

申请号：US17636901

申请日：2020-08-08

Applicant: NIDEC-READ CORPORATION

Inventor： Michio KAIDA

IPC: G01R1/073 ,  G01R31/28

Abstract: An inspection jig includes: film-shaped wiring substrates each having one surface provided with an electrode; a pedestal that supports the wiring substrates which are laminated such that electrode regions are exposed, the electrode region being a region where the electrode is provided in each of the wiring substrates; and a plurality of probes which have base end portions in contact with the electrode regions and extend in a direction away from the electrode regions.

公开(公告)号：US20220155346A1

公开(公告)日：2022-05-19

申请号：US17598918

申请日：2020-03-12

Applicant: NIDEC READ CORPORATION

Inventor： Michio KAIDA ,  Norihiro OTA ,  Yusuke YOKOTA

IPC: G01R1/073 ,  G01R31/28

Abstract: In a contact terminal, the first insertion portion includes a first contact portion having a first flat surface along an axial direction, the second insertion portion includes a second contact portion having a second flat surface along the axial direction, the first flat surface and the second flat surface are in contact with each other, the tubular body includes at least one of a first end side notch provided along the axial direction on a peripheral surface of the one end portion in the axial direction of the tubular body and a second end side notch provided along the axial direction on a peripheral surface of the other end portion in the axial direction of the tubular body.

公开(公告)号：US20150310161A1

公开(公告)日：2015-10-29

申请号：US14693134

申请日：2015-04-22

Applicant: NIDEC-READ CORPORATION

Inventor： Michio KAIDA ,  Toshihide MATSUKAWA ,  Makoto FUJINO ,  Osamu HIKITA

IPC: G06F17/50

CPC classification number: G06F17/5086

Abstract: Provided is a method of designing a circuit board inspecting jig having a contact to be brought into conductive contact with a test point on a circuit board to be inspected. The method includes: preparing temporary design data by temporarily designing the circuit board inspecting jig based on design data for the circuit board to be inspected (a first designing process); acquiring an expansion and contraction ratio of the circuit board based on a condition upon manufacturing the circuit board (and an environmental condition upon inspecting the circuit board) (an expansion and contraction ratio acquiring process); and obtaining design data for the circuit board inspecting jig to be actually manufactured by scaling the temporary design data up and down by the expansion and contraction ratio (a second designing process).

Abstract translation: 提供一种设计电路板检查夹具的方法，该夹具具有与要检查的电路板上的测试点导电接触的触点。 该方法包括：基于要检查的电路板的设计数据临时设计电路板检查夹具（第一设计过程），准备临时设计数据; 根据制造电路板的条件（以及检查电路板的环境条件）（扩张和收缩比率获取过程）获得电路板的膨胀和收缩比; 并通过缩小比例（第二设计过程）来获取实际制造的电路板检查夹具的设计数据。

公开(公告)号：US20220026481A1

公开(公告)日：2022-01-27

申请号：US17421739

申请日：2019-12-19

Applicant: NIDEC READ CORPORATION

Inventor： Norihiro OTA ,  Michio KAIDA

IPC: G01R31/26 ,  G01R1/073 ,  G01R31/68

Abstract: A probe includes a tubular body having conductivity and a tubular shape, and a first central conductor having conductivity and a stick shape. The tubular body has a cross section perpendicular to an axial direction, the cross section having a shape that is rectangular or hexagonal, and the first central conductor includes a first insertion portion having a cross section perpendicular to an axial direction of the first central conductor, the cross section having a shape that is same as the shape of the cross section of the tubular body, the first insertion portion being inserted into one end portion side of the tubular body, and a first projecting portion projecting from one end portion of the tubular body.

公开(公告)号：US20190353684A1

公开(公告)日：2019-11-21

申请号：US16413609

申请日：2019-05-16

Applicant: Nidec-Read Corporation ,  SV Probe Technology Taiwan Co., Ltd.

Inventor： Michio KAIDA ,  Huei Che Yu

IPC: G01R1/073 ,  G01R1/067 ,  G01R31/28

Abstract: Provided are a probe that enables control of a bending direction and can be simply manufactured, an inspection jig using the probe, an inspection device, and a method of manufacturing the probe. A probe has a substantially bar-like shape extending linearly and includes: a tip end portion, a body portion continuous with the tip end portion Pa; and a base end portion continuous with the body portion. The body portion includes a first connection region having a thickness in a thickness direction perpendicular to an axial direction of the bar-like shape that gradually decreases away from the tip end portion, and a second connection region having a thickness that gradually decreases away from the base end portion. A dimension of the body portion in a width direction perpendicular to the thickness direction is larger than dimensions of the tip end portion and the base end portion.

公开(公告)号：US20150268298A1

公开(公告)日：2015-09-24

申请号：US14662327

申请日：2015-03-19

Applicant: NIDEC-READ CORPORATION

Inventor： Takashi NAKAGAWA ,  Toshihide MATSUKAWA ,  Osamu HIKITA ,  Michio KAIDA

IPC: G01R31/28 ,  G01R1/067

CPC classification number: G01R31/2808 ,  G01N2021/95638 ,  G01R1/06794 ,  G01R31/2805 ,  H05K3/0008 ,  H05K2203/1545 ,  H05K2203/162

Abstract: A flexible circuit board inspecting apparatus for conducting an inspection on a flexible circuit board includes a transport path and an inspection part mechanism. The transport path is configured to successively transport the flexible circuit board having a plurality of unit circuit boards arranged thereon. The inspection part mechanism is configured to bring and distance a jig for inspecting the flexible circuit board transported on the transport path close to and from the flexible circuit board. The transport path includes a longitudinal transport portion for transporting the flexible circuit board in a downward vertical direction. The inspection part mechanism moves the jig in a direction perpendicular to the flexible circuit board transported on the longitudinal transport portion to bring and distance the jig close to and from the flexible circuit board.

Abstract translation: 用于在柔性电路板上进行检查的柔性电路板检查装置包括传送路径和检查部分机构。 传送路径被配置为连续地传送其上布置有多个单元电路板的柔性电路板。 检查部机构被配置为使用于检查在靠近柔性电路板的传送路径上传送的柔性电路板的夹具和距离。 传送路径包括用于沿向下垂直方向传送柔性电路板的纵向传送部分。 检查部机构使夹具沿垂直于在纵向传送部上运送的柔性电路板的方向移动，使夹具与柔性电路板靠近和离开。