公开(公告)号：US10903618B2

公开(公告)日：2021-01-26

申请号：US16358812

申请日：2019-03-20

Applicant: Chroma Ate Inc.

Inventor： James E. Hopkins

IPC: H01S5/00 ,  G01R31/26 ,  H01S5/024

Abstract: A fixture assembly having a base, an upper cover and a latch mechanism for testing an edge-emitting laser diode and a testing apparatus having the same are provided. The base includes a pocket, and a transmission cavity in communication with and orthogonal to the pocket. The upper cover includes a body, an abutting block and a pressing member. The abutting block having an electrical contact interface is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the upper cover, and may selectively connect or disconnect the upper cover to or from the base. When the latch mechanism is operated to connect the upper cover to the base, the pressing member applies a force through the abutting block on the edge-emitting laser diode received in the pocket, and the edge-emitting laser diode emits the laser for inspection through the transmission cavity.

公开(公告)号：US10802070B2

公开(公告)日：2020-10-13

申请号：US15955668

申请日：2018-04-17

Applicant: CHROMA ATE INC.

Inventor： Ching-Hua Chu ,  Cheng-Hsien Chang

IPC: G01R31/28 ,  G01R1/36

Abstract: A testing device includes a switch, a sensing circuit, and a control circuit. The switch is coupled to a power supply circuit, and the power supply circuit is configured to output a supply voltage to a device under-test via the switch. The sensing circuit is coupled to the device under-test, and the sensing circuit is configured to receive an input voltage from the device under-test and to output a sensing signal according to the input voltage. The control circuit is coupled to the sensing circuit, the power supply circuit, and the switch. The control circuit is configured to control the power supply circuit to stop outputting the supply voltage at a first time and to turn off the switch at a second time according to the sensing signal.

公开(公告)号：US10712366B2

公开(公告)日：2020-07-14

申请号：US16222391

申请日：2018-12-17

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang Hsu ,  Kuo-Yen Hsu ,  Chuan-Tse Lin

IPC: G01R1/067

Abstract: An electrical probe includes a probe assembly and a second electrical connection member. The probe assembly includes a needle cylinder, a first electrical connection member, a probe head and a sub-probe. The first electrical connection member and the probe head locate to two opposite sides of the needle cylinder. The first electrical connection member and the probe head electrically connect the needle cylinder. The sub-probe penetrates the probe head, and plugs the needle cylinder to electrically connect a cable but being electrically isolated from the needle cylinder. The sub-probe is located on a side away from the first electrical connection member. When the probe head depresses the object, the needle cylinder drives the first cylinder to a contact position to allow the first electrical connection member to electrically contact the second electrical connection member, and thus the probe head connects the second electrical connection member via the needle cylinder.

公开(公告)号：US10411646B2

公开(公告)日：2019-09-10

申请号：US16013917

申请日：2018-06-20

Applicant: CHROMA ATE INC.

Inventor： Cheng-Ting Tsai ,  Lan-Sheng Yang

IPC: H02S50/10 ,  G02B27/30 ,  H01L31/048 ,  H01L31/0224 ,  H02S50/15

Abstract: A method for inspecting a solar cell and configured to inspect a peeling state of a three-dimensional pattern of the solar cell includes obliquely illuminating the three-dimensional pattern of the solar cell using a light beam. An image of the solar cell is normally captured. An intensity of the light beam is increased to increase a contrast between the three-dimensional pattern and a shadow of the three-dimensional pattern in the image and increase a contrast between an ink pattern of the solar cell and the shadow in the image to overexpose the ink pattern in the image. Determine if the three-dimensional pattern is peeling according to the shadow of the three-dimensional pattern in the image.

公开(公告)号：US20190067759A1

公开(公告)日：2019-02-28

申请号：US16108081

申请日：2018-08-21

Applicant: CHROMA ATE INC.

Inventor： Hsu-Chang HSU ,  Kuo-Yen HSU ,  Kuan-Chen CHEN ,  Chuan-Tse LIN

IPC: H01M10/48 ,  H01M10/42 ,  G01R31/36

CPC classification number: H01M10/482 ,  G01R31/385 ,  H01M2/1016 ,  H01M10/4207 ,  H01M10/4285 ,  H01M10/446 ,  H01M10/484

Abstract: A probe supporting structure, configured to support probe for testing battery cell, includes a base and at least two supporting members. The supporting members are detachably disposed on the base with an adjustable distance between the supporting members. The supporting members are arranged in parallel manner.

公开(公告)号：US20180188132A1

公开(公告)日：2018-07-05

申请号：US15846026

申请日：2017-12-18

Applicant: CHROMA ATE INC.

Inventor： Po-Kai CHENG ,  Chang-Chi YANG ,  Chi-Shu WANG

IPC: G01M3/32 ,  G01R1/067 ,  G01R31/26

CPC classification number: G01M3/3272 ,  G01M3/3263 ,  G01M3/3281 ,  G01R1/0416 ,  G01R1/06722 ,  G01R31/2601 ,  G01R31/2862 ,  G01R31/2881

Abstract: A method for testing air tightness includes connecting a testing chamber and a storage chamber, supplying negative pressure to the storage chamber, measuring the pressure in the storage or testing chamber to obtain a first pressure value, determining air tightness of the testing chamber according to the negative pressure and the first pressure value, stopping the negative pressure to the storage chamber, measuring the pressure in the storage chamber to obtain a second pressure value, measuring the pressure in the storage chamber after stopping the negative pressure to the storage chamber to obtain a third pressure value, and determining air tightness of the testing chamber according to the second and third pressure values. The device includes testing and storage chambers, a negative pressure generator, and a pressure gauge connected to the storage chamber, which is connected to the testing chamber. The negative pressure generator is connected to the storage chamber.

