摘要:
A wavelength locker includes a first beam splitter positioned in a beam path of an output beam produced by a laser. The first beam splitter splits the output beam into a first beam and a second beam. An interferometric optical element is optically contacted to the first beam splitter. The interferometric optical element receives the second beam from the first beam splitter and generates a third beam with an optical power that varies periodically with wavelength. A second beam splitter is positioned in a beam path of the first beam or in a beam path of an output beam produced by a laser, and creates a fourth beam. A first detector generates a first signal in proportion to an optical power of the third beam. A second detector generates a second signal in proportion to an optical power of the fourth beam. A wavelength of the output beam is adjusted in response to a comparison of the first and second signals and a predetermined reference signal level.
摘要:
In a fringe analysis method using Fourier transform, fringe image data is determined in a state where a wavefront from an object and a wavefront from a reference are relatively inclined with respect to each other by a minute amount, and a carrier fringe occurring due to this inclination is superposed on a fringe occurring due to wavefront information of the object. The inclination is set such that the carrier frequency occurring due to the inclination is a predetermined multiple of the basic frequency determined by the wavefront information of the object and observing means.
摘要:
In an optical coherence tomography apparatus: low-coherence light from a light source is split into signal light and reference light; at least one of the frequencies of the signal light and the reference light is shifted so as to produce a predetermined frequency difference between the frequencies; the reference light and a portion of the signal light reflected from the object are optically multiplexed so as to produce interference light; and the optical intensity of the interference light is detected in order to obtain a tomographic image of the object. In the light source, the pulse width of pulsed light emitted from a pulsed light source unit is reduced by an optical-waveguide structure. The optical-waveguide structure is made of a material having a normal dispersion characteristic, and includes a structure which realizes an anomalous dispersion characteristic so as to reduce the pulse width of the pulsed light.
摘要:
A spectroscopic image input system has an image data capturing apparatus for capturing the image data of an object by using a two-dimensional image-sensing device, a spectrum data obtaining apparatus for obtaining the spectrum data of the object within a smaller area and with higher wavelength resolution than the image data capturing apparatus, and a determination section for determining a portion of the object in which to obtain the spectrum data on the basis of the image data captured. Thus, this spectroscopic image input system captures the image data and obtains the spectrum data automatically.
摘要:
The method and system operate to calibrate a transmission laser of the dense wavelength division multiplexer (DWDM) and to lock the laser to a selected transmission wavelength. In one example, the transmission laser is a widely tunable laser (WTL) to be tuned to one of a set of International Telecommunications Union (ITU) transmission grid lines for transmission through an optic fiber. To lock the WTL to an ITU grid line, a portion of the output beam from the WTL is routed through the etalon to split the beam into a set of transmission lines for detection by a detector. Another portion of the beam is routed directly to another detector. A wavelength-locking controller compares signals from the two detectors and adjusts the temperature of the etalon to align the wavelength of one of the transmission lines of the etalon with the wavelength of the output beam, then controls the WTL in a feedback loop to lock the laser to the etalon line. The wavelength-locking controller thereafter monitors the temperature of the etalon and keeps the temperature constant to prevent any wavelength drift in the etalon. In one example, the etalon is a silicon etalon configured to have finesse of about 20 and to provide a free spectral range of about 8 GHz. With these parameters, the system is able to lock the wavelength of the WTL to within a precision of about 0.2 GHz. In another example, the etalon is first calibrated during manufacture to determine a “set point” operating temperature sufficient to align transmission peaks of the etalon with desired ITU grid lines. The etalon is thereafter mounted within a WTL and the etalon is adjusted to the set point temperature so as to align transmission peaks of the etalon with the desired ITU grid lines to permit wavelength locking. This later technique allows for rapid switching between channels and obviates the need for a gas cell within the WTL.
