PHOTON ENTANGLEMENT ROUTER
    32.
    发明申请

    公开(公告)号:US20170082494A1

    公开(公告)日:2017-03-23

    申请号:US14824390

    申请日:2015-08-12

    Abstract: A photon entanglement router comprises a modified birefringent spectral filter followed by a polarization beam splitter (PBS). Frequency degenerate or non-degenerate entangled photons, generated by a collinear laser source and incident on one input port of the photon entanglement router, are comprised of congruent photons and/or incongruent photons. The invention adds a plurality of additional filter stacks at each output port such that they invert the action of the first birefringent stack at the input port. Intermediate output photons from the invention is input to two ports of an additional PBS where they are spatially projected according to their frequencies and polarizations. Two congruent photons of an entangled photon pair exit as an entangled pair in one direction, while two incongruent photons exit as an entangled pair in the orthogonal direction. If one photon is congruent and the other photon incongruent, the photons remain entangled but are spectrally divided into orthogonal directions. The invention's birefringent spectral filter accepts specific input frequencies from the ITU optical C-band grid for proper operation.

    WAVEFRONT-DIVISION POLARIMETRIC ANALYSIS METHOD AND DEVICE, SPECTROPOLARIMETER, POLARIMETRIC CAMERA AND OPTICAL MICROSCOPE USING SUCH A DEVICE
    33.
    发明申请
    WAVEFRONT-DIVISION POLARIMETRIC ANALYSIS METHOD AND DEVICE, SPECTROPOLARIMETER, POLARIMETRIC CAMERA AND OPTICAL MICROSCOPE USING SUCH A DEVICE 有权
    波前极化分析方法和器件,分光光度计,偏光相机和使用这种器件的光学显微镜

    公开(公告)号:US20150204724A1

    公开(公告)日:2015-07-23

    申请号:US14417618

    申请日:2013-07-25

    CPC classification number: G01J4/02 G01J4/04

    Abstract: An accurate and robust wavefront-division polarimetric analysis method and device, allows the quasi-instantaneous measurement of the polarization states of a luminous object. The device can be used to produce a plurality of light beams, all polarized according to different polarization states, from a single upstream light beam. The polarized light beams, which do not overlap and which carry information items that are complementary in terms of polarization, are analyzed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing elements digitally process the luminous intensity values obtained in order to determine the polarization state of the upstream light beam. The operations performed by the processing elements prevent luminous intensity variations in the split light beams during the division of the wavefront of the upstream light beam. Therefore, the wavefront-division polarimetric analysis device is robust and its accuracy is not hindered by the experimental conditions.

    Abstract translation: 准确可靠的波前分割偏振分析方法和装置允许准瞬时测量发光物体的偏振状态。 该装置可用于从单个上游光束产生根据不同极化状态全部偏振的多个光束。 通过测量每个光束的发光强度的多个检测器同时分析不重叠并且携带在极化方面互补的信息项的偏振光束。 处理元件对获得的发光强度值进行数字处理,以确定上游光束的偏振状态。 由处理元件执行的操作防止在上游光束的波前划分期间分束光束的发光强度变化。 因此,波前分割极化分析装置是鲁棒的,其精度不受实验条件的影响。

    APPARATUS AND METHODS FOR MEASURING MODE SPECTRA FOR ION-EXCHANGED GLASSES HAVING STEEP INDEX REGION
    35.
    发明申请
    APPARATUS AND METHODS FOR MEASURING MODE SPECTRA FOR ION-EXCHANGED GLASSES HAVING STEEP INDEX REGION 有权
    用于测量带有指示区域的离子交换玻璃的模式光谱的装置和方法

    公开(公告)号:US20150116713A1

    公开(公告)日:2015-04-30

    申请号:US14523171

    申请日:2014-10-24

    Abstract: Apparatus and methods for measuring mode spectra for ion-exchanged glass substrates having a steep index region are disclosed. An interfacing fluid is provided between the coupling prism and the glass substrate. The interfacing fluid thickness is selected so that the variation in modal birefringence with fluid thickness is reduced to an acceptable level. The coupling prism can include a prism coating on the coupling surface so that the substrate-prism interface includes the prism coating. The coupling prism can also include stand-off members that serve to define the thickness of the interfacing fluid.

