公开(公告)号：US10373882B2

公开(公告)日：2019-08-06

申请号：US15969247

申请日：2018-05-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Choonshik Leem ,  Jihye Lee ,  Deokyong Kim ,  Soobok Chin

IPC: G01N21/95 ,  G01N21/956 ,  H01J37/28 ,  H01L21/66

Abstract: The measurement method may include obtaining first measurement data from a recess region formed in a semiconductor substrate, obtaining second measurement data from a conductive pattern filling a portion of the recess region, calculating a first volume of the recess region from the first measurement data, calculating a second volume of the conductive pattern from the second measurement data, and calculating a measurement target parameter using a difference between the first and second volumes.

公开(公告)号：US10271358B2

公开(公告)日：2019-04-23

申请号：US14317725

申请日：2014-06-27

Applicant: Samsung Electronics Co., Ltd.

Inventor： Taeyoung Lee ,  Jaeeun Kang ,  Hansu Kang ,  Bongjhin Shin ,  Chilyoul Yang ,  Myounghwan Lee ,  Chunho Lee ,  Jihye Lee

IPC: H04B5/00 ,  H04W76/10 ,  H04W76/14

Abstract: A method and an electronic device for service negotiation are provided. The method includes sensing, by the electronic device, a counterpart device through a first protocol, transmitting a request message to the counterpart device through the first protocol, the request message including indication information indicating that the electronic device requests a first service and first service information regarding the first service, and connecting with the counterpart device through a second protocol, when a selection message including indication information selecting the first service is received from the counterpart device through the first protocol, and, after connecting through the second protocol, executing the first service with the counterpart device using the first service information. The request message and the selection message each includes connection information for a connection using the second protocol, and the electronic device and the counterpart device use the connection information to perform the connection using the second protocol.

公开(公告)号：US20180254225A1

公开(公告)日：2018-09-06

申请号：US15969247

申请日：2018-05-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Choonshik LEEM ,  Jihye Lee ,  Deokyong Kim ,  Soobok Chin

IPC: H01L21/66 ,  G01N21/95 ,  G01N21/956 ,  H01J37/28

CPC classification number: H01L22/12 ,  G01B2210/56 ,  G01N21/9501 ,  G01N21/95607 ,  G01N21/95684 ,  H01J37/28 ,  H01J2237/24578 ,  H01J2237/24592

Abstract: The measurement method may include obtaining first measurement data from a recess region formed in a semiconductor substrate, obtaining second measurement data from a conductive pattern filling a portion of the recess region, calculating a first volume of the recess region from the first measurement data, calculating a second volume of the conductive pattern from the second measurement data, and calculating a measurement target parameter using a difference between the first and second volumes.

公开(公告)号：USD807310S1

公开(公告)日：2018-01-09

申请号：US29565081

申请日：2016-05-18

Applicant: Samsung Electronics Co., Ltd.

Designer： Hyungsun Lee ,  Jihye Lee ,  Searom Jung ,  Daejoong Kim ,  Jisoo Lim ,  Jeasung Kim ,  Sangyoung Lee ,  Joonyoung Lee ,  Heeseok Jeong ,  Kyuhyun Cho ,  Shiyun Cho ,  Younho Choi

公开(公告)号：USD801602S1

公开(公告)日：2017-10-31

申请号：US29560611

申请日：2016-04-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Designer： Hyunhee Im ,  Sangyoung Kweon ,  Jihye Lee ,  Jihoon Choi

公开(公告)号：USD786843S1

公开(公告)日：2017-05-16

申请号：US29564921

申请日：2016-05-17

Applicant: Samsung Electronics Co., Ltd.

Designer： Joonyoung Lee ,  Jihye Lee ,  Searom Jung ,  Daejoong Kim ,  Jisoo Lim ,  Jeasung Kim ,  Sangyoung Lee ,  Hyungsun Lee ,  Heeseok Jeong ,  Kyuhyun Cho ,  Shiyun Cho ,  Younho Choi