Abstract:
Detected and stored are zero-order light positions which are an angular position of the pre-spectroscope and that of the main spectroscope at which a main light ray incident on the inlet slit reaches the outlet slit via the pre-spectroscope and the main spectroscope. In a state where the main spectroscope is located at its zero-order light position, the pre-spectroscope is rotated to detect the angular position of the pre-spectroscope for a predetermined wavelength. Further, in a state where the pre-spectroscope is located at its zero-order light position, the main spectroscope is rotated to detect the angular position of the main spectroscope for the predetermined wavelength.
Abstract:
Scanning based wavelength measurement systems which are suitable for both localised and distributed WDM, High Density WDM, and coherent systems are based around the use of a fixed cavity Fabry-Perot Etalon which when the output of a tuneable laser is passed through it produces a number of reference equispaced transmission maxima. These maxima are used in a Scanning Heterodyne or Scanning Filter based Spectrometer for detection of the wavelength position of the transmitter.
Abstract:
In order to reduce the size of a spectrophotometer having a rotatable diffraction grating and to compensate for longitudinal chromatic aberration and to provide for triangular bandwidth (where the image of the entrance aperture through which the light to be analyzed enters the spectrophotometer is equal in width to the width of exit slit through which the spectral components of each band are passed to a photodetector) thereby enabling high, accurate resolution of spectral line locations and edges of colors to be obtained, the diffraction grating is pivoted about an axis laterally displaced from the grating in the tangential plane, which plane contains substantially all of the light paths in the spectrophotometer. The exit aperture rotates with the grating and has a displacement from the grating in a direction transverse to the direction of displacement of the pivot, which displacement may be in the sagittal plane of the spectrophotometer. The displacement of the exit aperture may be in the direction of the lines of the grating and the width of the exit aperture intercepts light from the entrance slit which is directed from the grating to a mirror having power such that the power of the grating and mirror is less than one. Then the image of the entrance aperture at the exit aperture is minimally displaced in the tangential plane thereby compensating for longitudinal chromatic aberration and the projection of the entrance aperture on the exit aperture stays approximately constant over each of the spectral bands, thereby providing the spectrophotometer with a triangular bandwidth characteristic. The triangular bandwidth characteristic may be maintained without sacrificing illumination intensity by utilizing a refractive element such as a prism which is rotatable with the exit aperture and the grating. The element is in the light path to the exit aperture.
Abstract:
A novel variation of Michelson's interferometer uses tilt- and shear-compensation optics to allow various mirror motions to produce variation of path difference. The tilt-compensation mechanism consists of two complementary reflections from a single plane mirror to produce a beam having a constant angle of propagation, typically the same as the input beam. Using a retroreflector to invert the image of the single plane mirror before the second reflection produces the complementary reflections. A particularly efficient embodiment of the present invention uses a balanced disk-shaped mirror to effect very rapid variation of path difference by nutation or precession. Other advantages of tilt-compensation include photometric stability. This interferometer has applications in spectrometry, spectral imaging and metrology.
Abstract:
In order to improve the accuracy of the absolute value of a wavelength of diffraction light in a diffraction grating, a gas absorption line resulting from an absorption cell 8 is used as a wavelength reference 8. When reference light is exited from a light source 7 in a wavelength reference light source 1, the reference light is transmitted to a diffraction grating 2 as transmitted light having a spectrum absorbing only light of a predetermined wavelength by the absorption cell 8 to allow it to be reciprocated in a predetermined angle range. The diffraction grating 2 produces a split light beam from the transmitted light from the absorption cell 8. The diffraction grating 2 splits the transmitted light from the absorption cell 8 to provide diffracted light and the diffracted light from the diffraction grating 2 is received by the reference light receiving unit 3. It is possible to, without being affected by a variation in the environmental condition, accurately know the rotation angle of the diffracting grating 2 from the diffracted light of the absorption line-existing waveform component received by the reference light receiving unit 3, that is, the rotation angle of the diffraction grating 2 at a wavelength at that time.
