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    Pyrometer measurements in the presence of intense ambient radiation
    41.
    发明授权
    Pyrometer measurements in the presence of intense ambient radiation 失效
    在强环境辐射的情况下进行高温计测量

    公开(公告)号：US4611930A

    公开(公告)日：1986-09-16

    申请号：US750160

    申请日：1985-07-01

    Applicant: Alexander Stein

    Inventor： Alexander Stein

    IPC: G01J5/00 ,  G01J5/06

    CPC classification number: G01J5/06 ,  G01J2005/0074 ,  G01J5/0044

    Abstract: The invention teaches a method for measuring the temperature of remote hot samples in the presence of ambient radiation. A portion of the surface of the sample is treated to obtain a spectral emissivity different from the untreated surface. The spectral radiances of the treated and untreated surface portions are measured and the temperature calculated from these values and the known emissivities.

    Abstract translation: 本发明教导了一种用于在存在环境辐射的情况下测量远程热样品的温度的方法。 处理样品表面的一部分以获得不同于未处理表面的光谱发射率。 测量处理和未处理的表面部分的光谱辐射，并根据这些值和已知的发射率计算温度。

    INFRARED IMAGING DEVICE AND FIXED PATTERN NOISE DATA GENERATION METHOD
    42.
    发明公开
    INFRARED IMAGING DEVICE AND FIXED PATTERN NOISE DATA GENERATION METHOD 审中-公开

    公开(公告)号：US20240244348A1

    公开(公告)日：2024-07-18

    申请号：US18558514

    申请日：2021-06-18

    Applicant: Mitsubishi Electric Corporation

    Inventor： Masaharu HATTORI

    IPC: H04N25/671 ,  G01J5/48 ,  G01J5/70 ,  H04N23/20 ,  H04N25/21 ,  G01J5/00

    CPC classification number: H04N25/671 ,  G01J5/48 ,  G01J5/70 ,  H04N23/20 ,  H04N25/21 ,  G01J2005/0074

    Abstract: Provided here are: an infrared imaging element that receives infrared light to capture a thermal image; an element temperature sensor that detects a temperature of the infrared imaging element; an FPN memory that stores therein FPN data at each of the temperatures; a frame memory that saves a plurality of pieces of frame data composed of thermal images captured by the infrared imaging element in a fixed period of time; and an FPN data generation unit that, when an imaging target is determined not to have changed on the basis of the frame data, acquires from the FPN memory, the FPN data corresponding to the temperature of the infrared imaging element at which said frame data were obtained; and performs averaging processing between average values AF of the plurality of pieces of frame data and the thus-acquired FPN data, to thereby regenerate the FPN data in an updated manner.

    Infrared contrasting color temperature measurement system
    44.
    发明授权
    Infrared contrasting color temperature measurement system 有权

    公开(公告)号：US10054495B2

    公开(公告)日：2018-08-21

    申请号：US14190739

    申请日：2014-02-26

    Applicant: Exergen Corporation

    Inventor： Jason N. Jarboe

    IPC: G01J5/00 ,  G01J5/06 ,  G01K7/00

    CPC classification number: G01K7/003 ,  G01J5/0003 ,  G01J5/061 ,  G01J2005/0051 ,  G01J2005/0074

    Abstract: Devices and corresponding methods can be provided to measure temperature and/or emissivity of a target. Emissivity of the target need not be known or assumed, and any temperature difference between a sensor and the target need not be zeroed or minimized. No particular bandpass filter is required. Devices can include one or two sensors viewing the same target as the target views different respective viewed temperatures. The respective viewed temperatures can be sensor temperatures, and a single sensor can be set to each of the respective viewed temperatures at different times. An analyzer can determine the temperature and/or emissivity of the target based on the respective viewed temperatures and on plural net heat fluxes detected by the sensors and corresponding to the respective viewed temperatures.

    METHOD AND APPARATUS FOR MEASURING EMISSIVITY AND DENSITY OF CRUDE OIL
    46.
    发明申请
    METHOD AND APPARATUS FOR MEASURING EMISSIVITY AND DENSITY OF CRUDE OIL 审中-公开
    用于测量原油的排放和密度的方法和装置

    公开(公告)号：US20150139273A1

    公开(公告)日：2015-05-21

    申请号：US14404160

    申请日：2013-05-15

    Applicant: AKER SUBSEA LIMITED

    Inventor： Philip Michael Bagley ,  Robin Slater

    IPC: G01J5/10

    CPC classification number: G01J5/10 ,  G01J3/0243 ,  G01J5/0037 ,  G01J5/026 ,  G01J5/0806 ,  G01J5/0846 ,  G01J5/0875 ,  G01J5/0893 ,  G01J5/12 ,  G01J5/522 ,  G01J2005/0048 ,  G01J2005/0074 ,  G01N33/2823

    Abstract: Apparatus for use in the measurement of the API gravity of crude oil, comprises a conduit (1)for the oil, a thermo-couple (4) in the conduit for measuring temperature of the oil in contact therewith, a sapphire window (3) in the conduit, an infrared thermometer (5,6) for the measurement of the temperature of the oil through the window, and means (20) for comparing the measurements of temperature made by the thermometers to obtain a measure of the emissivity of the crude oil and thereby its API gravity.