    Abstract translation: 公开了用于测量具有陡峭折射率区域的离子交换玻璃基板的模式光谱的装置和方法。 在耦合棱镜和玻璃基板之间提供界面流体。 选择界面流体厚度,使得具有流体厚度的模态双折射的变化减小到可接受的水平。 耦合棱镜可以包括在耦合表面上的棱镜涂层,使得基板 - 棱镜界面包括棱镜涂层。 连接棱镜还可以包括用于限定界面流体的厚度的间隔构件。

    System and method for polarization measurement
    36.
    发明授权
    System and method for polarization measurement 有权
    用于偏振测量的系统和方法

    公开(公告)号:US08797532B2

    公开(公告)日:2014-08-05

    申请号:US13636983

    申请日:2011-03-24

    CPC classification number: G01J4/04 G01J4/02

    Abstract: Measuring polarization profile along an input optical beam cross-section using an optical system includes a polarization beam splitting assembly for splitting the input beam into a predetermined number of beam components with a predetermined polarization relation between them, and including a polarization beam splitter in an optical path of the input beam splitting it into beam components having a polarization relationship and a birefringent element in an optical path of the beam components for splitting each of them into a pair of beams having ordinary and extraordinary polarizations, thereby producing the predetermined number of output beam components. The pixel matrix is located in substantially non-intersecting optical paths of the output beam components and generates a number of output data pieces indicative of intensity distribution within the output beam components and data contained therein being indicative of the polarization profile along the input beam cross-section.

    Abstract translation: 使用光学系统沿着输入光束横截面测量偏振曲线包括偏振分束组件,用于将输入光束分成具有预定偏振关系的预定数量的光束分量,并且包括光学中的偏振分束器 输入光束的路径将其分裂为具有偏振关系的光束分量和光束分量的光路中的双折射元件,用于将它们中的每一个分成具有普通和非常偏振的一对光束,从而产生预定数量的输出光束 组件。 像素矩阵位于输出光束分量的基本上不相交的光路中,并且产生指示输出光束分量内的强度分布的多个输出数据片段,其中包含的数据表示沿着输入光束交叉的偏振轮廓, 部分。

    Non-scanning computed tomography imaging spectrophotometer
    38.
    发明授权
    Non-scanning computed tomography imaging spectrophotometer 失效
    非扫描计算机断层摄影分光光度计

    公开(公告)号:US07034938B1

    公开(公告)日:2006-04-25

    申请号:US10066511

    申请日:2002-02-04

    CPC classification number: G01N21/21 G01J3/2823 G01J4/02 G01N21/31

    Abstract: A Non-Scanning Computed Tomography Imaging Spectropolarimeter (NS-CTISP) measures all spatial, spectral and polarimetric information simultaneously in an image scene allowing measurement of dynamically changing scenes. In particular, NS-CTISP uses division of aperture to polarimetrically analyze each divided image, all of which are thereafter diffracted to measure irradiance on a focal plane array. The Stokes object cube data for each voxel is thereafter estimated from an inverse of the voxel polarimetric calibration matrix for the optical components.