Abstract:
Complex atomic or molecular spectral signatures embedded in interfering background spectra are very rapidly recognized by a spectrometric device that employs precise sweep rate control with signal slope extraction. Very fast optics become feasible. High signal to noise ratios are attained in each of three operational modes. The first, PURGE, is frequently invoked and stores an ambient background pattern in differentiated form. The second, TARGET, stores a signature derived from a target substance placed within the invention's sensing range. The signature retains only signal derivatives that significantly depart from those encountered during PURGE. A SEEK mode employs a similar derivative extraction algorithm, and searches for matches to TARGET signatures stored in a memory bank. During SEEK, pattern correlations to stored targets are sensed, and results displayed.
Abstract:
An optical spectrum measuring apparatus is disclosed that is able to take measurements at high speed. An encoder is connected to the rotational axis of a motor. A counter counts the number of pulses outputted from the encoder 14. A comparator, that is connected to the counter and a register, compares a value stored in the counter with a value stored in the register set by a control section, and outputs an AD conversion signal when the values are equal. The control section sets the register with a value corresponding to a first measurement point and rotates a diffraction grating at a constant speed from an angle corresponding to a measurement initiation wavelength to an angle corresponding to a measurement termination wavelength. An AD conversion signal is outputted from the comparator when a measurement point is reached, then the control section sets the register to a value corresponding to the next measurement point.
Abstract:
A wavelength-scanning mechanism for a spectrometer utilizes an eccentric disc cam driven by a pulse motor to pivot a diffraction grating with a contact bar fixed thereto. A light source supplies light to the mechanism with a first concave spherical mirror reflecting light to the diffraction grating and reflecting light reflected by the diffraction grating to a zero-order light detector. A second concave spherical mirror reflects light diffracted by the diffraction grating to a diffracted light detector. A controller receives information from the light detectors and controls the pulse motor. At least one cam follower is mounted on the cam at a position eccentric from the rotational axis thereof and slidably contacts the contact bar. Alternatively, the diffraction grating has two contact bars fixed thereto, and the cam follower is pivoted between the contact bars. A method of utilizing the mechanism first determines a center value of zero-order light reflected by the diffraction grating by pivoting the diffraction grating in steps between the time zero-order light is detected until it is no longer detected. The number of steps is divided by two, which yields the center value. Diffracted light is detected at the center value, and the spectral intensity of the detected diffracted light is calculated.
Abstract:
A robust spectrophotometer (also known as a color spectrometer or colorimeter) is self contained in a housing which is adapted to be held-held and has all of the electrical, optical and electro optic elements mounted on a board captured within the housing at one end of which light from a sample is restricted to an object area and projected after being dispersed spectrally, as with a reflection grating, to an image area at a photodetector via a lens which has an optical axis and converges the dispersed light at the image area. The dispersive element is mounted on an arm having a pivot laterally offset from the dispersive element's surface where a diverging beam of light from the object area is incident and is deflected to the image area. The geometry is such that the dispersive element may be rotated to a position where the beam is specularly deflected (zeroth order diffraction), and the spectrometer calibrated when the dispersive element is in the specular reflection/deflection position. The path from the object area is approximately perpendicular to the optical axis, and then is folded by mirrors to direct the beam to incidence on the dispersive element, from which the beam is deflected and focused by the lens, the focal length of which is such that the image and object areas are in conjugate relationship. Radiant or electroluminescent sources, for example, the screen of a CRT monitor, can directly illuminate the object area. A pivotal foot on the housing having an aperture may be used to facilitate alignment of the sample with the entrance opening to the housing of the spectrophotometer.
Abstract:
A multi-slit type spectrometer includes a light diffracter which diffracts an incident light according to wavelengths; an optical shutter array member including a plurality of optical shutter elements arranged in correspondence with wavelength bands diffracted by the light diffracter, operable to transmit an incident ray according to an applied voltage, and made of PLZT. A zone of a given number of adjacent optical shutter elements is applied with a voltage corresponding to the wavelength bands of the rays incident upon the zone of adjacent optical shutter elements at a specified timing so that the rays respectively pass through or are reflected at the optical shutter elements. A signal processor receives the ray which has passed through or has been reflected at each optical shutter element and outputs an electrical signal according to the intensity of the received ray. A calculator calculates the intensity of the incident ray for each wavelength band in accordance with the electrical signal output from the signal processor and the specified applying timing.