    Abstract translation: 用于测量原油API重力的装置包括用于油的管道（1），用于测量与其接触的油的温度的管道中的热电偶（4），蓝宝石窗口（3） 在管道中，用于测量通过窗口的油的温度的红外温度计（5,6）和用于比较由温度计制成的温度测量值的装置（20），以获得粗品的发射率的量度 油因此其API重力。

    APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION
    48.
    发明申请
    APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION 有权
    通过激光衍射测量三维半导体结构温度的装置和方法

    公开(公告)号：US20130120737A1

    公开(公告)日：2013-05-16

    申请号：US13672117

    申请日：2012-11-08

    Applicant: Heng Pan ,  Matthew Scott Rogers ,  Aaron Muir Hunter ,  Stephen Moffatt

    Inventor： Heng Pan ,  Matthew Scott Rogers ,  Aaron Muir Hunter ,  Stephen Moffatt

    IPC: G01J5/08

    CPC classification number: G01J5/08 ,  G01J5/0007 ,  G01J5/0803 ,  G01J2005/0074 ,  G01J2005/0077

    Abstract: Embodiments of the present invention generally relate to apparatus for and methods of measuring and monitoring the temperature of a substrate having a 3D feature thereon. The apparatus include a light source for irradiating a substrate having a 3D feature thereon, a focus lens for gathering and focusing reflected light, and an emissometer for detecting the emissivity of the focused reflected light. The apparatus may also include a beam splitter and an imaging device. The imaging device provides a magnified image of the diffraction pattern of the reflected light. The method includes irradiating a substrate having a 3D feature thereon with light, and focusing reflected light with a focusing lens. The focused light is then directed to a sensor and the emissivity of the substrate is measured. The reflected light may also impinge upon an imaging device to generate a magnified image of the diffraction pattern of the reflected light.

    Abstract translation: 本发明的实施例一般涉及用于测量和监测其上具有3D特征的基板的温度的方法的装置。 该装置包括用于照射其上具有3D特征的基板的光源，用于聚焦和聚焦反射光的聚焦透镜，以及用于检测聚焦反射光的发射率的发射计。 该装置还可以包括分束器和成像装置。 成像装置提供反射光的衍射图案的放大图像。 该方法包括用光照射具有3D特征的基板，并且将聚焦透镜聚焦在反射光上。 然后将聚焦的光导向传感器，并测量衬底的发射率。 反射光也可能撞击成像装置以产生反射光的衍射图案的放大图像。

    Method for an IR-radiation—based temperature measurement and IR-radiation—based temperature measuring device
    49.
    发明授权
    Method for an IR-radiation—based temperature measurement and IR-radiation—based temperature measuring device 有权
    用于基于IR辐射的温度测量和基于IR辐射的温度测量装置的方法

    公开(公告)号：US08368021B2

    公开(公告)日：2013-02-05

    申请号：US13073147

    申请日：2011-03-28

    Applicant: Martin Stratmann ,  Sabine Hinkel ,  Daniel Auer ,  Patrick Zahn ,  Andreas Messerschmid

    Inventor： Martin Stratmann ,  Sabine Hinkel ,  Daniel Auer ,  Patrick Zahn ,  Andreas Messerschmid

    IPC: G02F1/01

    CPC classification number: G01J5/522 ,  G01J5/02 ,  G01J5/025 ,  G01J5/0265 ,  G01J5/08 ,  G01J5/0859 ,  G01J5/089 ,  G01J2005/0074 ,  G01J2005/0077

    Abstract: In a temperature measuring device (1) an IR-radiation detector (2) and a reference element (3) are provided, connected to a surface (6) of an object (7) in a heat-conducting fashion, with a first area (4) with high emissivity and a second area (5) with high reflectivity formed at the reference element (3), and the IR-radiation detector (2) is equipped for a separate detection of IR-radiation (9, 10, 11) from the first and second areas (4, 5) and a surface area (12) of the object (7). A computer (13) in the IR-radiation detector (2) is equipped to deduct a temperature measurement for the object (7), corrected for emissions and reflections from the detected IR-radiations (9, 10, 11).

    Abstract translation: 在温度测量装置（1）中，设置有IR辐射检测器（2）和参考元件（3），其以导热方式连接到物体（7）的表面（6），第一区域 （4）具有高发射率和在参考元件（3）处形成的具有高反射率的第二区域（5），并且IR辐射检测器（2）被配备用于单独检测IR辐射（9,10,11 ）从物体（7）的第一和第二区域（4,5）和表面区域（12）移动。 IR辐射检测器（2）中的计算机（13）被配备为从检测到的IR辐射（9,10,11）中校正​​发射和反射的物体（7）的温度测量值。

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