公开(公告)号：US09069146B2

公开(公告)日：2015-06-30

申请号：US14294603

申请日：2014-06-03

Applicant: Electronics and Telecommunications Research Institute

Inventor： Young-Tak Han ,  Jang Uk Shin ,  Sang-Pil Han ,  Sang Ho Park ,  Yongsoon Baek

IPC: G02B6/12 ,  G02B6/42

CPC classification number: G02B6/4279 ,  G02B6/12002 ,  G02B6/12004 ,  G02B6/325 ,  G02B6/42 ,  G02B6/4201 ,  G02B6/4206 ,  G02B6/4208 ,  G02B6/4257 ,  G02B6/4265 ,  G02B6/4271 ,  G02B6/428 ,  G02B6/4281 ,  G02B2006/12092 ,  G02B2006/12135

Abstract: Provided is an optical module. The optical module includes: an optical bench having a first trench of a first depth and a second trench of a second depth that is lower than the first depth; a lens in the first trench of the optical bench; at least one semiconductor chip in the second trench of the optical bench; and a flexible printed circuit board covering an upper surface of the optical bench except for the first and second trenches, wherein the optical bench is a metal optical bench or a silicon optical bench.

Abstract translation: 提供了一种光学模块。 光学模块包括：光学台，其具有第一深度的第一沟槽和第二深度的第二沟槽，其低于第一深度; 在光学工作台的第一沟槽中的透镜; 在所述光学平台的所述第二沟槽中的至少一个半导体芯片; 以及覆盖除了第一和第二沟槽之外的光学台的上表面的柔性印刷电路板，其中所述光学台是金属光学台或硅光学台。

公开(公告)号：US20140061475A1

公开(公告)日：2014-03-06

申请号：US13802198

申请日：2013-03-13

Applicant: Electronics and Telecommunications Research Institute

Inventor： Han-Cheol RYU ,  Namje KIM ,  Sang-Pil Han ,  Kyung Hyun PARK ,  Hyunsung KO ,  Jeong Woo PARK

IPC: G01B11/06

CPC classification number: G01B11/06

Abstract: A contactless thickness measuring apparatus is provided which includes an terahertz transmitter configured to receive the first optical path signal from the coupler and to generate a terahertz continuous wave using the first optical signal and an applied bias; an optical delay line configured to delay the second optical path signal output from the coupler; and an terahertz receiver configured to receive the terahertz continuous wave penetrating a sample and to detect an optical current using the terahertz continuous wave and the second optical path signal delayed. A thickness of the sample is a value corresponding to the optical current which phase value becomes a constant regardless of a plurality of measurement frequencies.

Abstract translation: 提供了一种非接触式厚度测量装置，其包括太赫兹发射器，其被配置为从耦合器接收第一光路信号并使用第一光信号和施加的偏压产生太赫兹连续波; 光延迟线，被配置为延迟从耦合器输出的第二光路信号; 以及太赫兹接收器，被配置为接收穿透样本的太赫兹连续波，并且使用太赫兹连续波和第二光路信号延迟来检测光电流。 样品的厚度是与光电流相对应的值，该相位值成为常数，而与多个测量频率无关。