公开(公告)号：US20140302797A1

公开(公告)日：2014-10-09

申请号：US13873048

申请日：2013-04-29

Applicant: APPLE INC.

Inventor： Liang Han ,  Matthew A. Mow ,  James G. Judkins ,  Thomas E. Biedka ,  Ming-Ju Tsai ,  Robert W. Schlub

IPC: H04W24/06

CPC classification number: H04W24/06 ,  H03F1/565 ,  H03F3/195 ,  H03F3/245 ,  H03F2200/111 ,  H03F2200/222 ,  H04B17/0085 ,  Y02D70/00 ,  Y02D70/1242 ,  Y02D70/1262 ,  Y02D70/142 ,  Y02D70/144 ,  Y02D70/146 ,  Y02D70/164 ,  Y02D70/23

Abstract: Test systems for characterizing devices under test (DUTs) are provided. A test system for testing a DUT in a shunt configuration may include a signal generator and a matching network that is coupled between the signal generator and the DUT and that is optimized to apply desired voltage/current stress to the DUT with reduced source power. The matching network may be configured to provide matching and desired stress levels at two or more frequency bands. In another suitable embodiment, a test system for testing a DUT in a series configuration may include a signal generator, an input matching network coupled between the DUT and a first terminal of the DUT, and an output matching network coupled between the DUT and a second terminal of the DUT. The input and output matching network may be optimized to apply desired voltage/current stress to the DUT with reduced source power.

Abstract translation: 提供了用于表征被测设备（DUT）的测试系统。 用于在分流配置中测试DUT的测试系统可以包括信号发生器和耦合在信号发生器和DUT之间的匹配网络，并且被优化以在具有降低的源功率的DUT上施加期望的电压/电流应力。 匹配网络可以被配置为在两个或更多个频带处提供匹配和期望的应力水平。 在另一个合适的实施例中，用于测试串联配置中的DUT的测试系统可以包括信号发生器，耦合在DUT和DUT的第一端之间的输入匹配网络，以及耦合在DUT和第二个DUT之间的输出匹配网络 DUT的端子。 可以优化输入和输出匹配网络，以便以较低的源功率将所需的电压/电流应力施加到DUT。

公开(公告)号：US20140266941A1

公开(公告)日：2014-09-18

申请号：US14096417

申请日：2013-12-04

Applicant: Apple Inc.

Inventor： Enrique Ayala Vazquez ,  Hongfei Hu ,  Mattia Pascolini ,  Yuehui Ouyang ,  Yijun Zhou ,  Matthew A. Mow ,  Robert W. Schlub ,  Erdinc Irci ,  Salih Yarga ,  Ming-Ju Tsai ,  Liang Han ,  Thomas E. Biedka ,  Nicholas S. Reimnitz

IPC: H01Q13/10

CPC classification number: H01Q13/103 ,  H01Q1/243 ,  H01Q5/357 ,  H01Q9/145 ,  H01Q9/42

Abstract: An electronic device may be provided with a housing. The housing may have a periphery that is surrounded by peripheral conductive structures such as a segmented peripheral metal member. A segment of the peripheral metal member may be separated from a ground by a slot. An antenna feed may have a positive antenna terminal coupled to the peripheral metal member and a ground terminal coupled to the ground and may feed both an inverted-F antenna structure that is formed from the peripheral metal member and the ground and a slot antenna structure that is formed from the slot. Control circuitry may tune the antenna by controlling adjustable components that are coupled to the peripheral metal member. The adjustable components may include adjustable inductors and adjustable capacitors.

Abstract translation: 电子设备可以设置有壳体。 壳体可以具有被诸如分段的外围金属构件的外围导电结构包围的周边。 外围金属构件的一段可以通过狭槽与地面分离。 天线馈电可以具有耦合到外围金属构件的正天线端子和耦合到地面的接地端子，并且可以馈送由外围金属构件和地面形成的倒F形天线结构和缝隙天线结构， 由槽形成。 控制电路可以通过控制耦合到外围金属构件的可调组件来调谐天线。 可调部件可以包括可调电感器和可调电容器。

公开(公告)号：US20140087668A1

公开(公告)日：2014-03-27

申请号：US13629414

申请日：2012-09-27

Applicant: APPLE INC

Inventor： Matthew A. Mow ,  Thomas E. Biedka ,  Ming-Ju Tsai ,  Liang Han ,  Xu Han ,  Anand Lakshmanan ,  Nanbo Jin ,  Hongfei Hu ,  Dean F. Darnell ,  Joshua G. Nickel ,  Jayesh Nath ,  Yijun Zhou ,  Hao Xu ,  Yuehui Ouyang ,  Nirali Shah ,  Mattia Pascolini ,  Robert W. Schlub ,  Ruben Caballero

IPC: H04W24/00

CPC classification number: H04W24/08 ,  H04B17/318 ,  H04B17/345 ,  H04W24/06

Abstract: Radio frequency test systems for characterizing antenna performance in various radio coexistence scenarios are provided. In one suitable arrangement, a test system may be used to perform passive radio coexistence characterization. During passive radio coexistence characterization, at least one signal generator may be used to feed aggressor signals directly to antennas within an electronic device under test (DUT). The aggressor signals may generate undesired interference signals in a victim frequency band, which can then be received and analyzed using a spectrum analyzer. During active radio coexistence characterization, at least one radio communications emulator may be used to communicate with a DUT via a first test antenna. While the DUT is communicating with the at least one radio communications emulator, test signals may also be conveyed between DUT 10 and a second test antenna. Test signals conveyed through the second test antenna may be used in obtaining signal interference level measurements.

Abstract translation: 提供了用于在各种无线电共存场景中表征天线性能的射频测试系统。 在一种合适的布置中，可以使用测试系统来执行被动无线电共存表征。 在被动无线电共存表征期间，可以使用至少一个信号发生器将攻击者信号直接馈送到被测电子设备（DUT）内的天线。 攻击者信号可能在受害频段中产生不期望的干扰信号，然后使用频谱分析仪接收和分析。 在有源无线电共存表征期间，可以使用至少一个无线电通信仿真器来经由第一测试天线与DUT进行通信。 当DUT正在与至少一个无线电通信仿真器进行通信时，也可以在DUT 10和第二测试天线之间传送测试信号。 通过第二测试天线传送的测试信号可用于获得信号干扰电平测量。