SOLAR CELL TESTING SYSTEM, SOLAR CELL TESTING METHOD, AND MULTIFUNCTIONAL TESTING LIGHT SOURCE
    231.
    发明申请
    SOLAR CELL TESTING SYSTEM, SOLAR CELL TESTING METHOD, AND MULTIFUNCTIONAL TESTING LIGHT SOURCE 有权
    太阳能电池测试系统,太阳能电池测试方法和多功能测试光源

    公开(公告)号:US20130265077A1

    公开(公告)日:2013-10-10

    申请号:US13716100

    申请日:2012-12-15

    CPC classification number: G01R31/2607 F21S8/006 F21Y2115/10 H02S50/10

    Abstract: A solar cell testing system includes a multifunctional testing light source, a measuring unit, and an arithmetic unit. The multifunctional testing light source is configured to be switched to output a simulated solar light to a solar cell or asynchronously output a plurality of narrowband lights to the solar cell. The measuring unit is coupled to the solar cell and measures the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights. The arithmetic unit is coupled to the multifunctional testing light source and the measuring unit; it determines the solar cell's conversion efficiency and spectral response based on the solar cell's response to the simulated solar light and response to the asynchronously outputted narrowband lights.

    Abstract translation: 太阳能电池测试系统包括多功能测试光源,测量单元和运算单元。 多功能测试光源被配置为切换以将模拟的太阳光输出到太阳能电池,或者将多个窄带光异步输出到太阳能电池。 测量单元耦合到太阳能电池并且测量太阳能电池对模拟的太阳光的响应以及对异步输出的窄带光的响应。 算术单元耦合到多功能测试光源和测量单元; 它基于太阳能电池对模拟的太阳光的响应和对异步输出的窄带光的响应来确定太阳能电池的转换效率和光谱响应。

    ELECTRICAL CONNECTING DEVICE
    232.
    发明申请
    ELECTRICAL CONNECTING DEVICE 审中-公开
    电气连接装置

    公开(公告)号:US20130009660A1

    公开(公告)日:2013-01-10

    申请号:US13543409

    申请日:2012-07-06

    CPC classification number: G01R1/0408 H01R2201/20

    Abstract: An electrical connecting device is provided. The electrical connecting device comprises at least one jig for electrically connecting and clamping at least one electrode of at least one electrical component. The jig comprises a first clamping portion, a second clamping portion and a first detecting elastic sheet. The second clamping portion is disposed opposite to the first clamping portion. The electrode is adapted to be electrically connected to and clamped between the first clamping portion and the second clamping portion. The first detecting elastic sheet is fixed with the first clamping portion. The first detecting elastic sheet is connected to a first sensor and formed with a first contact portion. The first sensor is used for sensing a first parameter of the electrical component and the first contact portion is used for contacting the electrode.

    Abstract translation: 提供电连接装置。 电连接装置包括用于电连接和夹紧至少一个电气部件的至少一个电极的至少一个夹具。 夹具包括第一夹紧部分,第二夹持部分和第一检测弹性片。 第二夹持部分与第一夹紧部分相对设置。 电极适于与第一夹紧部分和第二夹持部分电连接并夹紧在第一夹紧部分和第二夹持部分之间。 第一检测弹性片用第一夹持部固定。 第一检测弹性片连接到第一传感器并形成有第一接触部分。 第一传感器用于感测电气部件的第一参数,并且第一接触部分用于接触电极。

    IMAGING APPARATUS AND METHOD THEREOF
    233.
    发明申请
    IMAGING APPARATUS AND METHOD THEREOF 有权
    成像装置及其方法

    公开(公告)号:US20110317169A1

    公开(公告)日:2011-12-29

    申请号:US13163862

    申请日:2011-06-20

    CPC classification number: G01B11/24 G01B11/2441

    Abstract: An imaging apparatus includes a light source; a first beam splitter for reflecting a projection beam emitted by the light source; an objective lens unit including a reflection reference surface for reproducing the projection beam into a measurement beam projected onto an object to generate a first reflection beam and a reference beam projected onto the reflection reference surface to generate a second reflection beam mixing with the first reflection beam and passing through the first splitter and forming an operating beam; a second beam splitter for modulating the operating beam into first and second sub-beams; a monochrome image detection device for passage of the first sub-beam to obtain an interferometric image with monochrome from a first interference region; and an image detection device for permitting passage of the second sub-beam in order to obtain a non-interferometric image from a second interference region.