    Abstract translation: 不扫描计算机断层成像光谱测偏仪(NS-CTISP)可以在图像场景中同时测量所有空间,光谱和极化信息,从而可以测量动态变化的场景。 特别地,NS-CTISP使用孔径分割来对每个分割图像进行偏振分析,所有这些图像随后被衍射以测量焦平面阵列上的辐照度。 此后,根据用于光学部件的体素偏振校准矩阵的倒数来估计每个体素的斯托克斯对象立方体数据。

    Apparatus for measuring state of polarization of a lightwave
    39.
    发明申请
    Apparatus for measuring state of polarization of a lightwave 审中-公开
    用于测量光波的偏振状态的装置

    公开(公告)号:US20030075676A1

    公开(公告)日:2003-04-24

    申请号:US10278081

    申请日:2002-10-23

    CPC classification number: G01J4/02

    Abstract: Apparatus for measuring state of polarization of an input light beam comprises a linear polarizing element (10), e.g. a Glan-Taylor prism, an input fiber and lens (22,24) for directing the input light beam to the linear polarizing element (10), an output stage (26A-26D, 30A-30D, 32A-32D, 34) for receiving the light beam leaving the polarizing element, and at least two waveplates (12A, 12B; 12B, 12C) disposed adjacent each other between the input fiber/lens and the linear polarizing element. Each waveplate has its fast axis oriented at a different predetermined azimuthal angle with respect to the incident light beam. The arrangement is such that first and second portions of the input light beam pass through the linear polarizing element and the two waveplates, respectively, and a third portion of the light beam passes through the linear polarizing element without passing through a waveplate. The output stage determines power levels of the three portions of the light beam, respectively, and derives the state of polarization therefrom.

    Abstract translation: 用于测量输入光束的偏振状态的装置包括线性偏振元件(10),例如, 格兰 - 泰勒棱镜,用于将输入光束引导到线性偏振元件(10)的输入光纤和透镜(22,24);输出级(26A-26D,30A-30D,32A-32D,34),用于 接收离开偏振元件的光束以及在输入光纤/透镜和线性偏振元件之间彼此相邻设置的至少两个波片(12A,12B; 12B,12C)。 每个波片具有相对于入射光束以不同的预定方位角定向的快轴。 该配置使得输入光束的第一和第二部分分别通过线性偏振元件和两个波片,光束的第三部分通过线偏振元件而不通过波片。 输出级分别确定光束的三个部分的功率电平,并从其中导出极化状态。

    System for measuring polarimetric spectrum and other properties of a sample
    40.
    发明授权
    System for measuring polarimetric spectrum and other properties of a sample 有权
    用于测量样品的偏振光谱和其他性质的系统

    公开(公告)号:US06184984B2

    公开(公告)日:2001-02-06

    申请号:US09246922

    申请日:1999-02-09

    CPC classification number: G01J4/02 G01J3/447 G01N21/21

    Abstract: A polarized sample beam of broadband radiation is focused onto the surface of a sample and the radiation modified by the sample is collected by means of a mirror system in different planes of incidence. The sample beam focused to the sample has a multitude of polarization states. The modified radiation is analyzed with respect to a polarization plane to provide a polarimetric spectrum. Thickness and refractive information may then be derived from the spectrum. Preferably the polarization of the sample beam is altered only by the focusing and the sample, and the analyzing is done with respect to a fixed polarization plane. In the preferred embodiment, the focusing of the sample beam and the collection of the modified radiation are repeated employing two different apertures to detect the presence or absence of a birefringence axis in the sample. In another preferred embodiment, the above-described technique may be combined with ellipsometry for determining the thicknesses and refractive indices of thin films.

    Abstract translation: 将宽带辐射的极化样品束聚焦到样品的表面上,并且通过不同入射平面的反射镜系统收集由样品改性的辐射。 聚焦到样品的样品束具有许多极化状态。 相对于偏振平面分析修改的辐射以提供偏振光谱。 然后可以从光谱导出厚度和折射信息。 优选地,样品光束的偏振仅由聚焦和样品改变,并且相对于固定的偏振平面进行分析。 在优选实施例中,使用两个不同的孔来重复样品束的聚焦和修改的辐射的收集,以检测样品中双折射轴的存在或不存在。 在另一个优选实施例中,上述技术可以与用于确定薄膜的厚度和折射率的椭偏仪组合。

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