摘要:
A method and system for stabilizing and demodulating an interferometer at quadrature are described. In response to receipt of a signal indicative of optical power of the interferometer, an interferometer control system determines an optical path length correction required to stabilize the interferometer at quadrature utilizing signal amplitudes appearing at multiple harmonics of the signal. In a particularly preferred embodiment, the signal amplitudes are calculated utilizing the Goertzel algorithm, a computationally efficient discrete Fourier transform. The interferometer control system then outputs an error signal indicative of the optical path length correction. In a preferred embodiment, the error signal forms the DC component of a composite stabilization signal, whose AC component is the reference modulation signal utilized to excite a transducer to modulate the optical path length of the interferometer. With the interferometer stabilized at quadrature, the interferometer control system determines a first signal amplitude of a particular harmonic without target oscillation and a second signal amplitude of the same harmonic with target oscillation. Based upon the relative magnitudes of the first and second signal amplitudes, the interferometer control system determines a solution set for the displacement amplitude of the interferometer target. Any ambiguity in the displacement amplitude can then be eliminated utilizing additional information gained from the signal amplitude present at a harmonic of a target oscillation frequency.
摘要:
Heterodyne-based optical spectrum analysis involves measuring the sweep rate of a swept local oscillator signal and then generating an output signal that accounts for non-uniformities in the sweep rate of the swept local oscillator signal. In an embodiment, an input signal is combined with a swept local oscillator signal in an optical coupler and the sweep rate of the swept local oscillator signal is measured in a relative frequency measurement system. The combined optical signal is output from the optical coupler to a receiver and a heterodyne beat signal is generated. The heterodyne beat signal and measured local oscillator frequency sweep rate information are utilized by a signal processor to generate an output signal that is indicative of an optical parameter of the input signal and that accounts for non-uniformities in the sweep rate of the local oscillator signal. Because the actual sweep rate of the swept local oscillator signal is measured during analysis of the input signal, the horizontal scale accuracy of heterodyne-based OSAs is improved.
摘要:
The present invention is a nondestructive and quantitative laser ultrasonic laser apparatus and associated method for determining adhesion quality of a coating on a substrate. The apparatus of the invention is preferably a pulsed laser for generation and Michelson-type interferometer based system and includes a rotary probe head assembly for making evaluations within a cylindrical test specimen. The method of the invention includes data analysis that uses acquired data from the ultrasonic laser apparatus and computes the dispersion relation or curves (frequency versus velocity) using a ridge-following technique in wavelet analysis and from this, outputs the adhesive quality of the coating by comparing it with a theoretically based determination of a particular coating/substrate bond system. The invention is used for evaluating adhesion quality of coatings used in a gun bore.
摘要:
In a method for generating time markers of arbitrary points on moving components and an optical trigger device for performing the method, light from a broadband light source with a correspondingly short coherence length is split into two paths, namely a measurement light path and a reference light path, and is coupled into two optical waveguides, the light of the reference light path is at least partially coupled back and the light of the measurement light path is focused at a measurement point and reflected by the component passing through the focus, wherein the light distances in the measurement light path up to the focus and in the reference light path up to the coupling-back plane are of the same length within the coherence length of the radiated light, wherein the coupled-back light from the reference light path and the measurement light path is brought to interference and detected by a detector, and wherein a short modulation event occurs at the detector when the component passes through the focus.
摘要:
In a process for analyzing the wavefront of a light beam, a diffraction grating with rectangular meshing is placed in a plane perpendicular to the light beam to be analyzed and optically conjugate with the analysis plane. Different emergent beams from the grating interfere to form an image whose deformations are related to the slopes of the wavefront analyzed. The grating multiplies an intensity function, implemented by a two-dimensional intensity grating, which defines a rectangular meshing of sub-pupils transmitting the light from the beam to be analyzed into a plurality of emergent beams disposed in accordance with a rectangular meshing, with a phase function implemented by a two-dimension phase grating which introduces a phase shift between two adjacent emergent beams such that the two emergent beams are in phase opposition.