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    Imaging spectropolarimeter
    11.
    发明授权
    Imaging spectropolarimeter 有权

    公开(公告)号：US11499870B2

    公开(公告)日：2022-11-15

    申请号：US16219618

    申请日：2018-12-13

    Applicant: Mazen Zawaideh ,  Chris Claypool ,  Emad Zawaideh ,  BRUKER NANO, INC.

    Inventor： Mazen Zawaideh ,  Chris Claypool ,  Emad Zawaideh

    IPC: G01J3/447 ,  H04N13/243 ,  G02B27/09 ,  G02B5/30 ,  G01J3/02 ,  G02B27/28 ,  H04N5/247 ,  G01J4/02

    Abstract: An imaging spectropolarimeter for examining targets with polarized light, the spectropolarimeter including a light source adapted to produce polarized light directed at a target. Embodiments also include a three-camera camera system defining a three-camera camera axis with a first camera unit comprising a first analyzer set at 0°, a lens and a first multi-pixel sensor, a second camera unit comprising a second analyzer set at 45°, a lens and a second multi-pixel sensor, and a third camera unit comprising a third analyzer set at 90°, a lens and a third multi-pixel sensor. At least two beam splitters adapted to direct a portion of polarized light reflected from the target to each of the first, second and third camera units. Preferred systems include a processor adapted to produce polarimetric images of the target utilizing intensity information collected by the multi-pixel sensors.

    SINGLE-SHOT MUELLER MATRIX POLARIMETER
    12.
    发明申请
    SINGLE-SHOT MUELLER MATRIX POLARIMETER 有权

    公开(公告)号：US20220026347A1

    公开(公告)日：2022-01-27

    申请号：US17311377

    申请日：2019-12-09

    Applicant: Oxford University Innovation Limited

    Inventor： Martin BOOTH ,  Chao HE

    IPC: G01N21/21 ,  G01J4/02 ,  G01N21/47

    Abstract: A single-shot Mueller matrix polarimeter (1700), MMP, comprising: a polarization state generator (1706), PSG, arranged to receive a source optical field (1704) and provide a probe field (1708) having a plurality of spatial portions, each portion having a different polarization state; a polarization state analyser (1718), PSA, arranged to receive a modified probe field (1716) resulting from interaction of the probe field generated by the PSG with a sample under investigation, and further arranged to apply, to each of a corresponding plurality of spatial portions of the modified probe field, a plurality of retardances and a plurality of fast axis orientations; and a detector (1720) arranged to detect an output (1722) of the PSA.

    Wavefront-division polarimetric analysis method and device, spectropolarimeter, polarimetric camera and optical microscope using such a device
    16.
    发明授权
    Wavefront-division polarimetric analysis method and device, spectropolarimeter, polarimetric camera and optical microscope using such a device 有权
    波前分辨偏振分析方法和装置，分光偏振计，偏振相机和光学显微镜使用这种装置

    公开(公告)号：US09551618B2

    公开(公告)日：2017-01-24

    申请号：US14417618

    申请日：2013-07-25

    Applicant: HORIBA JOBIN YVON SAS

    Inventor： Olivier Acher ,  Simon Richard ,  Thanh-Liem Nguyen

    IPC: G01J4/00 ,  G01J4/02 ,  G01J4/04

    CPC classification number: G01J4/02 ,  G01J4/04

    Abstract: An accurate and robust wavefront-division polarimetric analysis method and device, allows the quasi-instantaneous measurement of the polarization states of a luminous object. The device can be used to produce a plurality of light beams, all polarized according to different polarization states, from a single upstream light beam. The polarized light beams, which do not overlap and which carry information items that are complementary in terms of polarization, are analyzed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing elements digitally process the luminous intensity values obtained in order to determine the polarization state of the upstream light beam. The operations performed by the processing elements prevent luminous intensity variations in the split light beams during the division of the wavefront of the upstream light beam. Therefore, the wavefront-division polarimetric analysis device is robust and its accuracy is not hindered by the experimental conditions.