    Abstract translation: 一种成像装置,包括光源; 用于反射由光源发射的投影光束的第一分束器; 物镜单元,包括用于将投影光束再现成投射到物体上的测量光束以产生第一反射光束的反射参考表面和投影到反射参考表面上的参考光束,以产生与第一反射光束混合的第二反射光束 并穿过第一分流器并形成操作梁; 第二分束器,用于将操作光束调制成第一和第二子光束; 用于通过第一子光束以从第一干涉区域获得具有单色的干涉图像的单色图像检测装置; 以及用于允许第二子光束通过以从第二干涉区域获得非干涉图像的图像检测装置。

    ELECTRONIC LOAD FOR SIMULATING CHARACTERISTICS OF AN LED AND METHOD FOR OPERATING THE SAME
    234.
    发明申请
    ELECTRONIC LOAD FOR SIMULATING CHARACTERISTICS OF AN LED AND METHOD FOR OPERATING THE SAME 审中-公开
    用于模拟LED特性的电子负载及其操作方法

    公开(公告)号:US20110066417A1

    公开(公告)日:2011-03-17

    申请号:US12725790

    申请日:2010-03-17

    CPC classification number: G01R31/2635

    Abstract: An electronic load simulates an LED is to output a simulation signal after receiving an input signal. The simulation signal has a voltage value and a current value approximating to a characteristic curve of a real LED. The electronic load comprises a processor, an amplifier, and a control unit. The processor receives a control command to set up the LED. The control command includes a forward voltage parameter and an equivalent impedance parameter. The control unit generates an adjustment command according to the foregoing parameters and the voltage of the power source. The amplifier receives and further adjusts the adjustment command so as to output the simulation signal.

    Abstract translation: 模拟LED的电子负载是在接收到输入信号之后输出模拟信号。 模拟信号具有与实际LED的特性曲线近似的电压值和电流值。 电子负载包括处理器,放大器和控制单元。 处理器接收到一个控制命令来设置LED。 控制命令包括正向电压参数和等效阻抗参数。 控制单元根据上述参数和电源的电压产生调整指令。 放大器接收并进一步调整调整指令,以输出模拟信号。

    System and method for testing light-emitting devices
    235.
    发明授权
    System and method for testing light-emitting devices 有权
    用于测试发光器件的系统和方法

    公开(公告)号:US07804589B2

    公开(公告)日:2010-09-28

    申请号:US12429578

    申请日:2009-04-24

    Abstract: A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in a manner of aligning a predetermined longitudinal direction of the light-emitting devices with a predetermined transportation direction of the moving carrier unit, each of the light-emitting devices further having plural light-emitting elements; transporting orderly the light-emitting devices to pass a test area on a base of the system, in which the base energizes only the light-emitting elements within the test area; and, a solar cell module detecting continuously the energized light-emitting elements within the test area and further forming signals with respect to photo energy received in the test area.

    Abstract translation: 用于同样目的的与系统相关联地测试发光器件的方法包括以下步骤:将移动的载体单元上的发光器件以对准预定的纵向方向的方式 具有预定的移动载体单元的输送方向的发光装置,每个发光装置还具有多个发光元件; 传输有序的发光器件,以通过系统底座上的测试区域,其中基极仅激励测试区域内的发光元件; 以及太阳能电池模块,连续地检测测试区域内的激发的发光元件,并进一步形成关于在测试区域中接收的光能的信号。

    Top mount surface airflow heatsink and top mount heatsink component device
    236.
    发明申请
    Top mount surface airflow heatsink and top mount heatsink component device 审中-公开
    顶部安装表面气流散热器和顶部安装散热器部件

    公开(公告)号:US20090161311A1

    公开(公告)日:2009-06-25

    申请号:US11982655

    申请日:2007-11-01

    Applicant: I-Shih Tseng

    Inventor: I-Shih Tseng

    CPC classification number: H01L23/467 G06F1/20 H01L2924/0002 H01L2924/00

    Abstract: It's a type of top mount surface airflow heatsink, utilizing the upper ceiling wall separated by an air gap, working together with the upper surface of a heating device (microprocessor) producing an air current. It's a simple device, with a low cost using the Reynolds Equation Re=(ρumd)/μ≧2,500; with ρ being the fluid density, um being the free-stream fluid velocity, d being the pipe distance or diameter, μ being the fluid viscosity. Since the airflow produces air turbulence, it causes the frequent heat exchanges in the air. It also causes the obvious temperature changes within the different layers of air. Therefore, it increases tremendously, the efficiency of dissipating the heat. It requires only the input of the air. The operation is simple and it allows the usage of even higher heat generating devices. Thus it promotes the alternative usage of this top mount heatsink device within the installation of circuit board components.

