-
公开(公告)号：US10156513B2
公开(公告)日：2018-12-18
申请号：US14807859
申请日：2015-07-23
Applicant: SpectraSensors, Inc.
Inventor： Peter Scott , Alfred Feitisch , Peter Dorn , Adam S. Chaimowitz , Hsu-Hung Huang , Mathias Schrempel , Lutz Keller
Abstract: A sample cell can be designed to minimize excess gas volume. Described features can be advantageous in reducing an amount of gas required to flow through the sample cell during spectroscopic measurements, and in reducing a time (e.g. a total volume of gas) required to flush the cell between sampling events. In some examples, contours of the inners surfaces of the sample cell that contact the contained gas can be shaped, dimensioned, etc. such that a maximum clearance distance is provided between the inner surfaces at one or more locations. Systems, methods, and articles, etc. are described.
-
22.发明授权公开(公告)号：US09696204B2
公开(公告)日：2017-07-04
申请号：US14817119
申请日：2015-08-03
Applicant: SpectraSensors, Inc.
Inventor： Xiang Liu , Gary Yeh , Adam S. Chaimowitz , William Jenko , Alfred Feitisch
CPC classification number: G01J3/28 , G01J2003/283 , G01J2003/2866 , G01N21/274 , G01N21/39
Abstract: A frequency registration deviation is quantified for a field spectrum collected during analysis by a spectroscopic analysis system of a sample fluid when the spectroscopic analysis system has deviated from a standard calibration state. The field spectrum is corrected based on the frequency registration deviation using at least one spectral shift technique, and a concentration is calculated for at least one analyte represented by the field spectrum using the corrected field spectrum. Related systems, methods, and articles are described.
-
公开(公告)号：US20160111393A1
公开(公告)日：2016-04-21
申请号：US14885931
申请日：2015-10-16
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Gabi Neubauer , Mathias Schrempel
CPC classification number: H01L24/83 , B23K20/023 , B23K20/24 , B23K2101/42 , H01L33/62 , H01L2224/73265 , H01L2224/83201 , H01L2224/8385 , H01L2924/12042 , H01S5/02212 , H01S5/02256 , H01S5/0226 , H01S5/02264 , H01S5/02476 , H01S5/0425
Abstract: A first contact surface of a semiconductor laser chip can be formed to a first target surface roughness and a second contact surface of a carrier mounting can be formed to a second target surface roughness. A first bond preparation layer comprising a first metal can optionally be applied to the formed first contact surface, and a second bond preparation layer comprising a second metal can optionally be applied to the formed second contact surface. The first contact surface can be contacted with the second contact surface, and a solderless securing process can secure the semiconductor laser chip to the carrier mounting. Related systems, methods, articles of manufacture, and the like are also described.
Abstract translation: 可以将半导体激光器芯片的第一接触表面形成为第一目标表面粗糙度，并且可以将载体安装的第二接触表面形成为第二目标表面粗糙度。 包含第一金属的第一粘合制备层可以任选地施加到所形成的第一接触表面，并且包括第二金属的第二接合制备层可任选地施加到形成的第二接触表面。 第一接触表面可以与第二接触表面接触，并且无焊接固定工艺可以将半导体激光器芯片固定到载体安装。 还描述了相关系统，方法，制品等。
-
公开(公告)号：US20160054177A1
公开(公告)日：2016-02-25
申请号：US14466819
申请日：2014-08-22
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Xiang Liu , Keith Benjamin Helbley , Douglas Beyer
CPC classification number: G01J3/0205 , G01J3/0237 , G01J3/027 , G01J3/0278 , G01J3/0291 , G01J3/42 , G01J2003/421 , G01N21/31 , G01N2201/06113 , G01N2201/062
Abstract: A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).
Abstract translation: 光谱仪包括将光束发射到包括吸收介质的样品体积中的光源。 此后，至少一个检测器检测由光源发射的光束的至少一部分。 随后基于检测到的梁的至少一部分和由控制器确定梁的位置和/或角度应被改变。 然后在控制器的控制下由光源发射的光束被致动元件主动地导向。 此外，可以量化或以其他方式计算吸收介质的浓度（使用控制器或可选择地可以是本地或远程的不同处理器）。 致动元件可以耦合到光源，检测器或检测器中的一个或多个，以及在光源和检测器之间的反射器或反射器。
-
公开(公告)号：US11754539B2
公开(公告)日：2023-09-12
申请号：US16842849
申请日：2020-04-08
Applicant: SpectraSensors, Inc.