    Abstract translation: 准确可靠的波前分割偏振分析方法和装置允许准瞬时测量发光物体的偏振状态。 该装置可用于从单个上游光束产生根据不同极化状态全部偏振的多个光束。 通过测量每个光束的发光强度的多个检测器同时分析不重叠并且携带在极化方面互补的信息项的偏振光束。 处理元件对获得的发光强度值进行数字处理，以确定上游光束的偏振状态。 由处理元件执行的操作防止在上游光束的波前划分期间分束光束的发光强度变化。 因此，波前分割极化分析装置是鲁棒的，其精度不受实验条件的影响。

    Measurement of Linear and Circular Diattentuation in Optical Elements
    17.
    发明申请
    Measurement of Linear and Circular Diattentuation in Optical Elements 审中-公开
    光学元件中线性和圆形缺陷的测量

    公开(公告)号：US20090323064A1

    公开(公告)日：2009-12-31

    申请号：US12298762

    申请日：2007-05-01

    Applicant: Baoliang Wang

    Inventor： Baoliang Wang

    IPC: G01J4/02 ,  G01J4/00

    CPC classification number: G01N21/19 ,  G01M11/0285

    Abstract: A system for measuring linear or circular diattenuation in an optical element includes a sample rotation stage for securing an optical element sample; a light source module for generating a source light beam and a detector module. The light source module and detector module are arranged with the sample rotation stage between them, thereby permitting the source light beam to propagate through a sample that may be secured in the sample stage and to the detector module. Linear motion control of the light source module and the detector module, as well as tilt control of the light source module, the sample rotation stage and the detector module is provided, thereby to facilitate detection, by the detector module of the modulated light intensity information corresponding to a diattenuation characteristic of the optical sample secured in the sample stage.

    Abstract translation: 用于测量光学元件中的线性或圆形衰减的系统包括用于固定光学元件样品的样品旋转台; 用于产生源光束的光源模块和检测器模块。 光源模块和检测器模块布置有它们之间的样品旋转台，从而允许源光束传播通过可以固定在样品台中的样品和检测器模块。 提供光源模块和检测器模块的线性运动控制以及光源模块，样品旋转台和检测器模块的倾斜控制，从而便于检测器模块检测调制的光强度信息 对应于固定在样品台中的光学样品的变色特性。

    Method of performing optical measurement on a sample
    18.
    发明授权
    Method of performing optical measurement on a sample 有权
    对样品进行光学测量的方法

    公开(公告)号：US07369234B2

    公开(公告)日：2008-05-06

    申请号：US10995520

    申请日：2004-11-24

    Applicant: David Beaglehole

    Inventor： David Beaglehole

    IPC: G01J4/02 ,  G02F1/01

    CPC classification number: G01N21/211

    Abstract: The invention relates to a method of performing an optical measurement on a sample, such as an ellipticity measurement. The sample is irradiated with a polarized irradiation beam and a return beam is linearly polarized. The irradiation or return beam is modulated with a birefringence modulator, such as a photoelastic modulator, in accordance with a primary modulation signal. The return beam is directed onto a multichannel detector. Typically the detector is a slow detector, such as a CCD, having a response time greater than a period of the primary modulation signal. Detection values are generated simultaneously at each detection element and processed to determine a plurality of measurements. Various measurement techniques are described, including detector signal averaging over gated intervals; a design employing coherent modulation of the gain of an ICCD , and a modulator-coherent flash lamp design.

    Abstract translation: 本发明涉及对样品进行光学测量的方法，例如椭圆度测量。 样品用偏振照射光束照射，返回光束线性偏振。 根据初级调制信号，利用双折射调制器（例如光弹性调制器）调制照射或返回光束。 返回光束被引导到多通道检测器。 通常，检测器是具有大于初级调制信号周期的响应时间的慢速检测器，例如CCD。 在每个检测元件处同时产生检测值，并进行处理以确定多个测量值。 描述了各种测量技术，包括门控间隔的检测器信号平均; 采用相干调制ICCD增益的设计，以及调制器相干的闪光灯设计。

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