    Abstract translation: 它是一种顶部安装表面气流散热器,利用由气隙隔开的上部顶壁,与加热装置(微处理器)的上表面一起产生气流。 这是一个简单的设备,使用雷诺方程Re =(rhoumd)/ mu> = 2,500,成本低廉; 其中rho是流体密度,um是自由流体速度,d是管道距离或直径,μ是流体粘度。 由于气流产生空气湍流,导致空气中频繁的热交换。 它也会导致不同层次空气中明显的温度变化。 因此,它大大增加了散热的效率。 它只需要空气的输入。 操作简单,可以使用更高的发热装置。 因此,它可以在电路板组件的安装中促进该顶部安装散热装置的替代使用。

    Interferometric apparatus and method for surface profile detection
    237.
    发明授权
    Interferometric apparatus and method for surface profile detection 失效
    用于表面轮廓检测的干涉仪和方法

    公开(公告)号:US07277181B2

    公开(公告)日:2007-10-02

    申请号:US11123978

    申请日:2005-05-06

    Applicant: Yaomin Lin

    Inventor: Yaomin Lin

    CPC classification number: G01B11/2441 G01B9/02028 G01B9/02057 G01B9/0209

    Abstract: An apparatus for detecting the surface profile of a test object includes a light source, a beam splitter, a reflective component, a sensor, and a computing device. The light source emits a light beam. The beam splitter divides the light beam into reference and probing beams. The reference beam is reflected by the reflective component back to the beam splitter. The reflective component is configured so that components of the reflected reference beam travel at different optical path lengths to the beam splitter. The probing beam is reflected by the test object back to the beam splitter. The beam splitter combines the reflected reference and probing beams to result in a heterodyne light beam. The sensor converts the heterodyne light beam into a corresponding electrical signal. The computing device records the converted electrical signal. A method for detecting the surface profile of the test object is also disclosed.

    Abstract translation: 用于检测测试对象的表面轮廓的装置包括光源,分束器,反射部件,传感器和计算装置。 光源发射光束。 光束分束器将光束分成参考和探测光束。 参考光束被反射部件反射回分束器。 反射部件被配置为使得反射参考光束的分量以不同的光路长度行进到分束器。 探测光束被测试对象反射回分束器。 分束器组合反射的参考和探测光束以产生外差光束。 传感器将外差光束转换成相应的电信号。 计算装置记录转换的电信号。 还公开了一种用于检测测试对象的表面轮廓的方法。

    Integrated interference scanning method
    238.
    发明申请
    Integrated interference scanning method 有权
    集成干涉扫描方法

    公开(公告)号:US20070097379A1

    公开(公告)日:2007-05-03

    申请号:US11373288

    申请日:2006-03-13

    Abstract: An integrated interference scanning method, mainly used to integrate the respective advantages of VSI and PSI measurements, hereby achieving the characteristic of high precision and limitless measurement range. In particular, the slope correction factor and the displacement correction factor between the VSI measurement and PSI measurement may be utilized to execute the integration calculation of the height data arrays of the VSI and PSI, so that the scanning procedure may be achieved through merely using the wideband light source of the interference scanning system, as such reducing the errors and complexity of the interference scanning system.

    Abstract translation: 一种集成的干涉扫描方法,主要用于集成VSI和PSI测量的各自优点,从而实现了高精度和无限测量范围的特点。 特别地,可以利用VSI测量和PSI测量之间的斜率校正因子和位移校正因子来执行VSI和PSI的高度数据阵列的积分计算,使得扫描过程可以通过仅使用 干涉扫描系统的宽带光源,从而减少干扰扫描系统的误差和复杂性。

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