Abstract:
A solar cell testing system includes a multifunctional testing light source, a measuring unit, and an arithmetic unit. The multifunctional testing light source is configured to be switched to output a simulated solar light to a solar cell or asynchronously output a plurality of narrowband lights to the solar cell. The measuring unit is coupled to the solar cell and measures the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights. The arithmetic unit is coupled to the multifunctional testing light source and the measuring unit; it determines the solar cell's conversion efficiency and spectral response based on the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights.
Abstract:
An electrical connecting device is provided. The electrical connecting device comprises at least one jig for electrically connecting and clamping at least one electrode of at least one electrical component. The jig comprises a first clamping portion, a second clamping portion and a first detecting elastic sheet. The second clamping portion is disposed opposite to the first clamping portion. The electrode is adapted to be electrically connected to and clamped between the first clamping portion and the second clamping portion. The first detecting elastic sheet is fixed with the first clamping portion. The first detecting elastic sheet is connected to a first sensor and formed with a first contact portion. The first sensor is used for sensing a first parameter of the electrical component and the first contact portion is used for contacting the electrode.
Abstract:
An imaging apparatus includes a light source; a first beam splitter for reflecting a projection beam emitted by the light source; an objective lens unit including a reflection reference surface for reproducing the projection beam into a measurement beam projected onto an object to generate a first reflection beam and a reference beam projected onto the reflection reference surface to generate a second reflection beam mixing with the first reflection beam and passing through the first splitter and forming an operating beam; a second beam splitter for modulating the operating beam into first and second sub-beams; a monochrome image detection device for passage of the first sub-beam to obtain an interferometric image with monochrome from a first interference region; and an image detection device for permitting passage of the second sub-beam in order to obtain a non-interferometric image from a second interference region.
Abstract:
An electronic load simulates an LED is to output a simulation signal after receiving an input signal. The simulation signal has a voltage value and a current value approximating to a characteristic curve of a real LED. The electronic load comprises a processor, an amplifier, and a control unit. The processor receives a control command to set up the LED. The control command includes a forward voltage parameter and an equivalent impedance parameter. The control unit generates an adjustment command according to the foregoing parameters and the voltage of the power source. The amplifier receives and further adjusts the adjustment command so as to output the simulation signal.
Abstract:
A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in a manner of aligning a predetermined longitudinal direction of the light-emitting devices with a predetermined transportation direction of the moving carrier unit, each of the light-emitting devices further having plural light-emitting elements; transporting orderly the light-emitting devices to pass a test area on a base of the system, in which the base energizes only the light-emitting elements within the test area; and, a solar cell module detecting continuously the energized light-emitting elements within the test area and further forming signals with respect to photo energy received in the test area.
Abstract:
It's a type of top mount surface airflow heatsink, utilizing the upper ceiling wall separated by an air gap, working together with the upper surface of a heating device (microprocessor) producing an air current. It's a simple device, with a low cost using the Reynolds Equation Re=(ρumd)/μ≧2,500; with ρ being the fluid density, um being the free-stream fluid velocity, d being the pipe distance or diameter, μ being the fluid viscosity. Since the airflow produces air turbulence, it causes the frequent heat exchanges in the air. It also causes the obvious temperature changes within the different layers of air. Therefore, it increases tremendously, the efficiency of dissipating the heat. It requires only the input of the air. The operation is simple and it allows the usage of even higher heat generating devices. Thus it promotes the alternative usage of this top mount heatsink device within the installation of circuit board components.
Abstract:
An apparatus for detecting the surface profile of a test object includes a light source, a beam splitter, a reflective component, a sensor, and a computing device. The light source emits a light beam. The beam splitter divides the light beam into reference and probing beams. The reference beam is reflected by the reflective component back to the beam splitter. The reflective component is configured so that components of the reflected reference beam travel at different optical path lengths to the beam splitter. The probing beam is reflected by the test object back to the beam splitter. The beam splitter combines the reflected reference and probing beams to result in a heterodyne light beam. The sensor converts the heterodyne light beam into a corresponding electrical signal. The computing device records the converted electrical signal. A method for detecting the surface profile of the test object is also disclosed.
Abstract:
An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.
Abstract:
An apparatus for feature detection of a test object includes at least one light source module and at least one image capturing unit. The light source module provides light to illuminate a test region of the test object, and includes a substrate, a set of light-emitting components, and a light-focusing unit. The light-emitting components are mounted on the substrate for emitting light in parallel directions that are generally transverse to the substrate. The light-focusing unit is to be disposed between the light-emitting components and the test object, receives the light emitted by the light-emitting components, and focuses the light on the test region of the test object. The image capturing unit captures an image of the test object at the test region.