公开(公告)号：US09494353B2

公开(公告)日：2016-11-15

申请号：US14302442

申请日：2014-06-12

Applicant: CHROMA ATE INC.

Inventor： Ben-Mou Yu ,  Ming-Chieh Lin ,  Ching-Wen Chang ,  Xin-Yi Wu

IPC: F25B21/02 ,  F25B49/00 ,  G05D23/19

CPC classification number: F25B49/00 ,  F25B21/02 ,  G05D23/1919

Abstract: A temperature control equipment is capable of controlling a tested object to a predetermined temperature. The temperature control equipment includes a thermal conducting plate, a temperature regulating module, a carrier plate, and a thermoelectric cooling module. The temperature regulating module is thermally connected to the thermal conducting plate for regulating the thermal conducting plate to a reference temperature. The carrier plate is used to accommodate the tested object. The thermoelectric cooling module is thermally connected between the thermal conducting plate and the carrier plate for controlling the tested object to the predetermined temperature via the carrier plate based on the reference temperature.

Abstract translation: 温度控制设备能够将测试对象控制到预定温度。 温度控制设备包括导热板，温度调节模块，承载板和热电冷却模块。 温度调节模块热连接到用于将导热板调节到参考温度的导热板。 承载板用于容纳被测物体。 热电冷却模块热连接在导热板和承载板之间，用于基于参考温度经由载板将测试对象控制到预定温度。

公开(公告)号：US20150226794A1

公开(公告)日：2015-08-13

申请号：US14617892

申请日：2015-02-09

Applicant: CHROMA ATE INC.

Inventor： Chien-Ming CHEN

IPC: G01R31/28 ,  G01R1/04

CPC classification number: G01R31/2893 ,  G01R1/0433 ,  G01R31/2867 ,  G01R31/2887 ,  G01R31/2896 ,  H01L2224/48227 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/00012

Abstract: An apparatus for testing a package-on-package semiconductor device comprises a pick and place device for loading a first chip into or unloading the first chip from a test socket and a lifting and rotating arm for moving a chip placement module which receives a second chip to a position between the pick and place device and the test socket. The pick and place device and the chip placement module are lowered, and then a test process is performed. After the test process is completed, the pick and place device and the chip placement module are lifted, and the lifting and rotating arm moves the chip placement module to one side of the pick and place device. Accordingly, a method for testing the semiconductor device could be performed automatically so as to greatly enhance test efficiency and accuracy and to significantly reduce costs.

Abstract translation: 一种用于测试封装封装半导体器件的装置，包括用于将第一芯片从测试插座加载到第一芯片或从其卸载的拾取和放置装置，以及用于移动芯片放置模块的提升和旋转臂，芯片放置模块接收第二芯片 到拾取和放置设备与测试插座之间的位置。 拾取和放置装置和芯片放置模块降低，然后进行测试处理。 测试过程完成后，拾取和放置设备和芯片放置模块被提起，提升和旋转臂将芯片放置模块移动到拾取和放置设备的一侧。 因此，可以自动进行半导体装置的测试方法，大大提高测试效率和精度，并显着降低成本。

公开(公告)号：US20140176170A1

公开(公告)日：2014-06-26

申请号：US14108167

申请日：2013-12-16

Applicant: CHROMA ATE INC.

Inventor： Xin-Yi WU ,  Hsuan-Jen SHEN ,  Hung-Ta KAO

IPC: G01R31/26

CPC classification number: G01R31/2635

Abstract: A test table including a chuck base, a flow guide mechanism and a dry air generator is provided. The chuck base includes a test area. The flow guide mechanism is disposed around the chuck base. The dry air generator connects to the flow guide mechanism for generating a dry air. The flow guide mechanism guides the dry air to flow toward the test area to cover the test area and the object to be tested and to create a dry environment to prevent dew condensation.

Abstract translation: 提供一种包括卡盘底座，导流机构和干燥空气发生器的测试台。 卡盘底座包括测试区域。 流动引导机构围绕卡盘基座设置。 干燥空气发生器连接到流动引导机构以产生干燥空气。 流动引导机构引导干燥空气流向测试区域，以覆盖测试区域和被测物体，并产生干燥的环境以防止结露。

公开(公告)号：US20130250299A1

公开(公告)日：2013-09-26

申请号：US13424386

申请日：2012-03-20

Applicant: Yi-Lung WENG ,  Tsun-Yi Wang

Inventor： Yi-Lung WENG ,  Tsun-Yi Wang

IPC: G01J3/50

CPC classification number: G01J3/501 ,  G01J3/524 ,  G01J2003/507

Abstract: An embodiment of the invention provides a method of calibrating a color measurement device using a light source having a known color value. The color measurement device includes a light detector. The method includes: aligning the color measurement device and the light source so that the light source images on a center area of the light detector; deriving a detected color value for the light source based on the light detected by the center area when the light source images thereon; deriving a color calibration coefficient based on the detected color value and the known color value of the light source; and deriving a color and flat-field calibration array for the color measurement device by multiplying each entry of a flat-field calibration array of the color measurement device by the color calibration coefficient.

Abstract translation: 本发明的实施例提供了一种使用具有已知颜色值的光源来校准颜色测量装置的方法。 色彩测量装置包括光检测器。 该方法包括：使颜色测量装置和光源对准，使得光源图像在光检测器的中心区域上; 基于当光源在其上形成图像时由中心区域检测到的光导出用于光源的检测颜色值; 基于所检测的颜色值和所述光源的已知颜色值导出颜色校准系数; 以及通过将所述颜色测量装置的平场校准阵列的每个条目乘以所述颜色校准系数，得到用于所述颜色测量装置的彩色和平场校准阵列。