RESIDUAL GAS ANALYSER, AND EUV LITHOGRAPHY SYSTEM HAVING A RESIDUAL GAS ANALYSER

    公开(公告)号:US20230162967A1

    公开(公告)日:2023-05-25

    申请号:US18099656

    申请日:2023-01-20

    摘要: A residual gas analyser (40) for analysis of a residual gas (30), in particular a residual gas in an EUV lithography system (1), includes an inlet system (41) for admission of the residual gas from a vacuum environment (27a) into the residual gas analyser, and a mass analyser (43) having a detector (44) for detecting ionized constituents (30a) of the residual gas. The residual gas analyser includes an ion transfer device (42) for transferring the ionized constituents of the residual gas to the mass analyser, the ion transfer device having an ion filtering device (45) configured for filtering at least one ionic constituent (30a) of the residual gas. Also disclosed is an EUV lithography system, in particular an EUV lithography apparatus, which includes at least one residual gas analyser configured as indicated above for analysing a residual gas in a vacuum environment of the EUV lithography system.

    COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER

    公开(公告)号:US20230084619A1

    公开(公告)日:2023-03-16

    申请号:US18053698

    申请日:2022-11-08

    IPC分类号: H01J49/04 H01J49/24 H01J49/06

    摘要: A mass spectrometry method comprises: (a) introducing ions and gas into a first electrode section of an ion transport apparatus along an axis, the ion transport apparatus further comprising a second electrode section including: a plurality of stacked, mutually parallel ring or plate electrodes; and an ion outlet aperture configured to receive the ions from the second electrode section and to transfer the ions to the vacuum chamber; (b) providing only non-oscillatory voltages to electrodes of the first electrode section of the ion transport apparatus that divert motion of the ions away from that axis and towards an entrance aperture of the second electrode section; (c) transporting the ions through the second electrode section to and through the ion outlet aperture to the vacuum chamber; and (d) removing a major portion of the gas through an exhaust port that is offset from the ion outlet aperture.

    TIME-OF-FLIGHT MASS ANALYSERS
    17.
    发明申请

    公开(公告)号:US20220415640A1

    公开(公告)日:2022-12-29

    申请号:US17844219

    申请日:2022-06-20

    IPC分类号: H01J49/40 H01J49/06 H01J49/24

    摘要: The present invention relates to an assembly comprising a vacuum chamber and a time-of-flight mass spectrometer wherein the time-of-flight mass spectrometer is contained within the vacuum chamber. The time-of-flight mass spectrometer comprising a first electrode and a second electrode, the second electrode being spaced apart from the first electrode at a distance defining a portion of an ion-flight path therebetween. The assembly further comprising a first support for supporting the first electrode, the first support arranged between an inner surface of the vacuum chamber and the first electrode. The first support is configured to permit relative movement between at least a portion of the inner surface of the vacuum chamber and the first electrode. The inner surface of the vacuum chamber and the first electrode are thermally coupled. The present invention also relates to a multi-reflection time-of-flight mass analyser. The present invention also relates to an apparatus for out-gassing to remove contaminants from surfaces within a vacuum chamber by heating and subsequently cooling the surfaces.

    COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER

    公开(公告)号:US20220399199A1

    公开(公告)日:2022-12-15

    申请号:US17345549

    申请日:2021-06-11

    IPC分类号: H01J49/06 H01J49/00 H01J49/24

    摘要: A mass spectrometry method comprises: (1) introducing ions and gas into an first electrode section of an ion transport apparatus through a slot of an ion transfer tube, the ion tunnel section comprising a first longitudinal axis that is contained within a slot plane of the ion transfer tube, the first longitudinal axis not intersecting an outlet of the ion transfer tube, wherein the apparatus further comprises: (a) a second electrode section configured to receive the ions from the first electrode section and comprising a second longitudinal axis that is not coincident with the first longitudinal axis; and (b) an ion outlet aperture; (2) providing voltages to electrodes of the ion transport apparatus that urge the ions to migrate towards the first longitudinal axis within the first electrode section; and (3) exhausting gas through a port that is offset from the ion outlet aperture.

    IONIZATION DEVICE AND MASS SPECTROMETER

    公开(公告)号:US20220230865A1

    公开(公告)日:2022-07-21

    申请号:US17616495

    申请日:2020-05-11

    申请人: Leybold GmbH

    IPC分类号: H01J49/14 H01J49/24 H01J49/06

    摘要: The invention relates to an ionization device with an ionization space formed in a container, an inlet system for supplying a gas to be ionized to the ionization space, an electron source having at least one filament for supply of an electron beam to the ionization space, and an outlet system for letting the ionized gas out of the ionization space. Electron optics having at least two electrodes are disposed between the filament and the ionization space