Inventor： Kevin Ludlum , Marc Winter , Benjamin Scherer , Xiang Liu
CPC classification number: G01N33/0006 , G01N21/31 , G01N33/0036 , G06N3/08 , G06N20/00
Abstract: The present disclosure relates to a computer-implemented method for forecasting calibration spectra including a step of providing a machine learning model trained using historical calibration data corresponding to different gas species at different pressures. The computer-implemented method also includes steps of performing a calibration scan of one gas species at one pressure using an analyzer and generating calibration curves for the analyzer corresponding to one or multiple gas species at multiple pressures using the machine learning model and the calibration scan. Thereafter, a spectrum is obtained using the analyzer, and a concentration measurement is generated using the spectrum and at least one of the calibration curves.
-
Patent Agency Ranking
公开(公告)号：US20210318280A1
公开(公告)日：2021-10-14
申请号：US16842849
申请日：2020-04-08
Applicant: SpectraSensors, Inc.
Inventor： Kevin Ludlum , Marc Winter , Benjamin Scherer , Xiang Liu
Abstract: The present disclosure relates to a computer-implemented method for forecasting calibration spectra including a step of providing a machine learning model trained using historical calibration data corresponding to different gas species at different pressures. The computer-implemented method also includes steps of performing a calibration scan of one gas species at one pressure using an analyzer and generating calibration curves for the analyzer corresponding to one or multiple gas species at multiple pressures using the machine learning model and the calibration scan. Thereafter, a spectrum is obtained using the analyzer, and a concentration measurement is generated using the spectrum and at least one of the calibration curves.
-
公开(公告)号：US20210018433A1
公开(公告)日：2021-01-21
申请号：US16511429
申请日：2019-07-15
Applicant: SpectraSensors, Inc.
Inventor： Xiang Liu , Alfred Feitisch , Gary Yeh , Chih-Hsuan Chang
Abstract: A method for implementation by a laser spectrometer is provided. The method includes first scanning, by a control unit using a first set of laser spectrometer operating parameters, a first wavelength range by adjusting a wavelength of light of a beam emitted by a laser light source and passing through a sample gas. The first wavelength range encompasses a first spectral feature corresponding to a first constituent. The method also includes at least one second scanning, by the control unit using a second set of laser spectrometer operating parameters, a second wavelength range by adjusting the wavelength of light emitted from the laser light source and passing through the sample gas. The second wavelength range has a second spectral feature corresponding to at least one second constituent. The control unit also determines a first concentration of the first constituent and a second concentration of the at least one second constituent.
-
公开(公告)号：US20200185880A1
公开(公告)日：2020-06-11
申请号：US16259172
申请日：2019-01-28
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Gabi Neubauer , Mathias Schrempel
Abstract: A first contact surface of a semiconductor laser chip can be formed to a target surface roughness selected to have a maximum peak to valley height that is substantially smaller than a barrier layer thickness. A barrier layer that includes a non-metallic, electrically-conducting compound and that has the barrier layer thickness can be applied to the first contact surface, and the semiconductor laser chip can be soldered to a carrier mounting along the first contact surface using a solder composition by heating the soldering composition to less than a threshold temperature at which dissolution of the barrier layer into the soldering composition occurs. Related systems, methods, articles of manufacture, and the like are also described.
-
公开(公告)号：US20190162597A9
公开(公告)日：2019-05-30
申请号：US14494482
申请日：2014-09-23
Applicant: SpectraSensors, Inc.
Inventor： Lutz Keller , Alfred Feitisch , Peter Scott , Mathias Schrempel , Nathan St. John
Abstract: A spectrometer cell can include a spacer, at least one end cap, and at least one mirror with a reflective surface. The end cap can be positioned proximate to a first contact end of the spacer such that the end cap and spacer at least partially enclose an internal volume of the spectrometer cell. The mirror can be secured in place by a mechanical attachment that includes attachment materials that are chemically inert to at least one reactive gas compound. The mechanical attachment can hold an optical axis of the reflective surface in a fixed orientation relative to other components of the spectrometer cell and or a spectrometer device that comprises the spectrometer cell. The mirror can optionally be constructed of a material such as stainless steel, ceramic, or the like. Related methods, articles of manufacture, systems, and the like are described.
-
公开(公告)号：US09816860B2
公开(公告)日：2017-11-14
申请号：US14466819
申请日：2014-08-22
Applicant: SpectraSensors, Inc.
Inventor： Alfred Feitisch , Xiang Liu , Keith Benjamin Helbley , Douglas Beyer
CPC classification number: G01J3/0205 , G01J3/0237 , G01J3/027 , G01J3/0278 , G01J3/0291 , G01J3/42 , G01J2003/421 , G01N21/31 , G01N2201/06113 , G01N2201/062
Abstract: A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).
-
-
-
-
-
-
-
-
-
Search Results
50
records
(took 0.012 seconds)
